Piero Pianetta
Professor (Research) of Photon Science and of Electrical Engineering
Photon Science Directorate
Web page: http://web.stanford.edu/people/pianetta
Bio
Pianetta's research is directed towards understanding how the atomic and electronic structure of semiconductor interfaces impacts device technology pertaining to advanced semiconductors and photocathodes. His research includes the development of new analytical tools for these studies based on the use of synchrotron radiation. These include the development of ultrasensitive methods to analyze trace impurities on the surface of silicon wafers at levels as low as 1e-6 monolayer (~1e8 atoms/cm2) and the use of various photoelectron spectroscopies (X-ray photoemission, NEXAFS, X-ray standing waves and photoelectron diffraction) to determine the bonding and atomic structure at the interface between silicon and different passivating layers. Recent projects include the development of high resolution (~30nm) x-ray spectromicroscopy with applications to energy materials such as Li batteries.
Academic Appointments
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Professor (Research), Photon Science Directorate
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Professor (Research), Electrical Engineering
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Member, Bio-X
Administrative Appointments
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Deputy Chief Research Officer, SLAC (2020 - Present)
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Chair, Photon Science, SLAC (2016 - 2020)
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Deputy Director for SSRL, SLAC (2014 - Present)
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Director (Interim) for SSRL, SLAC (2012 - 2014)
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Deputy Director for SSRL, SLAC (2010 - 2012)
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Director (Acting) for SSRL, SLAC (2009 - 2010)
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Deputy Director for SSRL, SLAC (2005 - 2009)
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Assistant Director for SSRL, SLAC (1993 - 2005)
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Associate Director, Stanford Synchrotron Radiation Laboratory (1985 - 1993)
Honors & Awards
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Fellow, American Physical Society (2006)
Boards, Advisory Committees, Professional Organizations
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Chair, Experimental Systems Advisory Committee, Advanced Photon Source, Argonne National Laboratory (2015 - Present)
Professional Education
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PhD, Stanford University, Applied Physics (1977)
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MS, Stanford University, Applied Physics (1973)
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BS, Santa Clara University, Physics (1971)
Patents
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L. Hesselink, R.F.W. Pease, P. Pianetta, J.R. Maldonado, ^. Cheng, J. Ryan. "United States Patent 9,520,260 Photo emitter x-ray source array (PeXSA)", The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US), Dec 13, 2016
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J.R. Maldonado, Y-T Cheng, P. Pianetta, R.F.W. Pease, L. Hesselink. "United States Patent 9,406,488 Enhanced photoelectron sources using electron bombardment", The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA, Aug 2, 2016
2024-25 Courses
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Independent Studies (11)
- Graduate Independent Study
MATSCI 399 (Aut, Win, Spr, Sum) - Master's Research
MATSCI 200 (Aut, Win, Spr, Sum) - Master's Thesis and Thesis Research
EE 300 (Aut, Win, Spr, Sum) - Ph.D. Research
MATSCI 300 (Aut, Win, Spr, Sum) - Practical Training
MATSCI 299 (Aut, Win, Spr, Sum) - Research
PHYSICS 490 (Aut, Win, Spr, Sum) - Special Studies and Reports in Electrical Engineering
EE 191 (Aut, Win, Spr, Sum) - Special Studies and Reports in Electrical Engineering
EE 391 (Aut, Win, Spr, Sum) - Special Studies and Reports in Electrical Engineering (WIM)
EE 191W (Aut, Win, Spr, Sum) - Special Studies or Projects in Electrical Engineering
EE 190 (Aut, Win, Spr, Sum) - Special Studies or Projects in Electrical Engineering
EE 390 (Aut, Win, Spr, Sum)
- Graduate Independent Study
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Prior Year Courses
2023-24 Courses
2021-22 Courses
- The Electronic Structure of Surfaces and Interfaces
EE 329, PHOTON 329 (Aut)
- The Electronic Structure of Surfaces and Interfaces
Stanford Advisees
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Postdoctoral Faculty Sponsor
Zhihengyu Chen, Erick Espinosa Villatoro, Oliver Hoidn, Heemin Lee, Zhilin Liang, Otavio Marques, Sikhumbuzo Masina, Anjani Maurya, Liam Nagle Cocco, Neha Sharma, Tolga Han Ulucan, Peiao Xie -
Doctoral (Program)
Maximus Di Perna, Melanie Murillo, Charlotte Wehner
All Publications
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Mesoscale interplay among composition heterogeneity, lattice deformation, and redox stratification in single-crystalline layered oxide cathode
ESCIENCE
2024; 4 (4)
View details for DOI 10.1016/j.esci.2024.100251
View details for Web of Science ID 001294747800001
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Deep Learning for Spectroscopic X-ray Nano-Imaging Denoising
ADVANCED INTELLIGENT SYSTEMS
2024
View details for DOI 10.1002/aisy.202400318
View details for Web of Science ID 001249792200001
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Image registration for in situ X-ray nano-imaging of a composite battery cathode with deformation.
Journal of synchrotron radiation
2024
Abstract
The structural and chemical evolution of battery electrodes at the nanoscale plays an important role in affecting the cell performance. Nano-resolution X-ray microscopy has been demonstrated as a powerful technique for characterizing the evolution of battery electrodes under operating conditions with sensitivity to their morphology, compositional distribution and redox heterogeneity. In real-world batteries, the electrode could deform upon battery operation, causing challenges for the image registration which is necessary for several experimental modalities, e.g. XANES imaging. To address this challenge, this work develops a deep-learning-based method for automatic particle identification and tracking. This approach was not only able to facilitate image registration with good robustness but also allowed quantification of the degree of sample deformation. The effectiveness of the method was first demonstrated using synthetic datasets with known ground truth. The method was then applied to an experimental dataset collected on an operating lithium battery cell, revealing a high degree of intra- and interparticle chemical complexity in operating batteries.
View details for DOI 10.1107/S1600577524000146
View details for PubMedID 38300132
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Multi-modal X-ray microscopy for chemical analysis
TRAC-TRENDS IN ANALYTICAL CHEMISTRY
2024; 171
View details for DOI 10.1016/j.trac.2023.117491
View details for Web of Science ID 001144082300001
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Asynchronous domain dynamics and equilibration in layered oxide battery cathode.
Nature communications
2023; 14 (1): 8394
Abstract
To improve lithium-ion battery technology, it is essential to probe and comprehend the microscopic dynamic processes that occur in a real-world composite electrode under operating conditions. The primary and secondary particles are the structural building blocks of battery cathode electrodes. Their dynamic inconsistency has profound but not well-understood impacts. In this research, we combine operando coherent multi-crystal diffraction and optical microscopy to examine the chemical dynamics in local domains of layered oxide cathode. Our results not only pinpoint the asynchronicity of the lithium (de)intercalation at the sub-particle level, but also reveal sophisticated diffusion kinetics and reaction patterns, involving various localized processes, e.g., chemical onset, reaction front propagation, domains equilibration, particledeformationand motion. These observations shed new lights onto the activation and degradation mechanisms of state-of-the-art battery cathode materials.
View details for DOI 10.1038/s41467-023-44222-x
View details for PubMedID 38110430
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Stabilizing Ni-rich layered cathode for high-voltage operation through hierarchically heterogeneous doping with concentration gradient
MATERIALS TODAY CHEMISTRY
2024; 35
View details for DOI 10.1016/j.mtchem.2023.101845
View details for Web of Science ID 001135338400001
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Nanoscale chemical imaging with structured X-ray illumination.
Proceedings of the National Academy of Sciences of the United States of America
2023; 120 (49): e2314542120
Abstract
High-resolution imaging with compositional and chemical sensitivity is crucial for a wide range of scientific and engineering disciplines. Although synchrotron X-ray imaging through spectromicroscopy has been tremendously successful and broadly applied, it encounters challenges in achieving enhanced detection sensitivity, satisfactory spatial resolution, and high experimental throughput simultaneously. In this work, based on structured illumination, we develop a single-pixel X-ray imaging approach coupled with a generative image reconstruction model for mapping the compositional heterogeneity with nanoscale resolvability. This method integrates a full-field transmission X-ray microscope with an X-ray fluorescence detector and eliminates the need for nanoscale X-ray focusing and raster scanning. We experimentally demonstrate the effectiveness of our approach by imaging a battery sample composed of mixed cathode materials and successfully retrieving the compositional variations of the imaged cathode particles. Bridging the gap between structural and chemical characterizations using X-rays, this technique opens up vast opportunities in the fields of biology, environmental, and materials science, especially for radiation-sensitive samples.
View details for DOI 10.1073/pnas.2314542120
View details for PubMedID 38015849
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The S-T component in the Si 2p photoemission spectrum from H-terminated and oxidized Si (001) surfaces
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
2023; 41 (4)
View details for DOI 10.1116/6.0002690
View details for Web of Science ID 000998428100001
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Exploring the Ultrafast Charge-Transfer and Redox Dynamics in Layered Transition Metal Oxides
CONDENSED MATTER
2023; 8 (1)
View details for DOI 10.3390/condmat8010025
View details for Web of Science ID 000955344400001
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Perspective-Morphology and Dynamics of Metal Dendrites in Batteries Revealed by X-ray Computed Tomography
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
2022; 169 (12)
View details for DOI 10.1149/1945-7111/acad33
View details for Web of Science ID 000919044800001
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In-Situ Visualization of the Transition Metal Dissolution in Layered Cathodes
JOURNAL OF ELECTROCHEMICAL ENERGY CONVERSION AND STORAGE
2022; 19 (4)
View details for DOI 10.1115/1.4054584
View details for Web of Science ID 000861480100011
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In situ visualization of multicomponents coevolution in a battery pouch cell.
Proceedings of the National Academy of Sciences of the United States of America
2022; 119 (29): e2203199119
Abstract
Lithium-ion battery (LIB) is a broadly adopted technology for energy storage. With increasing demands to improve the rate capability, cyclability, energy density, safety, and cost efficiency, it is crucial to establish an in-depth understanding of the detailed structural evolution and cell-degradation mechanisms during battery operation. Here, we present a laboratory-based high-resolution and high-throughput X-ray micro-computed laminography approach, which is capable of in situ visualizing of an industry-relevant lithium-ion (Li-ion) pouch cell with superior detection fidelity, resolution, and reliability. This technique enables imaging of the pouch cell at a spatial resolution of 0.5 mum in a laboratory system and permits the identification of submicron features within cathode and anode electrodes. We also demonstrate direct visualization of the lithium plating in the imaged pouch cell, which is an important phenomenon relevant to battery fast charging and low-temperature cycling. Our development presents an avenue toward a thorough understanding of the correlation among multiscale structures, chemomechanical degradation, and electrochemical behavior of industry-scale battery pouch cells.
View details for DOI 10.1073/pnas.2203199119
View details for PubMedID 35858350
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Data-Driven Lithium-Ion Battery Cathode Research with State-of- the-Art Synchrotron X-ray Techniques
ACCOUNTS OF MATERIALS RESEARCH
2022
View details for DOI 10.1021/accountsmr.2c00098
View details for Web of Science ID 000830802300001
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Deep-Learning-Enabled Crack Detection and Analysis in Commercial Lithium-Ion Battery Cathodes
ADVANCED FUNCTIONAL MATERIALS
2022
View details for DOI 10.1002/adfm.202203070
View details for Web of Science ID 000812885800001
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Dynamics of particle network in composite battery cathodes.
Science (New York, N.Y.)
2022; 376 (6592): 517-521
Abstract
Improving composite battery electrodes requires a delicate control of active materials and electrode formulation. The electrochemically active particles fulfill their role as energy exchange reservoirs through interacting with the surrounding conductive network. We formulate a network evolution model to interpret the regulation and equilibration between electrochemical activity and mechanical damage of these particles. Through statistical analysis of thousands of particles using x-ray phase contrast holotomography in a LiNi0.8Mn0.1Co0.1O2-based cathode, we found that the local network heterogeneity results in asynchronous activities in the early cycles, and subsequently the particle assemblies move toward a synchronous behavior. Our study pinpoints the chemomechanical behavior of individual particles and enables better designs of the conductive network to optimize the utility of all the particles during operation.
View details for DOI 10.1126/science.abm8962
View details for PubMedID 35482882
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Structural, Dynamic, and Chemical Complexities in Zinc Anode of an Operating Aqueous Zn-Ion Battery
ADVANCED ENERGY MATERIALS
2022
View details for DOI 10.1002/aenm.202200255
View details for Web of Science ID 000785685800001
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Probing lattice defects in crystalline battery cathode using hard X-ray nanoprobe with data-driven modeling
ENERGY STORAGE MATERIALS
2022; 45: 647-655
View details for DOI 10.1016/j.ensm.2021.12.019
View details for Web of Science ID 000781821500002
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Value-creating upcycling of retired electric vehicle battery cathodes
CELL REPORTS PHYSICAL SCIENCE
2022; 3 (2)
View details for DOI 10.1016/j.xcrp.2022.100741
View details for Web of Science ID 000760198000010
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Thermal-healing of lattice defects for high-energy single-crystalline battery cathodes.
