All Publications


  • Engineering a Kerr-Based Deterministic Cubic Phase Gate via Gaussian Operations Physical Review Letters Yanagimoto, R., Onodera, T., Ng, E., Wright, L. G., McMahon, P. L., Mabuchi, H. 2020; 124: 240503
  • Adiabatic Fock-state-generation scheme using Kerr nonlinearity PHYSICAL REVIEW A Yanagimoto, R., Ng, E., Onodera, T., Mabuchi, H. 2019; 100 (3)
  • Experimental investigation of performance differences between coherent Ising machines and a quantum annealer. Science advances Hamerly, R., Inagaki, T., McMahon, P. L., Venturelli, D., Marandi, A., Onodera, T., Ng, E., Langrock, C., Inaba, K., Honjo, T., Enbutsu, K., Umeki, T., Kasahara, R., Utsunomiya, S., Kako, S., Kawarabayashi, K., Byer, R. L., Fejer, M. M., Mabuchi, H., Englund, D., Rieffel, E., Takesue, H., Yamamoto, Y. 2019; 5 (5): eaau0823

    Abstract

    Physical annealing systems provide heuristic approaches to solving combinatorial optimization problems. Here, we benchmark two types of annealing machines-a quantum annealer built by D-Wave Systems and measurement-feedback coherent Ising machines (CIMs) based on optical parametric oscillators-on two problem classes, the Sherrington-Kirkpatrick (SK) model and MAX-CUT. The D-Wave quantum annealer outperforms the CIMs on MAX-CUT on cubic graphs. On denser problems, however, we observe an exponential penalty for the quantum annealer [exp(-alphaDW N 2)] relative to CIMs [exp(-alphaCIM N)] for fixed anneal times, both on the SK model and on 50% edge density MAX-CUT. This leads to a several orders of magnitude time-to-solution difference for instances with over 50 vertices. An optimal-annealing time analysis is also consistent with a substantial projected performance difference. The difference in performance between the sparsely connected D-Wave machine and the fully-connected CIMs provides strong experimental support for efforts to increase the connectivity of quantum annealers.

    View details for DOI 10.1126/sciadv.aau0823

    View details for PubMedID 31139743

  • Scanning microwave imaging of optically patterned Ge2Sb2Te5 APPLIED PHYSICS LETTERS Johnston, S. R., Ng, E., Fong, S. W., Mok, W. Y., Park, J., Zalden, P., Sakdinawat, A., Wong, H., Mabuchi, H., Shen, Z. 2019; 114 (9)

    View details for DOI 10.1063/1.5052018

    View details for Web of Science ID 000460820600042