Nature communications
2022; 13 (1): 704
Abstract
Single-crystalline nickel-rich cathodes are a rising candidate with great potential for high-energy lithium-ion batteries due to their superior structural and chemical robustness in comparison with polycrystalline counterparts. Within the single-crystalline cathode materials, the lattice strain and defects have significant impacts on the intercalation chemistry and, therefore, play a key role in determining the macroscopic electrochemical performance. Guided by our predictive theoretical model, we have systematically evaluated the effectiveness of regaining lost capacity by modulating the lattice deformation via an energy-efficient thermal treatment at different chemical states. We demonstrate that the lattice structure recoverability is highly dependent on both the cathode composition and the state of charge, providing clues to relieving the fatigued cathode crystal for sustainable lithium-ion batteries.
View details for DOI 10.1038/s41467-022-28325-5
View details for PubMedID 35121768
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Structural and chemical evolution in layered oxide cathodes of lithium-ion batteries revealed by synchrotron techniques.
National science review
2022; 9 (2): nwab146
Abstract
Rechargeable battery technologies have revolutionized electronics, transportation and grid energy storage. Many materials are being researched for battery applications, with layered transition metal oxides (LTMO) the dominating cathode candidate with remarkable electrochemical performance. Yet, daunting challenges persist in the quest for further battery developments targeting lower cost, longer lifespan, improved energy density and enhanced safety. This is, in part, because of the intrinsic complexity of real-world batteries, featuring sophisticated interplay among microstructural, compositional and chemical heterogeneities, which has motivated tremendous research efforts using state-of-the-art analytical techniques. In this research field, synchrotron techniques have been identified as a suite of effective methods for advanced battery characterization in a non-destructive manner with sensitivities to the lattice, electronic and morphological structures. This article provides a holistic overview of cutting-edge developments in synchrotron-based research on LTMO battery cathode materials. We discuss the complexity and evolution of LTMO's material properties upon battery operation and review recent synchrotron-based research works that address the frontier challenges and provide novel insights in this field. Finally, we formulate a perspective on future directions of synchrotron-based battery research, involving next-generation X-ray facilities and advanced computational developments.
View details for DOI 10.1093/nsr/nwab146
View details for PubMedID 35145703
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In Situ Visualization of Li-Whisker with Grating-Interferometry-Based Tricontrast X-ray Microtomography
ACS MATERIALS LETTERS
2021; 3 (12): 1786-1792
View details for DOI 10.1021/acsmaterialslett.1c00600
View details for Web of Science ID 000752841700016
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Machine-and-data intelligence for synchrotron science
NATURE REVIEWS PHYSICS
2021
View details for DOI 10.1038/s42254-021-00397-0
View details for Web of Science ID 000717407400001
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Deep-learning-based image registration for nano-resolution tomographic reconstruction.
Journal of synchrotron radiation
2021; 28 (Pt 6): 1909-1915
Abstract
Nano-resolution full-field transmission X-ray microscopy has been successfully applied to a wide range of research fields thanks to its capability of non-destructively reconstructing the 3D structure with high resolution. Due to constraints in the practical implementations, the nano-tomography data is often associated with a random image jitter, resulting from imperfections in the hardware setup. Without a proper image registration process prior to the reconstruction, the quality of the result will be compromised. Here a deep-learning-based image jitter correction method is presented, which registers the projective images with high efficiency and accuracy, facilitating a high-quality tomographic reconstruction. This development is demonstrated and validated using synthetic and experimental datasets. The method is effective and readily applicable to a broad range of applications. Together with this paper, the source code is published and adoptions and improvements from our colleagues in this field are welcomed.
View details for DOI 10.1107/S1600577521008481
View details for PubMedID 34738945
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The role of structural defects in commercial lithium-ion batteries
CELL REPORTS PHYSICAL SCIENCE
2021; 2 (9)
View details for DOI 10.1016/j.xcrp.2021.100554
View details for Web of Science ID 000704066000007
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Novel Ultrabright and Air-Stable Photocathodes Discovered from Machine Learning and Density Functional Theory Driven Screening.
Advanced materials (Deerfield Beach, Fla.)
2021: e2104081
Abstract
The high brightness, low emittance electron beams achieved in modern X-ray free-electron lasers (XFELs) have enabled powerful X-ray imaging tools, allowing molecular systems to be imaged at picosecond time scales and sub-nanometer length scales. One of the most promising directions for increasing the brightness of XFELs is through the development of novel photocathode materials. Whereas past efforts aimed at discovering photocathode materials have typically employed trial-and-error-based iterative approaches, this work represents the first data-driven screening for high brightness photocathode materials. Through screening over 74 000 semiconducting materials, a vast photocathode dataset is generated, resulting in statistically meaningful insights into the nature of high brightness photocathode materials. This screening results in a diverse list of photocathode materials that exhibit intrinsic emittances that are up to 4x lower than currently used photocathodes. In a second effort, multiobjective screening is employed to identify the family of M2 O (M = Na, K, Rb) that exhibits photoemission properties that are comparable to the current state-of-the-art photocathode materials, but with superior air stability. This family represents perhaps the first intrinsically bright, visible light photocathode materials that are resistant to reactions with oxygen, allowing for their transport and storage in dry air environments.
View details for DOI 10.1002/adma.202104081
View details for PubMedID 34510594
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Multiphase, Multiscale Chemomechanics at Extreme Low Temperatures: Battery Electrodes for Operation in a Wide Temperature Range
ADVANCED ENERGY MATERIALS
2021
View details for DOI 10.1002/aenm.202102122
View details for Web of Science ID 000686946000001
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High-resolution multicontrast tomography with an X-ray microarray anode-structured target source.
Proceedings of the National Academy of Sciences of the United States of America
2021; 118 (25)
Abstract
Multicontrast X-ray imaging with high resolution and sensitivity using Talbot-Lau interferometry (TLI) offers unique imaging capabilities that are important to a wide range of applications, including the study of morphological features with different physical properties in biological specimens. The conventional X-ray TLI approach relies on an absorption grating to create an array of micrometer-sized X-ray sources, posing numerous limitations, including technical challenges associated with grating fabrication for high-energy operations. We overcome these limitations by developing a TLI system with a microarray anode-structured target (MAAST) source. The MAAST features an array of precisely controlled microstructured metal inserts embedded in a diamond substrate. Using this TLI system, tomography of a Drum fish tooth with high resolution and tri-contrast (absorption, phase, and scattering) reveals useful complementary structural information that is inaccessible otherwise. The results highlight the exceptional capability of high-resolution multicontrast X-ray tomography empowered by the MAAST-based TLI method in biomedical applications.
View details for DOI 10.1073/pnas.2103126118
View details for PubMedID 34140413
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Fast Li Plating Behavior Probed by X-ray Computed Tomography.
Nano letters
2021
Abstract
Uneven lithium plating/stripping is an essential issue that inhibits stable cycling of a lithium metal anode and thus hinders its practical applications. The investigation of this process is challenging because it is difficult to observe lithium in an operating device. Here, we demonstrate that the microscopic lithium plating behavior can be observed in situ in a close-to-practical cell setup using X-ray computed tomography. The results reveal the formation of porous structure and its progressive evolution in space over the charging process with a large current. The elaborated analysis indicates that the microstructure of deposited lithium makes a significant impact on the subsequent lithium plating, and the impact of structural inhomogeneity, further exaggerated by the large-current charging, can lead to severely uneven lithium plating and eventually cell failure. Therefore, a codesign strategy involving delicate controls of microstructure and electrochemical conditions could be a necessity for the next-generation battery with lithium metal anode.
View details for DOI 10.1021/acs.nanolett.1c01389
View details for PubMedID 34105964
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Selective dopant segregation modulates mesoscale reaction kinetics in layered transition metal oxide
NANO ENERGY
2021; 84
View details for DOI 10.1016/j.nanoen.2021.105926
View details for Web of Science ID 000649703500001
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Understanding multi-scale battery degradation with a macro-to-nano zoom through its hierarchy
JOURNAL OF MATERIALS CHEMISTRY A
2021
View details for DOI 10.1039/d1ta02262h
View details for Web of Science ID 000660244800001
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Understanding the Mesoscale Degradation in Nickel-Rich Cathode Materials through Machine-Learning-Revealed Strain-Redox Decoupling
ACS ENERGY LETTERS
2021; 6 (2): 687–93
View details for DOI 10.1021/acsenergylett.0c02699
View details for Web of Science ID 000619803400049
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Automatic 3D image registration for nano-resolution chemical mapping using synchrotron spectro-tomography.
Journal of synchrotron radiation
2021; 28 (Pt 1): 278–82
Abstract
Nano-resolution synchrotron X-ray spectro-tomography has been demonstrated as a powerful tool for probing the three-dimensional (3D) structural and chemical heterogeneity of a sample. By reconstructing a number of tomographic data sets recorded at different X-ray energy levels, the energy-dependent intensity variation in every given voxel fingerprints the corresponding local chemistry. The resolution and accuracy of this method, however, could be jeopardized by non-ideal experimental conditions, e.g. instability in the hardware system and/or in the sample itself. Herein is presented one such case, in which unanticipated sample deformation severely degrades the data quality. To address this issue, an automatic 3D image registration method is implemented to evaluate and correct this effect. The method allows the redox heterogeneity in partially delithiated LixTa0.3Mn0.4O2 battery cathode particles to be revealed with significantly improved fidelity.
View details for DOI 10.1107/S1600577520014691
View details for PubMedID 33399578
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Depth-dependent valence stratification driven by oxygen redox in lithium-rich layered oxide.
Nature communications
2020; 11 (1): 6342
Abstract
Lithium-rich nickel-manganese-cobalt (LirNMC) layered material is a promising cathode for lithium-ion batteries thanks to its large energy density enabled by coexisting cation and anion redox activities. It however suffers from a voltage decay upon cycling, urging for an in-depth understanding of the particle-level structure and chemical complexity. In this work, we investigate the Li1.2Ni0.13Mn0.54Co0.13O2 particles morphologically, compositionally, and chemically in three-dimensions. While the composition is generally uniform throughout the particle, the charging induces a strong depth dependency in transition metal valence. Such a valence stratification phenomenon is attributed to the nature of oxygen redox which is very likely mostly associated with Mn. The depth-dependent chemistry could be modulated by the particles' core-multi-shell morphology, suggesting a structural-chemical interplay. These findings highlight the possibility of introducing a chemical gradient to address the oxygen-loss-induced voltage fade in LirNMC layered materials.
View details for DOI 10.1038/s41467-020-20198-w
View details for PubMedID 33311507
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Operando Tailoring of Defects and Strains in Corrugated beta-Ni(OH)2 Nanosheets for Stable and High-Rate Energy Storage.
Advanced materials (Deerfield Beach, Fla.)
2020: e2006147
Abstract
Nickel hydroxide represents a technologically important material for energy storage, such as hybrid supercapacitors. It has two different crystallographic polymorphs, alpha- and beta-Ni(OH)2 , showing advantages in either theoretical capacity or cycling/rate performance, manifesting a trade-off trend that needs to be optimized for practical applications. Here, the synergistic superiorities in both activity and stability of corrugated beta-Ni(OH)2 nanosheets are demonstrated through an electrochemical abuse approach. With 91% capacity retention after 10000 cycles, the corrugated beta-Ni(OH)2 nanosheets can deliver a gravimetric capacity of 457 C g-1 at a high current density of 30 A g-1 , which is nearly two and four times that of the regular alpha- and beta-Ni(OH)2 , respectively. Operando spectroscopy and finite element analysis reveal that greatly enhanced chemical activity and structural robustness can be attributed to the in situ tailored lattice defects and the strain-induced highly curved micromorphology. This work demonstrates a multi-scale defect-and-strain co-design strategy, which is helpful for rational design and tuned fabrication of next-generation electrode materials for stable and high-rate energy storage.
View details for DOI 10.1002/adma.202006147
View details for PubMedID 33270282
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Hybrid real- and reciprocal-space full-field imaging with coherent illumination
JOURNAL OF OPTICS
2020; 22 (11)
View details for DOI 10.1088/2040-8986/abbeca
View details for Web of Science ID 000582834700001
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Hierarchical Defect Engineering for LiCoO2 through Low-Solubility Trace Element Doping
CHEM
2020; 6 (10): 2759–69
View details for DOI 10.1016/j.chempr.2020.07.017
View details for Web of Science ID 000580615300020
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Mutual modulation between surface chemistry and bulk microstructure within secondary particles of nickel-rich layered oxides.
Nature communications
2020; 11 (1): 4433
Abstract
Surface lattice reconstruction is commonly observed in nickel-rich layered oxide battery cathode materials, causing unsatisfactory high-voltage cycling performance. However, the interplay of the surface chemistry and the bulk microstructure remains largely unexplored due to the intrinsic structural complexity and the lack of integrated diagnostic tools for a thorough investigation at complementary length scales. Herein, by combining nano-resolution X-ray probes in both soft and hard X-ray regimes, we demonstrate correlative surface chemical mapping and bulk microstructure imaging over a single charged LiNi0.8Mn0.1Co0.1O2 (NMC811) secondary particle. We reveal that the sub-particle regions with more micro cracks are associated with more severe surface degradation. A mechanism of mutual modulation between the surface chemistry and the bulk microstructure is formulated based on our experimental observations and finite element modeling. Such a surface-to-bulk reaction coupling effect is fundamentally important for the design of the next generation battery cathode materials.
View details for DOI 10.1038/s41467-020-18278-y
View details for PubMedID 32895388
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Generalizable density functional theory based photoemission model for the accelerated development of photocathodes and other photoemissive devices
PHYSICAL REVIEW B
2020; 101 (23)
View details for DOI 10.1103/PhysRevB.101.235447
View details for Web of Science ID 000543941000008
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Machine-learning-revealed statistics of the particle-carbon/binder detachment in lithium-ion battery cathodes.
Nature communications
2020; 11 (1): 2310
Abstract
The microstructure of a composite electrode determines how individual battery particles are charged and discharged in a lithium-ion battery. It is a frontier challenge to experimentally visualize and, subsequently, to understand the electrochemical consequences of battery particles' evolving (de)attachment with the conductive matrix. Herein, we tackle this issue with a unique combination of multiscale experimental approaches, machine-learning-assisted statistical analysis, and experiment-informed mathematical modeling. Our results suggest that the degree of particle detachment is positively correlated with the charging rate and that smaller particles exhibit a higher degree of uncertainty in their detachment from the carbon/binder matrix. We further explore the feasibility and limitation of utilizing the reconstructed electron density as a proxy for the state-of-charge. Our findings highlight the importance of precisely quantifying the evolving nature of the battery electrode's microstructure with statistical confidence, which is a key to maximize the utility of active particles towards higher battery capacity.
View details for DOI 10.1038/s41467-020-16233-5
View details for PubMedID 32385347
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Quantifying redox heterogeneity in single-crystalline LiCoO2 cathode particles.
Journal of synchrotron radiation
2020; 27 (Pt 3): 713–19
Abstract
Active cathode particles are fundamental architectural units for the composite electrode of Li-ion batteries. The microstructure of the particles has a profound impact on their behavior and, consequently, on the cell-level electrochemical performance. LiCoO2 (LCO, a dominant cathode material) is often in the form of well-shaped particles, a few micrometres in size, with good crystallinity. In contrast to secondary particles (an agglomeration of many fine primary grains), which are the other common form of battery particles populated with structural and chemical defects, it is often anticipated that good particle crystallinity leads to superior mechanical robustness and suppressed charge heterogeneity. Yet, sub-particle level charge inhomogeneity in LCO particles has been widely reported inthe literature, posing a frontier challenge in this field. Herein, this topic isrevisited and it is demonstrated that X-ray absorption spectra on single-crystalline particles with highly anisotropic lattice structures are sensitive to thepolarization configuration of the incident X-rays, causing some degree of ambiguity in analyzing the local spectroscopic fingerprint. To tackle this issue, a methodology is developed that extracts the white-line peak energy in the X-ray absorption near-edge structure spectra as a key data attribute for representing the local state of charge in the LCO crystal. This method demonstrates significantly improved accuracy and reveals the mesoscale chemical complexity in LCO particles with better fidelity. In addition to the implications on the importance of particle engineering for LCO cathodes, the method developed herein also has significant impact on spectro-microscopic studies of single-crystalline materials at synchrotron facilities, which is broadly applicable to a wide range of scientific disciplines well beyond battery research.
View details for DOI 10.1107/S1600577520002076
View details for PubMedID 32381772
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Operando Revealing Dynamic Reconstruction of NiCo Carbonate Hydroxide for High-Rate Energy Storage
JOULE
2020; 4 (3): 673–87
View details for DOI 10.1016/j.joule.2020.01.018
View details for Web of Science ID 000520874200015
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Revealing the inhomogeneous surface chemistry on the spherical layered oxide polycrystalline cathode particles
CHINESE PHYSICS B
2020; 29 (2)
View details for DOI 10.1088/1674-1056/ab6585
View details for Web of Science ID 000510906400001
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Surface Photovoltage-Induced Ultralow Work Function Material for Thermionic Energy Converters
ACS ENERGY LETTERS
2019; 4 (10): 2436–43
Abstract
Low work function materials are essential for efficient thermionic energy converters (TECs), electronics, and electron emission devices. Much effort has been put into finding thermally stable material combinations that exhibit low work functions. Submonolayer coatings of alkali metals have proven to significantly reduce the work function; however, a work function less than 1 eV has not been reached. We report a record-low work function of 0.70 eV by inducing a surface photovoltage (SPV) in an n-type semiconductor with an alkali metal coating. Ultraviolet photoelectron spectroscopy indicates a work function of 1.06 eV for cesium/oxygen-activated GaAs consistent with density functional theory model predictions. By illuminating with a 532 nm laser we induce an additional shift down to 0.70 eV due to the SPV. Further, we apply the SPV to the collector of an experimental TEC and demonstrate an I-V curve shift consistent with the collector work function reduction. This method opens an avenue toward efficient TECs and next-generation electron emission devices.
View details for DOI 10.1021/acsenergylett.9b01214
View details for Web of Science ID 000490365500011
View details for PubMedID 31633034
View details for PubMedCentralID PMC6792473
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Simultaneous three-dimensional elemental mapping of Hollandite and Pyrochlore material phases in ceramic waste form materials
JOURNAL OF THE AMERICAN CERAMIC SOCIETY
2019; 102 (9): 5620–31
View details for DOI 10.1111/jace.16371
View details for Web of Science ID 000479010400059
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Quantification of Heterogeneous Degradation in Li-Ion Batteries
ADVANCED ENERGY MATERIALS
2019; 9 (25)
View details for DOI 10.1002/aenm.201900674
View details for Web of Science ID 000477778400004
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High-Voltage Charging-Induced Strain, Heterogeneity, and Micro-Cracks in Secondary Particles of a Nickel-Rich Layered Cathode Material
ADVANCED FUNCTIONAL MATERIALS
2019; 29 (18)
View details for DOI 10.1002/adfm.201900247
View details for Web of Science ID 000471330500021
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Surface-to-Bulk Redox Coupling through Thermally Driven Li Redistribution in Li- and Mn-Rich Layered Cathode Materials.
Journal of the American Chemical Society
2019
Abstract
Li- and Mn-rich (LMR) layered cathode materials have demonstrated impressive capacity and specific energy density thanks to their intertwined redox centers including transition metal cations and oxygen anions. Although tremendous efforts have been devoted to the investigation of the electrochemically driven redox evolution in LMR cathode at ambient temperature, their behavior under a mildly elevated temperature (up to ∼100 °C), with or without electrochemical driving force, remains largely unexplored. Here we show a systematic study of the thermally driven surface-to-bulk redox coupling effect in charged Li1.2Ni0.15Co0.1Mn0.55O2. We for the first time observed a charge transfer between the bulk oxygen anions and the surface transition metal cations under ∼100 °C, which is attributed to the thermally driven redistribution of Li ions. This finding highlights the nonequilibrium state and dynamic nature of the LMR material at deeply delithiated state upon a mild temperature perturbation.
View details for DOI 10.1021/jacs.9b05349
View details for PubMedID 31287957
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Thermally driven mesoscale chemomechanical interplay in Li0.5Ni0.6Mn0.2Co0.2O2 cathode materials
JOURNAL OF MATERIALS CHEMISTRY A
2018; 6 (45): 23055–61
View details for DOI 10.1039/c8ta08973f
View details for Web of Science ID 000451738200071
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Chemomechanical interplay of layered cathode materials undergoing fast charging in lithium batteries
NANO ENERGY
2018; 53: 753–62
View details for DOI 10.1016/j.nanoen.2018.09.051
View details for Web of Science ID 000448994600085
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Automatic projection image registration for nanoscale X-ray tomographic reconstruction.
Journal of synchrotron radiation
2018; 25 (Pt 6): 1819–26
Abstract
Novel developments in X-ray sources, optics and detectors have significantly advanced the capability of X-ray microscopy at the nanoscale. Depending on the imaging modality and the photon energy, state-of-the-art X-ray microscopes are routinely operated at a spatial resolution of tens of nanometres for hard X-rays or 10 nm for soft X-rays. The improvement in spatial resolution, however, has led to challenges in the tomographic reconstruction due to the fact that the imperfections of the mechanical system become clearly detectable in the projection images. Without proper registration of the projection images, a severe point spread function will be introduced into the tomographic reconstructions, causing the reduction of the three-dimensional (3D) spatial resolution as well as the enhancement of image artifacts. Here the development of a method that iteratively performs registration of the experimentally measured projection images to those that are numerically calculated by reprojecting the 3D matrix in the corresponding viewing angles is shown. Multiple algorithms are implemented to conduct the registration, which corrects the translational and/or the rotational errors. A sequence that offers a superior performance is presented and discussed. Going beyond the visual assessment of the reconstruction results, the morphological quantification of a battery electrode particle that has gone through substantial cycling is investigated. The results show that the presented method has led to a better quality tomographic reconstruction, which, subsequently, promotes the fidelity in the quantification of the sample morphology.
View details for DOI 10.1107/S1600577518013929
View details for PubMedID 30407194
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Understanding the Effect of Local Short-Range Ordering on Lithium Diffusion in Li1.3Nb0.3Mn0.4O2 Single-Crystal Cathode
CHEM
2018; 4 (9): 2108–23
View details for DOI 10.1016/j.chempr.2018.05.008
View details for Web of Science ID 000444488400016
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Propagation topography of redox phase transformations in heterogeneous layered oxide cathode materials
NATURE COMMUNICATIONS
2018; 9: 2810
Abstract
Redox phase transformations are relevant to a number of metrics pertaining to the electrochemical performance of batteries. These phase transformations deviate from and are more complicated than the conventional theory of phase nucleation and propagation, owing to simultaneous changes of cationic and anionic valence states as well as the polycrystalline nature of battery materials. Herein, we propose an integrative approach of mapping valence states and constructing chemical topographies to investigate the redox phase transformation in polycrystalline layered oxide cathode materials under thermal abuse conditions. We discover that, in addition to the three-dimensional heterogeneous phase transformation, there is a mesoscale evolution of local valence curvatures in valence state topographies. The relative probability of negative and positive local valence curvatures alternates during the layered-to-spinel/rocksalt phase transformation. The implementation of our method can potentially provide a universal approach to study phase transformation behaviors in battery materials and beyond.
View details for PubMedID 30022082
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Mesoscale Battery Science: The Behavior of Electrode Particles Caught on a Multispectral X-ray Camera.
Accounts of chemical research
2018
Abstract
Functional materials and devices are usually morphologically complex and chemically heterogeneous. Their structures are often designed to be hierarchical because of the desired functionalities, which usually require many different components to work together in a coherent manner. The lithium ion battery, as an energy storage device, is a very typical example of this kind of structure. In a lithium ion battery, the cathode, anode, and separator are soaked in a liquid electrolyte, facilitating the back and forward shuttling of the lithium ions for energy storage and release. The desired performance of a lithium ion battery has many different aspects that need to be engineered and balanced depending on the targeted applications. In most cases, the cathode material has become the limiting factor for further improvements and, thus, has attracted intense attention from the research community. While the improvement in the overall performance of the lithium ion battery is the ultimate goal of the research in this field, understanding the relationship between the microscopic properties and the macroscopic behaviors of the materials/devices can inform the design of better battery chemistries for practical applications. As a result, it is of great fundamental and practical importance to investigate the electrode materials using experimental probes that can provide good chemical sensitivity and sufficient spatial resolution, ideally, under operating conditions. With this motivation, our group has been focusing on the development of the nanoscale full-field X-ray spectro-microscopy, which has now become a well-recognized tool for imaging battery electrode materials at the particle level. With nanoscale spatial resolution, this technique can effectively and efficiently tackle the intrinsically complicated mesoscale chemistry. It allows us to monitor the particles' morphological and chemical evolution upon battery operation, providing valuable insights that can be incorporated into the design of new battery chemistries. In this Account, we review a series of our recent studies of battery electrode materials using nanoscale full-field X-ray spectro-microscopy. The materials that are the subjects of our studies, including layer-structured and spinel-structured oxide cathodes, are technically very important as they not only play an important role in today's devices but also possess promising potential for future developments. We discuss how the subparticle level compositional and state-of-charge heterogeneity can be visualized and linked to the bulk performance through systematic quantification of the imaging data. Subsequently, we highlight recent ex situ and in situ observations of the cathode particles' response to different reaction conditions, including the spontaneously adjusted reaction pathways and the morphological changes for the mechanical strain release. The important role of surface chemistry in the system is also discussed. While the microscopic investigation at the particle level provides useful insights, the degree to which this represents the overall properties of the battery is always a question for further generalizing the conclusions. In order to address this concern, we finally discuss a high throughput experimental approach, in which a large number of cathode particles are scanned. We discuss a case study that demonstrates the identification and analysis of functionally important minority phases in an operating battery cell through big data mining methods. With an emphasis on the data/information mining aspect of the nanoscale X-ray spectro-microscopic study of battery cathode particles, we anticipate that this Account will attract more research to this field.
View details for DOI 10.1021/acs.accounts.8b00123
View details for PubMedID 29889493
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Scientific data mining in nanoscale visualization of catalysis at work
AMER CHEMICAL SOC. 2018
View details for Web of Science ID 000435537702222
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Intensity modulation of the Shirley background of the Cr 3p spectra with photon energies around the Cr 2p edge
SURFACE AND INTERFACE ANALYSIS
2018; 50 (2): 246–52
View details for DOI 10.1002/sia.6364
View details for Web of Science ID 000425944500015
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Finding a Needle in the Haystack: Identification of Functionally Important Minority Phases in an Operating Battery
NANO LETTERS
2017; 17 (12): 7782–88
View details for DOI 10.1021/acs.nanolett.7b03985
View details for Web of Science ID 000418393300084
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Three-dimensional mapping of crystalline ceramic waste form materials
JOURNAL OF THE AMERICAN CERAMIC SOCIETY
2017; 100 (8): 3722-3735
View details for DOI 10.1111/jace.14885
View details for Web of Science ID 000408731300043
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In situ Visualization of State-of-Charge Heterogeneity within a LiCoO2 Particle that Evolves upon Cycling at Different Rates
ACS ENERGY LETTERS
2017; 2 (5): 1240-1245
View details for DOI 10.1021/acsenergylett.7b00263
View details for Web of Science ID 000401500200043
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Ultrasensitive probing of the local electronic structure of nitrogen doped carbon and its applications to 2D electronics, catalysis and bio-physics
AMER CHEMICAL SOC. 2017
View details for Web of Science ID 000430568506218
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Applications of x-ray tomography across multiple length scales
AMER CHEMICAL SOC. 2017
View details for Web of Science ID 000430568500666
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Back-gated graphene anode for more efficient thermionic energy converters
NANO ENERGY
2017; 32: 67-72
View details for DOI 10.1016/j.nanoen.2016.12.027
View details for Web of Science ID 000397003700009
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Determination of copper nanoparticle size distributions with total reflection X-ray fluorescence spectroscopy
JOURNAL OF SYNCHROTRON RADIATION
2017; 24: 283-287
Abstract
Total reflection X-ray fluorescence (TXRF) analysis is extensively used by the semiconductor industry for measuring trace metal contamination on silicon surfaces. In addition to determining the quantity of impurities on a surface, TXRF can reveal information about the vertical distribution of contaminants by measuring the fluorescence signal as a function of the angle of incidence. In this study, two samples were intentionally contaminated with copper in non-deoxygenated and deoxygenated ultrapure water (UPW) resulting in impurity profiles that were either atomically dispersed in a thin film or particle-like, respectively. The concentration profile of the samples immersed into deoxygenated UPW was calculated using a theoretical concentration profile representative of particles, yielding a mean particle height of 16.1 nm. However, the resulting theoretical profile suggested that a distribution of particle heights exists on the surface. The fit of the angular distribution data was further refined by minimizing the residual error of a least-squares fit employing a model with a Gaussian distribution of particle heights about the mean height. The presence of a height distribution was also confirmed with atomic force microscopy measurements.
View details for DOI 10.1107/S1600577516015484
View details for Web of Science ID 000391724900028
View details for PubMedID 28009568
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Analysis of Cathodic Reaction Process of SiCl4 during Si Electrodeposition in Ionic Liquids
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
2017; 164 (14): D994–D998
View details for DOI 10.1149/2.0761714jes
View details for Web of Science ID 000419187700089
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Unsupervised Data Mining in nanoscale X-ray Spectro-Microscopic Study of NdFeB Magnet
SCIENTIFIC REPORTS
2016; 6
Abstract
Novel developments in X-ray based spectro-microscopic characterization techniques have increased the rate of acquisition of spatially resolved spectroscopic data by several orders of magnitude over what was possible a few years ago. This accelerated data acquisition, with high spatial resolution at nanoscale and sensitivity to subtle differences in chemistry and atomic structure, provides a unique opportunity to investigate hierarchically complex and structurally heterogeneous systems found in functional devices and materials systems. However, handling and analyzing the large volume data generated poses significant challenges. Here we apply an unsupervised data-mining algorithm known as DBSCAN to study a rare-earth element based permanent magnet material, Nd2Fe14B. We are able to reduce a large spectro-microscopic dataset of over 300,000 spectra to 3, preserving much of the underlying information. Scientists can easily and quickly analyze in detail three characteristic spectra. Our approach can rapidly provide a concise representation of a large and complex dataset to materials scientists and chemists. For example, it shows that the surface of common Nd2Fe14B magnet is chemically and structurally very different from the bulk, suggesting a possible surface alteration effect possibly due to the corrosion, which could affect the material's overall properties.
View details for DOI 10.1038/srep34406
View details for Web of Science ID 000384188300001
View details for PubMedID 27680388
View details for PubMedCentralID PMC5041149
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Interface Engineering for Atomic Layer Deposited Alumina Gate Dielectric on SiGe Substrates.
ACS applied materials & interfaces
2016; 8 (29): 19110-19118
Abstract
Optimization of the interface between high-k dielectrics and SiGe substrates is a challenging topic due to the complexity arising from the coexistence of Si and Ge interfacial oxides. Defective high-k/SiGe interfaces limit future applications of SiGe as a channel material for electronic devices. In this paper, we identify the surface layer structure of as-received SiGe and Al2O3/SiGe structures based on soft and hard X-ray photoelectron spectroscopy. As-received SiGe substrates have native SiOx/GeOx surface layers, where the GeOx-rich layer is beneath a SiOx-rich surface. Silicon oxide regrows on the SiGe surface during Al2O3 atomic layer deposition, and both SiOx and GeOx regrow during forming gas anneal in the presence of a Pt gate metal. The resulting mixed SiOx-GeOx interface layer causes large interface trap densities (Dit) due to distorted Ge-O bonds across the interface. In contrast, we observe that oxygen-scavenging Al top gates decompose the underlying SiOx/GeOx, in a selective fashion, leaving an ultrathin SiOx interfacial layer that exhibits dramatically reduced Dit.
View details for DOI 10.1021/acsami.6b03331
View details for PubMedID 27345195
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Recent applications of hard x-ray photoelectron spectroscopy
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
2016; 34 (3)
View details for DOI 10.1116/1.4946046
View details for Web of Science ID 000379792200001
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Reverse engineering ancient Athenian pottery: A collaboration between cultural heritage, industry, and academia
AMER CHEMICAL SOC. 2016
View details for Web of Science ID 000431903800476
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Imaging of hierarchical structures with x-rays
AMER CHEMICAL SOC. 2016
View details for Web of Science ID 000431903800240
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To get the most out of high resolution X-ray tomography: A review of the post-reconstruction analysis
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY
2016; 117: 29-41
View details for DOI 10.1016/j.sab.2016.01.002
View details for Web of Science ID 000372385800005
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Formation of Si1+ in the early stages of the oxidation of the Si[001] 2x1 surface
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
2016; 34 (2)
View details for DOI 10.1116/1.4936336
View details for Web of Science ID 000372352300009
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Characterization of electronic structure of periodically strained graphene
APPLIED PHYSICS LETTERS
2015; 107 (18)
View details for DOI 10.1063/1.4934701
View details for Web of Science ID 000364580800063
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Engineering Ultra-Low Work Function of Graphene
NANO LETTERS
2015; 15 (10): 6475-6480
Abstract
Low work function materials are critical for energy conversion and electron emission applications. Here, we demonstrate for the first time that an ultralow work function graphene is achieved by combining electrostatic gating with a Cs/O surface coating. A simple device is built from large-area monolayer graphene grown by chemical vapor deposition, transferred onto 20 nm HfO2 on Si, enabling high electric fields capacitive charge accumulation in the graphene. We first observed over 0.7 eV work function change due to electrostatic gating as measured by scanning Kelvin probe force microscopy and confirmed by conductivity measurements. The deposition of Cs/O further reduced the work function, as measured by photoemission in an ultrahigh vacuum environment, which reaches nearly 1 eV, the lowest reported to date for a conductive, nondiamond material.
View details for DOI 10.1021/acs.nanolett.5b01916
View details for PubMedID 26401728
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High gradient rf gun studies of CsBr photocathodes
PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS
2015; 18 (4)
View details for DOI 10.1103/PhysRevSTAB.18.040701
View details for Web of Science ID 000352126600001
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Registration of the rotation axis in X-ray tomography.
Journal of synchrotron radiation
2015; 22: 452-457
Abstract
There is high demand for efficient, robust and automated routines for tomographic data reduction, particularly for synchrotron data. Registration of the rotation axis in data processing is a critical step affecting the quality of the reconstruction and is not easily implemented with automation. Existing methods for calculating the center of rotation have been reviewed and an improved algorithm to register the rotation axis in tomographic data is presented. The performance of the proposed method is evaluated using synchrotron-based microtomography data on geological samples with and without artificial reduction of the signal-to-noise ratio. The proposed method improves the reconstruction quality by correcting both the tilting error and the translational offset of the rotation axis. The limitation of this promising method is also discussed.
View details for DOI 10.1107/S160057751402726X
View details for PubMedID 25723947
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Evidence for an unorthodox firing sequence employed by the Berlin Painter: deciphering ancient ceramic firing conditions through high-resolution material characterization and replication
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
2015; 30 (3): 666-676
View details for DOI 10.1039/c4ja00376d
View details for Web of Science ID 000350650800012
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Nanoscale Morphological and Chemical Changes of High Voltage Lithium Manganese Rich NMC Composite Cathodes with Cycling
NANO LETTERS
2014; 14 (8): 4334-4341
Abstract
Understanding the evolution of chemical composition and morphology of battery materials during electrochemical cycling is fundamental to extending battery cycle life and ensuring safety. This is particularly true for the much debated high energy density (high voltage) lithium-manganese rich cathode material of composition Li(1 + x)M(1 - x)O2 (M = Mn, Co, Ni). In this study we combine full-field transmission X-ray microscopy (TXM) with X-ray absorption near edge structure (XANES) to spatially resolve changes in chemical phase, oxidation state, and morphology within a high voltage cathode having nominal composition Li1.2Mn0.525Ni0.175Co0.1O2. Nanoscale microscopy with chemical/elemental sensitivity provides direct quantitative visualization of the cathode, and insights into failure. Single-pixel (∼ 30 nm) TXM XANES revealed changes in Mn chemistry with cycling, possibly to a spinel conformation and likely including some Mn(II), starting at the particle surface and proceeding inward. Morphological analysis of the particles revealed, with high resolution and statistical sampling, that the majority of particles adopted nonspherical shapes after 200 cycles. Multiple-energy tomography showed a more homogeneous association of transition metals in the pristine particle, which segregate significantly with cycling. Depletion of transition metals at the cathode surface occurs after just one cycle, likely driven by electrochemical reactions at the surface.
View details for DOI 10.1021/nl502090z
View details for Web of Science ID 000340446200021
View details for PubMedID 25054780
View details for PubMedCentralID PMC4134180
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A cesium bromide photocathode excited by 405 nm radiation
APPLIED PHYSICS LETTERS
2014; 105 (2)
View details for DOI 10.1063/1.4890538
View details for Web of Science ID 000341151400008
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Recent advances in synchrotron-based hard x-ray phase contrast imaging
JOURNAL OF PHYSICS D-APPLIED PHYSICS
2013; 46 (49)
View details for DOI 10.1088/0022-3727/46/49/494001
View details for Web of Science ID 000327887500002
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The plastic nature of the human bone-periodontal ligament-tooth fibrous joint
BONE
2013; 57 (2): 455-467
Abstract
This study investigates bony protrusions within a narrowed periodontal ligament space (PDL-space) of a human bone-PDL-tooth fibrous joint by mapping structural, biochemical, and mechanical heterogeneity. Higher resolution structural characterization was achieved via complementary atomic force microscopy (AFM), nano-transmission X-ray microscopy (nano-TXM), and microtomography (MicroXCT™). Structural heterogeneity was correlated to biochemical and elemental composition, illustrated via histochemistry and microprobe X-ray fluorescence analysis (μ-XRF), and mechanical heterogeneity evaluated by AFM-based nanoindentation. Results demonstrated that the narrowed PDL-space was due to invasion of bundle bone (BB) into PDL-space. Protruded BB had a wider range with higher elastic modulus values (2-8GPa) compared to lamellar bone (0.8-6GPa), and increased quantities of Ca, P and Zn as revealed by μ-XRF. Interestingly, the hygroscopic 10-30μm interface between protruded BB and lamellar bone exhibited higher X-ray attenuation similar to cement lines and lamellae within bone. Localization of the small leucine rich proteoglycan biglycan (BGN) responsible for mineralization was observed at the PDL-bone interface and around the osteocyte lacunae. Based on these results, it can be argued that the LB-BB interface was the original site of PDL attachment, and that the genesis of protruded BB identified as protrusions occurred as a result of shift in strain. We emphasize the importance of bony protrusions within the context of organ function and that additional study is warranted.
View details for DOI 10.1016/j.bone.2013.09.007
View details for Web of Science ID 000326848000018
View details for PubMedID 24063947
View details for PubMedCentralID PMC3938967
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Microgravity Induces Pelvic Bone Loss through Osteoclastic Activity, Osteocytic Osteolysis, and Osteoblastic Cell Cycle Inhibition by CDKN1a/p21
PLOS ONE
2013; 8 (4)
Abstract
Bone is a dynamically remodeled tissue that requires gravity-mediated mechanical stimulation for maintenance of mineral content and structure. Homeostasis in bone occurs through a balance in the activities and signaling of osteoclasts, osteoblasts, and osteocytes, as well as proliferation and differentiation of their stem cell progenitors. Microgravity and unloading are known to cause osteoclast-mediated bone resorption; however, we hypothesize that osteocytic osteolysis, and cell cycle arrest during osteogenesis may also contribute to bone loss in space. To test this possibility, we exposed 16-week-old female C57BL/6J mice (n = 8) to microgravity for 15-days on the STS-131 space shuttle mission. Analysis of the pelvis by µCT shows decreases in bone volume fraction (BV/TV) of 6.29%, and bone thickness of 11.91%. TRAP-positive osteoclast-covered trabecular bone surfaces also increased in microgravity by 170% (p = 0.004), indicating osteoclastic bone degeneration. High-resolution X-ray nanoCT studies revealed signs of lacunar osteolysis, including increases in cross-sectional area (+17%, p = 0.022), perimeter (+14%, p = 0.008), and canalicular diameter (+6%, p = 0.037). Expression of matrix metalloproteinases (MMP) 1, 3, and 10 in bone, as measured by RT-qPCR, was also up-regulated in microgravity (+12.94, +2.98 and +16.85 fold respectively, p<0.01), with MMP10 localized to osteocytes, and consistent with induction of osteocytic osteolysis. Furthermore, expression of CDKN1a/p21 in bone increased 3.31 fold (p<0.01), and was localized to osteoblasts, possibly inhibiting the cell cycle during tissue regeneration as well as conferring apoptosis resistance to these cells. Finally the apoptosis inducer Trp53 was down-regulated by -1.54 fold (p<0.01), possibly associated with the quiescent survival-promoting function of CDKN1a/p21. In conclusion, our findings identify the pelvic and femoral region of the mouse skeleton as an active site of rapid bone loss in microgravity, and indicate that this loss is not limited to osteoclastic degradation. Therefore, this study offers new evidence for microgravity-induced osteocytic osteolysis, and CDKN1a/p21-mediated osteogenic cell cycle arrest.
View details for DOI 10.1371/journal.pone.0061372
View details for Web of Science ID 000317908700027
View details for PubMedID 23637819
View details for PubMedCentralID PMC3630201
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Three-dimensional microstructural mapping of poisoning phases in the Neodymium Nickelate solid oxide fuel cell cathode
SOLID STATE IONICS
2013; 237: 16-21
View details for DOI 10.1016/j.ssi.2013.01.020
View details for Web of Science ID 000317884000003
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Nanoscale Examination of Microdamage in Sheep Cortical Bone Using Synchrotron Radiation Transmission X-Ray Microscopy
PLOS ONE
2013; 8 (3)
Abstract
Microdamage occurs in bone through repeated and excessive loading. Accumulation of microdamage weakens bone, leading to a loss of strength, stiffness and energy dissipation in the tissue. Imaging techniques used to examine microdamage have typically been limited to the microscale. In the current study microdamage was examined at the nanoscale using transmission x-ray microscopy with an x-ray negative stain, lead-uranyl acetate. Microdamage was generated in notched and unnotched beams of sheep cortical bone (2×2×20 mm), with monotonic and fatigue loading. Bulk sections were removed from beams and stained with lead-uranyl acetate to identify microdamage. Samples were sectioned to 50 microns and imaged using transmission x-ray microscopy producing projection images of microdamage with nanoscale resolution. Staining indicated microdamage occurred in both the tensile and compressive regions. A comparison between monotonic and fatigue loading indicated a statistically significant greater amount of stain present in fatigue loaded sections. Microdamage occurred in three forms: staining to existing bone structures, cross hatch damage and a single crack extending from the notch tip. Comparison to microcomputed tomography demonstrated differences in damage morphology and total damage between the microscale and nanoscale. This method has future applications for understanding the underlying mechanisms for microdamage formation as well as three-dimensional nanoscale examination of microdamage.
View details for DOI 10.1371/journal.pone.0057942
View details for Web of Science ID 000315637900064
View details for PubMedID 23472121
View details for PubMedCentralID PMC3589441
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In Vacuo Photoemission Studies of Platinum Atomic Layer Deposition Using Synchrotron Radiation
JOURNAL OF PHYSICAL CHEMISTRY LETTERS
2013; 4 (1): 176-179
Abstract
The mechanism of platinum atomic layer deposition using (methylcyclopentadienyl)trimethylplatinum and oxygen is investigated with in vacuo photoemission spectroscopy at the Stanford Synchrotron Radiation Lightsource. With this surface-sensitive technique, the surface species following the Pt precursor half cycle and the oxygen counter-reactant half cycle can be directly measured. We observed significant amounts of carbonaceous species following the Pt precursor pulse, consistent with dehydrogenation of the precursor ligands. Significantly more carbon is observed when deposition is carried out in the thermal decomposition temperature region. The carbonaceous layer is removed during the oxygen counter reactant pulse, and the photoemission spectrum shows that a layer of adsorbed oxygen remains on the surface as previously predicted.
View details for DOI 10.1021/jz301475z
View details for Web of Science ID 000313142000029
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In Vacuo Photoemission Studies of Platinum Atomic Layer Deposition Using Synchrotron Radiation.
The journal of physical chemistry letters
2013; 4 (1): 176-9
Abstract
The mechanism of platinum atomic layer deposition using (methylcyclopentadienyl)trimethylplatinum and oxygen is investigated with in vacuo photoemission spectroscopy at the Stanford Synchrotron Radiation Lightsource. With this surface-sensitive technique, the surface species following the Pt precursor half cycle and the oxygen counter-reactant half cycle can be directly measured. We observed significant amounts of carbonaceous species following the Pt precursor pulse, consistent with dehydrogenation of the precursor ligands. Significantly more carbon is observed when deposition is carried out in the thermal decomposition temperature region. The carbonaceous layer is removed during the oxygen counter reactant pulse, and the photoemission spectrum shows that a layer of adsorbed oxygen remains on the surface as previously predicted.
View details for DOI 10.1021/jz301475z
View details for PubMedID 26291229
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Portable atomic layer deposition reactor for in situ synchrotron photoemission studies.
Review of scientific instruments
2013; 84 (1): 015104-?
Abstract
We report the design of a portable atomic layer deposition (ALD) reactor that can be integrated into synchrotron facilities for in situ synchrotron photoemission studies. The design allows for universal installation of the system onto different beam line end stations. The ALD reactor operates as a fully functional, low vacuum deposition system under the conditions of a typical ALD reactor while allowing the samples to be analyzed in an ultrahigh vacuum (UHV) chamber through a quick transfer without vacuum break. This system not only minimizes the exposure of the UHV chamber to the ALD reactants, but it also eliminates the necessity of a beam alignment step after installation. The system has been successfully installed at the synchrotron and tested in the mechanistic studies of platinum ALD following individual half reaction cycles.
View details for DOI 10.1063/1.4773230
View details for PubMedID 23387692
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Study on the synthesis-microstructure-performance relationship of layered Li-excess nickel-manganese oxide as a Li-ion battery cathode prepared by high-temperature calcination
JOURNAL OF MATERIALS CHEMISTRY A
2013; 1 (36): 10847-10856
View details for DOI 10.1039/c3ta11716b
View details for Web of Science ID 000323276200035
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Data-processing strategies for nano-tomography with elemental specification
SPIE X-ray Nanoimaging Conference - Instruments and Methods
SPIE-INT SOC OPTICAL ENGINEERING. 2013
View details for DOI 10.1117/12.2026436
View details for Web of Science ID 000329578700007
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Portable atomic layer deposition reactor for in situ synchrotron photoemission studies
REVIEW OF SCIENTIFIC INSTRUMENTS
2013; 84 (1)
View details for DOI 10.1063/1.4773230
View details for Web of Science ID 000314729100063
View details for PubMedID 23387692
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Photocathode device using diamondoid and cesium bromide films
APPLIED PHYSICS LETTERS
2012; 101 (24)
View details for DOI 10.1063/1.4769043
View details for Web of Science ID 000312490000024
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Experimental verification of the 3-step model of photoemission for energy spread and emittance measurements of copper and CsBr-coated copper photocathodes suitable for free electron laser applications
APPLIED PHYSICS LETTERS
2012; 101 (23)
View details for DOI 10.1063/1.4769220
View details for Web of Science ID 000312243900003
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Formation of arsenolite crystals at room temperature after very high dose arsenic implantation in silicon
APPLIED PHYSICS LETTERS
2012; 101 (23)
View details for DOI 10.1063/1.4769446
View details for Web of Science ID 000312243900039
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Extended depth of focus for transmission x-ray microscope
OPTICS LETTERS
2012; 37 (17): 3708-3710
Abstract
A fast discrete curvelet transform based focus-stacking algorithm for extending the depth of focus of a transmission x-ray microscope (TXM) is presented. By analyzing an image stack of a sample taken in a Z-scan, a fully in-focus image can be generated by the proposed scheme. With the extended depth of focus, it is possible to obtain 3D structural information over a large volume at nanometer resolution. The focus-stacking method has been demonstrated using a dataset taken with a laboratory x-ray source based TXM system. The possibility and limitations of generalizing this method to a synchrotron based TXM are also discussed. We expect the proposed method to be of important impact in 3D x-ray microscopy.
View details for Web of Science ID 000308595300078
View details for PubMedID 22940998
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3D elemental sensitive imaging using transmission X-ray microscopy
ANALYTICAL AND BIOANALYTICAL CHEMISTRY
2012; 404 (5): 1297-1301
Abstract
Determination of the heterogeneous distribution of metals in alloy/battery/catalyst and biological materials is critical to fully characterize and/or evaluate the functionality of the materials. Using synchrotron-based transmission x-ray microscopy (TXM), it is now feasible to perform nanoscale-resolution imaging over a wide X-ray energy range covering the absorption edges of many elements; combining elemental sensitive imaging with determination of sample morphology. We present an efficient and reliable methodology to perform 3D elemental sensitive imaging with excellent sample penetration (tens of microns) using hard X-ray TXM. A sample of an Al-Si piston alloy is used to demonstrate the capability of the proposed method.
View details for DOI 10.1007/s00216-012-5818-9
View details for Web of Science ID 000307957800004
View details for PubMedID 22349401
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In situ transmission X-ray microscopy and nanotomography on Fischer-Tropsch catalysts
AMER CHEMICAL SOC. 2012
View details for Web of Science ID 000324621804061
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TXM-Wizard: a program for advanced data collection and evaluation in full-field transmission X-ray microscopy
JOURNAL OF SYNCHROTRON RADIATION
2012; 19: 281-287
Abstract
Transmission X-ray microscopy (TXM) has been well recognized as a powerful tool for non-destructive investigation of the three-dimensional inner structure of a sample with spatial resolution down to a few tens of nanometers, especially when combined with synchrotron radiation sources. Recent developments of this technique have presented a need for new tools for both system control and data analysis. Here a software package developed in MATLAB for script command generation and analysis of TXM data is presented. The first toolkit, the script generator, allows automating complex experimental tasks which involve up to several thousand motor movements. The second package was designed to accomplish computationally intense tasks such as data processing of mosaic and mosaic tomography datasets; dual-energy contrast imaging, where data are recorded above and below a specific X-ray absorption edge; and TXM X-ray absorption near-edge structure imaging datasets. Furthermore, analytical and iterative tomography reconstruction algorithms were implemented. The compiled software package is freely available.
View details for DOI 10.1107/S0909049511049144
View details for Web of Science ID 000300571300019
View details for PubMedID 22338691
View details for PubMedCentralID PMC3284347
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Formation Of Arsenic Rich Silicon Oxide Under Plasma Immersion Ion Implantation And Laser Annealing
19th International Conference on Ion Implantation Technology (IIT)
AMER INST PHYSICS. 2012: 183–188
View details for DOI 10.1063/1.4766520
View details for Web of Science ID 000312160700043
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FULL FIELD IMAGING OF NICKEL OXIDATION STATES IN SOLID OXIDE FUEL CELL ANODE MATERIALS BY XANES NANOTOMOGRAPHY
9th International Conference on Fuel Cell Science, Engineering and Technology
AMER SOC MECHANICAL ENGINEERS. 2012: 267–269
View details for Web of Science ID 000320009200036
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ANALYSIS OF SOLID OXIDE FUEL CELL LSM-YSZ COMPOSITE CATHODES WITH VARYING STARTING POWDER SIZES
ASME International Mechanical Engineering Congress and Exposition (IMECE)
AMER SOC MECHANICAL ENGINEERS. 2012: 581–584
View details for Web of Science ID 000324959300066
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Hard X-ray Nanotomography of Catalytic Solids at Work
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION
2012; 51 (48): 11986-11990
View details for DOI 10.1002/anie.201204930
View details for Web of Science ID 000311705000009
View details for PubMedID 23090844
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Ultrathin ALD-Al2O3 layers for Ge(001) gate stacks: Local composition evolution and dielectric properties
JOURNAL OF APPLIED PHYSICS
2011; 110 (9)
View details for DOI 10.1063/1.3647761
View details for Web of Science ID 000297062100087
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Electron bombardment of films used for reducing spurious charge in electrostatic electron optics
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
2011; 29 (6)
View details for DOI 10.1116/1.3663957
View details for Web of Science ID 000298538800025
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Three-dimensional imaging of chemical phase transformations at the nanoscale with full-field transmission X-ray microscopy
JOURNAL OF SYNCHROTRON RADIATION
2011; 18: 773-781
Abstract
The ability to probe morphology and phase distribution in complex systems at multiple length scales unravels the interplay of nano- and micrometer-scale factors at the origin of macroscopic behavior. While different electron- and X-ray-based imaging techniques can be combined with spectroscopy at high resolutions, owing to experimental time limitations the resulting fields of view are too small to be representative of a composite sample. Here a new X-ray imaging set-up is proposed, combining full-field transmission X-ray microscopy (TXM) with X-ray absorption near-edge structure (XANES) spectroscopy to follow two-dimensional and three-dimensional morphological and chemical changes in large volumes at high resolution (tens of nanometers). TXM XANES imaging offers chemical speciation at the nanoscale in thick samples (>20 µm) with minimal preparation requirements. Further, its high throughput allows the analysis of large areas (up to millimeters) in minutes to a few hours. Proof of concept is provided using battery electrodes, although its versatility will lead to impact in a number of diverse research fields.
View details for DOI 10.1107/S0909049511019364
View details for Web of Science ID 000294821600014
View details for PubMedID 21862859
View details for PubMedCentralID PMC3161818
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Transmission X-Ray Microscopy for Full-Field Nano Imaging of Biomaterials
MICROSCOPY RESEARCH AND TECHNIQUE
2011; 74 (7): 671-681
Abstract
Imaging of cellular structure and extended tissue in biological materials requires nanometer resolution and good sample penetration, which can be provided by current full-field transmission X-ray microscopic techniques in the soft and hard X-ray regions. The various capabilities of full-field transmission X-ray microscopy (TXM) include 3D tomography, Zernike phase contrast, quantification of absorption, and chemical identification via X-ray fluorescence and X-ray absorption near edge structure imaging. These techniques are discussed and compared in light of results from the imaging of biological materials including microorganisms, bone and mineralized tissue, and plants, with a focus on hard X-ray TXM at ≤ 40-nm resolution.
View details for DOI 10.1002/jemt.20907
View details for Web of Science ID 000292570900011
View details for PubMedID 20734414
View details for PubMedCentralID PMC2992572
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Device quality Sb-based compound semiconductor surface: A comparative study of chemical cleaning
JOURNAL OF APPLIED PHYSICS
2011; 109 (11)
View details for DOI 10.1063/1.3590167
View details for Web of Science ID 000292214700167
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Comparison of SOFC cathode microstructure quantified using X-ray nanotomography and focused ion beam-scanning electron microscopy
ELECTROCHEMISTRY COMMUNICATIONS
2011; 13 (6): 586-589
View details for DOI 10.1016/j.elecom.2011.03.016
View details for Web of Science ID 000292670300016
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Schottky barrier height reduction for metal/n-GaSb contact by inserting TiO2 interfacial layer with low tunneling resistance
APPLIED PHYSICS LETTERS
2011; 98 (17)
View details for DOI 10.1063/1.3584862
View details for Web of Science ID 000290046100032
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Three-dimensional mapping of nickel oxidation states using full field x-ray absorption near edge structure nanotomography
APPLIED PHYSICS LETTERS
2011; 98 (17)
View details for DOI 10.1063/1.3574774
View details for Web of Science ID 000290046100055
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3D nanoscale chemical imaging of Li-ion battery electrodes
241st National Meeting and Exposition of the American-Chemical-Society (ACS)
AMER CHEMICAL SOC. 2011
View details for Web of Science ID 000291982801471
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Phase retrieval using polychromatic illumination for transmission X-ray microscopy
OPTICS EXPRESS
2011; 19 (2): 540-545
Abstract
An alternative method for quantitative phase retrieval in a transmission X-ray microscope system at sub-50-nm resolution is presented. As an alternative to moving the sample in the beam direction in order to analyze the propagation-introduced phase effect, we have illuminated the TXM using X-rays of different energy without any motor movement in the TXM system. Both theoretical analysis and experimental studies have confirmed the feasibility and the advantage of our method, because energy tuning can be performed with very high energy resolution using a double crystal monochromator at a synchrotron beam line, and there is zero motor error in TXM system in our approach. High-spatial-resolution phase retrieval is accomplished using the proposed method.
View details for Web of Science ID 000286314600014
View details for PubMedID 21263593
View details for PubMedCentralID PMC3482903
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Sub-15 nm Photo-electron Source Using a Nano-aperture Integrated with a Nano-antenna
Conference on Lasers and Electro-Optics (CLEO)
IEEE. 2011
View details for Web of Science ID 000295612403061
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3D Imaging of Nickel Oxidation States using Full Field X-ray Absorption Near Edge Structure Nanotomography
12th International Symposium on Solid Oxide Fuel Cells (SOFC)
ELECTROCHEMICAL SOC INC. 2011: 1315–21
View details for DOI 10.1149/1.3570117
View details for Web of Science ID 000300770102038
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Comparison of X-ray Nanotomography and FIB-SEM in Quantifying the Composite LSM/YSZ SOFC Cathode Microstructure
12th International Symposium on Solid Oxide Fuel Cells (SOFC)
ELECTROCHEMICAL SOC INC. 2011: 2417–21
View details for DOI 10.1149/1.3570238
View details for Web of Science ID 000300770104049
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Applications of Hard X-ray Full-Field Transmission X-ray Microscopy at SSRL
10th International Conference on X-ray Microscopy
AMER INST PHYSICS. 2011: 357–360
View details for DOI 10.1063/1.3625377
View details for Web of Science ID 000298672400084
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A Condenser Scanner for Artifact-Free, Large Field of View, Full-Field X-ray Microscopy at Synchrotrons
10th International Conference on X-ray Microscopy
AMER INST PHYSICS. 2011: 136–139
View details for Web of Science ID 000298672400030
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High-Mobility Ge N-MOSFETs and Mobility Degradation Mechanisms
IEEE TRANSACTIONS ON ELECTRON DEVICES
2011; 58 (1): 59-66
View details for DOI 10.1109/TED.2010.2088124
View details for Web of Science ID 000285840100009
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Nondestructive detection of deviation in integrated circuits
54th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication
A V S AMER INST PHYSICS. 2010: C6Q25-C6Q27
View details for DOI 10.1116/1.3518464
View details for Web of Science ID 000285015200121
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Optical and computed evaluation of keyhole diffractive imaging for lensless x-ray microscopy
54th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication
A V S AMER INST PHYSICS. 2010: C6Q1-C6Q5
View details for DOI 10.1116/1.3501340
View details for Web of Science ID 000285015200118
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Photon-enhanced thermionic emission for solar concentrator systems
NATURE MATERIALS
2010; 9 (9): 762-767
Abstract
Solar-energy conversion usually takes one of two forms: the 'quantum' approach, which uses the large per-photon energy of solar radiation to excite electrons, as in photovoltaic cells, or the 'thermal' approach, which uses concentrated sunlight as a thermal-energy source to indirectly produce electricity using a heat engine. Here we present a new concept for solar electricity generation, photon-enhanced thermionic emission, which combines quantum and thermal mechanisms into a single physical process. The device is based on thermionic emission of photoexcited electrons from a semiconductor cathode at high temperature. Temperature-dependent photoemission-yield measurements from GaN show strong evidence for photon-enhanced thermionic emission, and calculated efficiencies for idealized devices can exceed the theoretical limits of single-junction photovoltaic cells. The proposed solar converter would operate at temperatures exceeding 200 degrees C, enabling its waste heat to be used to power a secondary thermal engine, boosting theoretical combined conversion efficiencies above 50%.
View details for DOI 10.1038/NMAT2814
View details for Web of Science ID 000281178400029
View details for PubMedID 20676086
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3D nanoscale imaging of the yeast, Schizosaccharomyces pombe, by full-field transmission X-ray microscopy at 5.4 keV
ANALYTICAL AND BIOANALYTICAL CHEMISTRY
2010; 397 (6): 2117-2121
Abstract
Three-dimensional (3D) nanoscale structures of the fission yeast, Schizosaccharomyces pombe, can be obtained by full-field transmission hard X-ray microscopy with 30 nm resolution using synchrotron radiation sources. Sample preparation is relatively simple and the samples are portable across various imaging environments, allowing for high-throughput sample screening. The yeast cells were fixed and double-stained with Reynold's lead citrate and uranyl acetate. We performed both absorption contrast and Zernike phase contrast imaging on these cells in order to test this method. The membranes, nucleus, and subcellular organelles of the cells were clearly visualized using absorption contrast mode. The X-ray images of the cells could be used to study the spatial distributions of the organelles in the cells. These results show unique structural information, demonstrating that hard X-ray microscopy is a complementary method for imaging and analyzing biological samples.
View details for DOI 10.1007/s00216-010-3617-8
View details for Web of Science ID 000279453000010
View details for PubMedID 20349228
View details for PubMedCentralID PMC2896439
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The dependence of the oxidation enhancement of InP(100) surface on the coverage of the adsorbed Cs
JOURNAL OF APPLIED PHYSICS
2010; 107 (12)
View details for DOI 10.1063/1.3452384
View details for Web of Science ID 000279993900167
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Reaction Mechanism, Bonding, and Thermal Stability of 1-Alkanethiols Self-Assembled on Halogenated Ge Surfaces
LANGMUIR
2010; 26 (11): 8419-8429
Abstract
We have employed synchrotron radiation photoemission spectroscopy to study the reaction mechanism, surface bonding, and thermal stability of 1-octadecanethiolate (ODT) self-assembled monolayers (SAMs) at Cl- and Br-terminated Ge(100) surfaces. Density functional theory (DFT) calculations were also carried out for the same reactions. From DFT calculations, we have found that adsorption of 1-octadecanethiol on the halide-terminated surface via hydrohalogenic acid elimination is kinetically favorable on both Cl- and Br-terminated Ge surfaces at room temperature, but the reactions are more thermodynamically favorable at Cl-terminated Ge surfaces. After ODT SAM formation at room temperature, photoemission spectroscopy experiments show that Ge(100) and (111) surfaces contain monothiolates and possibly dithiolates together with unbound thiol and atomic sulfur. Small coverages of residual halide are also observed, consistent with predictions by DFT. Annealing studies in ultrahigh vacuum show that the Ge thiolates are thermally stable up to 150 degrees C. The majority of the surface thiolates are converted to sulfide and carbide upon annealing to 350 degrees C. By 430 degrees C, no sulfur remains on the surface, whereas Ge carbide is stable to above 470 degrees C.
View details for DOI 10.1021/la904864c
View details for Web of Science ID 000277928100104
View details for PubMedID 20433151
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Synchrotron radiation-induced total reflection X-ray fluorescence analysis
TRAC-TRENDS IN ANALYTICAL CHEMISTRY
2010; 29 (6): 479-496
View details for DOI 10.1016/j.trac.2010.04.001
View details for Web of Science ID 000279235000015
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Nanoscale X-Ray Microscopic Imaging of Mammalian Mineralized Tissue
MICROSCOPY AND MICROANALYSIS
2010; 16 (3): 327-336
Abstract
A novel hard transmission X-ray microscope (TXM) at the Stanford Synchrotron Radiation Lightsource operating from 5 to 15 keV X-ray energy with 14 to 30 microm2 field of view has been used for high-resolution (30-40 nm) imaging and density quantification of mineralized tissue. TXM is uniquely suited for imaging of internal cellular structures and networks in mammalian mineralized tissues using relatively thick (50 microm), untreated samples that preserve tissue micro- and nanostructure. To test this method we performed Zernike phase contrast and absorption contrast imaging of mouse cancellous bone prepared under different conditions of in vivo loading, fixation, and contrast agents. In addition, the three-dimensional structure was examined using tomography. Individual osteocytic lacunae were observed embedded within trabeculae in cancellous bone. Extensive canalicular networks were evident and included processes with diameters near the 30-40 nm instrument resolution that have not been reported previously. Trabecular density was quantified relative to rod-like crystalline apatite, and rod-like trabecular struts were found to have 51-54% of pure crystal density and plate-like areas had 44-53% of crystal density. The nanometer resolution of TXM enables future studies for visualization and quantification of ultrastructural changes in bone tissue resulting from osteoporosis, dental disease, and other pathologies.
View details for DOI 10.1017/S1431927610000231
View details for Web of Science ID 000277902600011
View details for PubMedID 20374681
View details for PubMedCentralID PMC2873966
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The effects of wet surface clean and in situ interlayer on In-0.52Al0.48As metal-oxide-semiconductor characteristics
APPLIED PHYSICS LETTERS
2010; 96 (14)
View details for DOI 10.1063/1.3379024
View details for Web of Science ID 000276554600066
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Effects of Al doping and annealing on chemical states and band diagram of Y2O3/Si gate stacks studied by photoemission and x-ray absorption spectroscopy
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
2010; 28 (1): 16-19
View details for DOI 10.1116/1.3259869
View details for Web of Science ID 000273182800004
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Deactivation of submelt laser annealed arsenic ultrashallow junctions in silicon during subsequent thermal treatment
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
2010; 28 (1): C1B1-C1B5
View details for DOI 10.1116/1.3242637
View details for Web of Science ID 000275511800002
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Hard X-ray Full Field Nano-imaging of Bone and Nanowires at SSRL
10th International Conference on Synchrotron Radiation Instrumentation
AMER INST PHYSICS. 2010: 79–82
Abstract
A hard X-ray full field microscope from Xradia Inc. has been installed at SSRL on a 54-pole wiggler end station at beam line 6-2. It has been optimized to operate from 5-14 keV with resolution as high as 30 nm. High quality images are achieved using a vertical beam stabilizer and condenser scanner with high efficiency zone plates with 30 nm outermost zone width. The microscope has been used in Zernike phase contrast, available at 5.4 keV and 8 keV, as well as absorption contrast to image a variety of biological, environmental and materials samples. Calibration of the X-ray attenuation with crystalline apatite enabled quantification of bone density of plate-like and rod-like regions of mouse bone trabecula. 3D tomography of individual lacuna revealed the surrounding cell canaliculi and processes. 3D tomography of chiral branched PbSe nanowires showed orthogonal branches around a central nanowire.
View details for Web of Science ID 000283705500016
View details for PubMedCentralID PMC2944249
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Performance of a CsBr coated Nb photocathode at room temperature
JOURNAL OF APPLIED PHYSICS
2010; 107 (1)
View details for DOI 10.1063/1.3276222
View details for Web of Science ID 000273689600006
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Radical oxidation of germanium for interface gate dielectric GeO2 formation in metal-insulator-semiconductor gate stack
JOURNAL OF APPLIED PHYSICS
2009; 106 (10)
View details for DOI 10.1063/1.3259407
View details for Web of Science ID 000272932300103
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Apparatus to measure electron reflection
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
2009; 27 (6): 2644-2647
View details for DOI 10.1116/1.3242695
View details for Web of Science ID 000272803400065
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Iterative phase recovery using wavelet domain constraints
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
2009; 27 (6): 3192-3195
View details for DOI 10.1116/1.3258632
View details for Web of Science ID 000272803400174
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The surface activation layer of GaAs negative electron affinity photocathode activated by Cs, Li, and NF3
APPLIED PHYSICS LETTERS
2009; 95 (17)
View details for DOI 10.1063/1.3257730
View details for Web of Science ID 000271360400095
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Using X-ray Microscopy and Hg L-3 XAMES To Study Hg Binding in the Rhizosphere of Spartina Cordgrass
ENVIRONMENTAL SCIENCE & TECHNOLOGY
2009; 43 (19): 7397-7402
Abstract
San Francisco Bay has been contaminated historically by mercury from mine tailings as well as contemporary industrial sources. Native Spartina foliosa and non-native S. alterniflora-hybrid cordgrasses are dominant florae within the SF Bay estuary environment. Understanding mercury uptake and transformations in these plants will help to characterize the significance of their roles in mercury biogeochemical cycling in the estuarine environment. Methylated mercury can be biomagnified up the food web, resulting in levels in sport fish up to 1 million times greater than in surrounding waters and resulting in advisories to limit fish intake. Understanding the uptake and methylation of mercury in the plant rhizosphere can yield insight into ways to manage mercury contamination. The transmission X-ray microscope on beamline 6-2 at the Stanford Synchrotron Radiation Lightsource (SSRL) was used to obtain absorption contrast images and 3D tomography of Spartina foliosa roots that were exposed to 1 ppm Hg (as HgCl2) hydroponically for 1 week. Absorption contrast images of micrometer-sized roots from S. foliosa revealed dark particles, and dark channels within the root, due to Hg absorption. 3D tomography showed that the particles are on the root surface, and slices from the tomographic reconstruction revealed that the particles are hollow, consistent with microorganisms with a thin layer of Hg on the surface. Hg L3 XANES of ground-up plant roots and Hg L3 micro-XANES from microprobe analysis of micrometer-sized roots (60-120 microm in size) revealed three main types of speciation in both Spartina species: Hg-S ligation in a form similar to Hg(II) cysteine, Hg-S bonding as in cinnabar and metacinnabar, and methylmercury-carboxyl bonding in a form similar to methylmercury acetate. These results are interpreted within the context of obtaining a "snapshot" of mercury methylation in progress.
View details for DOI 10.1021/es901076q
View details for Web of Science ID 000270136500040
View details for PubMedID 19848152
View details for PubMedCentralID PMC2768038
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Study on mechanism of crystallization in HfO2 films on Si substrates by in-depth profile analysis using photoemission spectroscopy
JOURNAL OF APPLIED PHYSICS
2009; 106 (6)
View details for DOI 10.1063/1.3212979
View details for Web of Science ID 000270378100113
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Gold Removal from Germanium Nanowires
LANGMUIR
2009; 25 (16): 9473-9479
Abstract
We report the selective removal of gold from the tips of germanium nanowires (GeNWs) grown by chemical vapor deposition on gold nanoparticles (AuNPs). Selective removal was accomplished by aqueous hydrochloric acid solutions containing either potassium triiodide or iodine. Measurement of the residual number of gold atoms on the GeNW samples using inductively coupled plasma-mass spectrometry shows that 99% of the gold was removed. Photoemission spectroscopy shows that the germanium surfaces of these samples were not further oxidized after treatment with these liquid etchants. Auger electron spectroscopy shows that AuNPs that did not yield GeNWs contain germanium and also that the addition of gaseous HCl to GeH(4) during GeNW growth increased the selectivity of germanium deposition to the AuNPs.
View details for DOI 10.1021/la900725b
View details for Web of Science ID 000268719900088
View details for PubMedID 19419180
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Hafnium oxide/germanium oxynitride gate stacks on germanium: Capacitance scaling and interface state density
APPLIED PHYSICS LETTERS
2009; 94 (18)
View details for DOI 10.1063/1.3116624
View details for Web of Science ID 000265933700046
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Electron sources utilizing thin CsBr coatings
34th International Conference on Micro- and Nano-Engineering
ELSEVIER SCIENCE BV. 2009: 529–31
View details for DOI 10.1016/j.mee.2008.11.063
View details for Web of Science ID 000267273300020
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Erase and Retention Improvements in Charge Trap Flash Through Engineered Charge Storage Layer
IEEE ELECTRON DEVICE LETTERS
2009; 30 (3): 216-218
View details for DOI 10.1109/LED.2009.2012397
View details for Web of Science ID 000263920400005
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High Quality GeO2/Ge Interface Formed by SPA Radical Oxidation and Uniaxial Stress Engineering for High Performance Ge NMOSFETs
Symposium on VLSI Technology
JAPAN SOCIETY APPLIED PHYSICS. 2009: 76–77
View details for Web of Science ID 000275651200027
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Full-field transmission x-ray microscopy for bio-imaging
9th International Conference on X-Ray Microscopy
IOP PUBLISHING LTD. 2009
View details for DOI 10.1088/1742-6596/186/1/012081
View details for Web of Science ID 000282023900081
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Full-field transmission x-ray microscopy at SSRL
9th International Conference on X-Ray Microscopy
IOP PUBLISHING LTD. 2009
View details for DOI 10.1088/1742-6596/186/1/012002
View details for Web of Science ID 000282023900002
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Origin of the Monochromatic Photoemission Peak in Diamondoid Monolayers
NANO LETTERS
2009; 9 (1): 57-61
Abstract
Recent photoemission experiments have discovered a highly monochromatized secondary electron peak emitted from diamondoid self-assembled monolayers on metal substrates. New experimental data and simulation results are presented to show that a combination of negative electron affinity and strong electron-phonon scattering is responsible for this behavior. The simulation results are generated using a simple Monte Carlo transport algorithm. The simulated spectra recreate the main spectral features of the measured ones.
View details for DOI 10.1021/nl802310k
View details for Web of Science ID 000262519100010
View details for PubMedID 18975993
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Experimental Demonstration of High Mobility Ge NMOS
IEEE International Electron Devices Meeting (IEDM 2009)
IEEE. 2009: 420–423
View details for Web of Science ID 000279343900110
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Correlation of local structure and electrical activation in arsenic ultrashallow junctions in silicon
JOURNAL OF APPLIED PHYSICS
2008; 104 (10)
View details for DOI 10.1063/1.3026706
View details for Web of Science ID 000262605800082
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Arsenic-dominated chemistry in the acid cleaning of InGaAs and InAlAs surfaces
APPLIED PHYSICS LETTERS
2008; 93 (19)
View details for DOI 10.1063/1.3025852
View details for Web of Science ID 000260944100134
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Synchrotron radiation photoemission spectroscopic study of band offsets and interface self-cleaning by atomic layer deposited HfO2 on In0.53Ga0.47As and In0.52Al0.48As
APPLIED PHYSICS LETTERS
2008; 93 (18)
View details for DOI 10.1063/1.3020298
View details for Web of Science ID 000260778100030
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X-ray diffraction microscopy: Reconstruction with partial magnitude and spatial a priori information
52nd International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication
A V S AMER INST PHYSICS. 2008: 2362–66
View details for DOI 10.1116/1.3002487
View details for Web of Science ID 000261385600098
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Evaluation of electron energy spread in CsBr based photocathodes
52nd International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication
A V S AMER INST PHYSICS. 2008: 2085–90
View details for DOI 10.1116/1.2976572
View details for Web of Science ID 000261385600045
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The effectiveness of HCl and HF cleaning of Si0.85Ge0.15 surface
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
2008; 26 (5): 1248-1250
View details for DOI 10.1116/1.2966428
View details for Web of Science ID 000259296000023
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The work function of submonolayer cesium-covered gold: A photoelectron spectroscopy study
JOURNAL OF CHEMICAL PHYSICS
2008; 129 (2)
Abstract
Using visible and x-ray photoelectron spectroscopy, we measured the work function of a Au(111) surface at a well-defined submonolayer coverage of Cs. For a Cs coverage producing a photoemission maximum with a He-Ne laser, the work function is 1.61+/-0.08 eV, consistent with previous assumptions used to analyze vibrationally promoted electron emission. A discussion of possible Cs layer structures is also presented.
View details for DOI 10.1063/1.2953712
View details for Web of Science ID 000257629100046
View details for PubMedID 18624554
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Photoemission study of Cs-NF3 activated GaAs(100) negative electron affinity photocathodes
APPLIED PHYSICS LETTERS
2008; 92 (24)
View details for DOI 10.1063/1.2945276
View details for Web of Science ID 000256934900007
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Analytical methods for discriminating stardust in aerogel capture media
56th Annual Conference on Applications of X-Ray Analysis
J C P D S-INT CENTRE DIFFRACTION DATA. 2008: 81–86
View details for DOI 10.1154/1.2912328
View details for Web of Science ID 000256745700003
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Robust CsBr/Cu photocathodes for the linac coherent light source
PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS
2008; 11 (6)
View details for DOI 10.1103/PhysRevSTAB.11.060702
View details for Web of Science ID 000257760300004
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Ge-interface engineering with ozone oxidation for low interface-state density
IEEE ELECTRON DEVICE LETTERS
2008; 29 (4): 328-330
View details for DOI 10.1109/LED.2008.918272
View details for Web of Science ID 000254225800015
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HfO2 gate dielectric on (NH4)(2)S passivated (100) GaAs grown by atomic layer deposition
JOURNAL OF APPLIED PHYSICS
2008; 103 (3)
View details for DOI 10.1063/1.2838471
View details for Web of Science ID 000253238100054
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Recovering the elemental composition of comet Wild 2 dust in five Stardust impact tracks and terminal particles in aerogel
METEORITICS & PLANETARY SCIENCE
2008; 43 (1-2): 215-231
View details for Web of Science ID 000256450400012
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Addressing The Gate Stack Challenge For High Mobility InxGa1-xAs Channels For NFETs
IEEE International Electron Devices Meeting
IEEE. 2008: 363–366
View details for Web of Science ID 000265829300082
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Ge Interface Passivation Techniques and Their Thermal Stability
3rd International SiGe, Ge and Related Compounds Symposium
ELECTROCHEMICAL SOCIETY INC. 2008: 1025–29
View details for DOI 10.1149/1.2986865
View details for Web of Science ID 000273336700114
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Chemical Bonding, Interfaces, and Defects in Hafnium Oxide/Germanium Oxynitride Gate Stacks on Ge(100)
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
2008; 155 (12): G304-G309
View details for DOI 10.1149/1.2995832
View details for Web of Science ID 000260479700067
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Angular dependence of the photoelectron energy distribution of InP(100) and GaAs(100) negative electron affinity photocathodes
APPLIED PHYSICS LETTERS
2007; 91 (19)
View details for DOI 10.1063/1.2805775
View details for Web of Science ID 000250810300036
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Influence of Taoism on the invention of the purple pigment used on the Qin terracotta warriors
JOURNAL OF ARCHAEOLOGICAL SCIENCE
2007; 34 (11): 1878-1883
View details for DOI 10.1016/j.jas.2007.01.005
View details for Web of Science ID 000250260200013
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CsBr/GaN heterojunction photoelectron source
51st International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication
A V S AMER INST PHYSICS. 2007: 2266–70
View details for DOI 10.1116/1.2779042
View details for Web of Science ID 000251611900100
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Rapid partial melt crystallization of silicon for monolithic three-dimensional integration
51st International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication
A V S AMER INST PHYSICS. 2007: 1989–92
View details for DOI 10.1116/1.2798732
View details for Web of Science ID 000251611900041
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The distribution of oxide species in the Cs/O activation layer on InP(100) negative electron affinity photocathodes
JOURNAL OF APPLIED PHYSICS
2007; 102 (7)
View details for DOI 10.1063/1.2786885
View details for Web of Science ID 000250147700154
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Formation of cesium peroxide and cesium superoxide on InP photocathode activated by cesium and oxygen
JOURNAL OF APPLIED PHYSICS
2007; 102 (7)
View details for DOI 10.1063/1.2786882
View details for Web of Science ID 000250147700153
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Band offsets between amorphous LaAlO3 and In0.53Ga0.47As
APPLIED PHYSICS LETTERS
2007; 91 (11)
View details for DOI 10.1063/1.2783264
View details for Web of Science ID 000249474000106
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Surface dipole formation and lowering of the Work function by Cs adsorption on InP(100) surface
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
2007; 25 (5): 1351-1356
View details for DOI 10.1116/1.2753845
View details for Web of Science ID 000249664400004
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High current density GaN/CsBr heterojunction photocathode with improved photoyield
APPLIED PHYSICS LETTERS
2007; 90 (23)
View details for DOI 10.1063/1.2746959
View details for Web of Science ID 000247145500015
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Lamellar crystallization of silicon for 3-dimensional integration
32nd International Conference on Micro- and Nano-Engineering
ELSEVIER SCIENCE BV. 2007: 1186–89
View details for DOI 10.1016/j.mee.2007.01.249
View details for Web of Science ID 000247182500116
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Dynamics modelling of biolistic gene guns
PHYSICS IN MEDICINE AND BIOLOGY
2007; 52 (5): 1485-1493
Abstract
The gene transfer process using biolistic gene guns is a highly dynamic process. To achieve good performance, the process needs to be well understood and controlled. Unfortunately, no dynamic model is available in the open literature for analysing and controlling the process. This paper proposes such a model. Relationships of the penetration depth with the helium pressure, the penetration depth with the acceleration distance, and the penetration depth with the micro-carrier radius are presented. Simulations have also been conducted. The results agree well with experimental results in the open literature. The contribution of this paper includes a dynamic model for improving and manipulating performance of the biolistic gene gun.
View details for DOI 10.1088/0031-9155/52/5/017
View details for Web of Science ID 000244714200017
View details for PubMedID 17301466
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A high resolution full field transmission X-ray microscope at SSRL
9th International Conference on Synchrotron Radiation Instrumentation (SRI 2006)
AMER INST PHYSICS. 2007: 1333–1336
View details for Web of Science ID 000244647900318
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Micro scanning XRF, XANES and XRD studies of the decorated surface of Roman Terra Sigillata ceramics
INT UNION CRYSTALLOGRAPHY. 2007: S107
View details for DOI 10.1107/S0108767307097681
View details for Web of Science ID 000478082400229
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First X-ray fluorescence MicroCT results from micrometeorites at SSRL
9th International Conference on Synchrotron Radiation Instrumentation (SRI 2006)
AMER INST PHYSICS. 2007: 1337–1340
View details for Web of Science ID 000244647900319
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Interface-engineered Ge (100) and (111), N- and P-FETs with high mobility
IEEE International Electron Devices Meeting
IEEE. 2007: 723–726
View details for Web of Science ID 000259347800165
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Elemental compositions of comet 81P/Wild 2 samples collected by Stardust
SCIENCE
2006; 314 (5806): 1731-1735
Abstract
We measured the elemental compositions of material from 23 particles in aerogel and from residue in seven craters in aluminum foil that was collected during passage of the Stardust spacecraft through the coma of comet 81P/Wild 2. These particles are chemically heterogeneous at the largest size scale analyzed ( approximately 180 ng). The mean elemental composition of this Wild 2 material is consistent with the CI meteorite composition, which is thought to represent the bulk composition of the solar system, for the elements Mg, Si, Mn, Fe, and Ni to 35%, and for Ca and Ti to 60%. The elements Cu, Zn, and Ga appear enriched in this Wild 2 material, which suggests that the CI meteorites may not represent the solar system composition for these moderately volatile minor elements.
View details for DOI 10.1126/science.1136141
View details for Web of Science ID 000242833600046
View details for PubMedID 17170294
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Comet 81P/Wild 2 under a microscope.
Science
2006; 314 (5806): 1711-1716
Abstract
The Stardust spacecraft collected thousands of particles from comet 81P/Wild 2 and returned them to Earth for laboratory study. The preliminary examination of these samples shows that the nonvolatile portion of the comet is an unequilibrated assortment of materials that have both presolar and solar system origin. The comet contains an abundance of silicate grains that are much larger than predictions of interstellar grain models, and many of these are high-temperature minerals that appear to have formed in the inner regions of the solar nebula. Their presence in a comet proves that the formation of the solar system included mixing on the grandest scales.
View details for PubMedID 17170289
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Research article - Comet 81P/Wild 2 under a microscope
SCIENCE
2006; 314 (5806): 1711-1716
Abstract
The Stardust spacecraft collected thousands of particles from comet 81P/Wild 2 and returned them to Earth for laboratory study. The preliminary examination of these samples shows that the nonvolatile portion of the comet is an unequilibrated assortment of materials that have both presolar and solar system origin. The comet contains an abundance of silicate grains that are much larger than predictions of interstellar grain models, and many of these are high-temperature minerals that appear to have formed in the inner regions of the solar nebula. Their presence in a comet proves that the formation of the solar system included mixing on the grandest scales.
View details for DOI 10.1126/science.1135840
View details for Web of Science ID 000242833600041
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Roles of oxygen and water vapor in the oxidation of halogen terminated Ge(111) surfaces
APPLIED PHYSICS LETTERS
2006; 89 (23)
View details for DOI 10.1063/1.2403908
View details for Web of Science ID 000242709200049
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Photoelectron emission studies in CsBr at 257 nm
50th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication
A V S AMER INST PHYSICS. 2006: 2886–91
View details for DOI 10.1116/1.2363410
View details for Web of Science ID 000243324400071
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Chemical states and electrical properties of a high-k metal oxide/silicon interface with oxygen-gettering titanium-metal-overlayer
APPLIED PHYSICS LETTERS
2006; 89 (14)
View details for DOI 10.1063/1.2358834
View details for Web of Science ID 000241056900088
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CsBr photocathode at 257 nm: A rugged high current density electron source
APPLIED PHYSICS LETTERS
2006; 89 (11)
View details for DOI 10.1063/1.2354029
View details for Web of Science ID 000240545400014
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Surface termination and roughness of Ge(100) cleaned by HF and HCl solutions
APPLIED PHYSICS LETTERS
2006; 88 (2)
View details for DOI 10.1063/1.2162699
View details for Web of Science ID 000234606900014
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XRF microCT study of space objects at SSRL
5th Conference on Developments in X-Ray Tomography
SPIE-INT SOC OPTICAL ENGINEERING. 2006
View details for DOI 10.1117/12.681440
View details for Web of Science ID 000241974100069
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Dynamics modeling and analysis of gene guns for gene therapy
IEEE International Conference on Robotics and Automation (ICRA)
IEEE. 2006: 1774–1779
View details for Web of Science ID 000240886903068
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Photoemission studies of passivation of germanium nanowires
APPLIED PHYSICS LETTERS
2005; 87 (26)
View details for DOI 10.1063/1.2158027
View details for Web of Science ID 000234338700081
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Narrow cone emission from negative electron affinity photocathodes
49th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication
A V S AMER INST PHYSICS. 2005: 2758–62
View details for DOI 10.1116/1.2101726
View details for Web of Science ID 000234613200092
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Nitrogen doping and thermal stability in HfSiOxNy studied by photoemission and x-ray absorption spectroscopy
APPLIED PHYSICS LETTERS
2005; 87 (18)
View details for DOI 10.1063/1.2126112
View details for Web of Science ID 000232886400059
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Mercury transformations in chemical agent simulant as characterized by X-ray absorption fine spectroscopy
TALANTA
2005; 67 (4): 730-735
Abstract
Chemical analyses of U.S. stockpiled mustard chemical warfare agent show some agent destined for destruction contains mercury [L. Ember, Chem. Eng. News 82 (2004) 8]. Because of its toxicity, mercury must be removed from agent prior to incineration or be scrubbed from incineration exhaust to prevent release into the atmosphere. Understanding mercury/agent interactions is critical if either atmospheric or aqueous treatment processes are used. We investigate and compare the state of mercury in water to that in thiodiglycol, a mustard simulant, as co-contaminants are introduced. The effects of sodium hypochlorite and sodium hydroxide, common neutralization chemicals, on mercury in water and simulant with and without co-contaminants present are examined using X-ray absorption fine spectroscopy (XAFS).
View details for DOI 10.1016/j.talanta.2005.03.030
View details for Web of Science ID 000231992900010
View details for PubMedID 18970232
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Chemical states and electronic structure of a HfO2/Ge(001) interface
APPLIED PHYSICS LETTERS
2005; 87 (4)
View details for DOI 10.1063/1.2006211
View details for Web of Science ID 000230725900045
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Optimized cleaning method for producing device quality InP(100) surfaces
JOURNAL OF APPLIED PHYSICS
2005; 97 (12)
View details for DOI 10.1063/1.1935745
View details for Web of Science ID 000230278100113
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Zirconia-germanium interface photoemission spectroscopy using synchrotron radiation
JOURNAL OF APPLIED PHYSICS
2005; 97 (11)
View details for DOI 10.1063/1.1922090
View details for Web of Science ID 000229804700034
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William Edward Spicer - Obituary
PHYSICS TODAY
2005; 58 (5): 86-87
View details for Web of Science ID 000228956600031
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Effects of post-deposition annealing on the material characteristics of ultrathin HfO2 films on silicon
JOURNAL OF APPLIED PHYSICS
2005; 97 (2)
View details for DOI 10.1063/1.1831543
View details for Web of Science ID 000226700500051
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Near-edge absorption spectroscopy of interplanetary dust particles
PHYSICA SCRIPTA
2005; T115: 261-263
View details for Web of Science ID 000204272100070
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Integrating molecular dynamics for DNA bio-chip fabrication and hybridization automation
IEEE/ASME International Conference on Advanced Intelligent Mechatronics
IEEE. 2005: 25–30
View details for Web of Science ID 000232003500005
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X-ray absorption fine-structure determination of interfacial polarization in SrTiO3 thin films grown on Si(001)
PHYSICA SCRIPTA
2005; T115: 620-622
View details for Web of Science ID 000204272100187
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Nucleation and growth of copper nanoparticles on silicon surfaces
PHYSICA SCRIPTA
2005; T115: 714-716
View details for Web of Science ID 000204272100215
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Room temperature photo-oxidation of NH4F-prepared H-Si(111)(1x1) and H-x-Si(100)
JOURNAL OF APPLIED PHYSICS
2004; 96 (11): 6851-6858
View details for DOI 10.1063/1.1785835
View details for Web of Science ID 000225300800141
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Cs halide photocathode for multi-electron-beam pattern generator
48th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication
A V S AMER INST PHYSICS. 2004: 3025–31
View details for DOI 10.1116/1.1823433
View details for Web of Science ID 000226439800084
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Elastic anomaly for SrTiO3 thin films grown on Si(001)
PHYSICAL REVIEW B
2004; 70 (20)
View details for DOI 10.1103/PhysRevB.70.201403
View details for Web of Science ID 000225478600019
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Nondestructive dose determination and depth profiling of arsenic ultrashallow junctions with total reflection X-ray fluorescence analysis compared to dynamic secondary ion mass spectrometry
10th Symposium on Total Reflection X-Ray Fluorescence Analysis/39th Discussion Meeting on Chemical Analysis
PERGAMON-ELSEVIER SCIENCE LTD. 2004: 1243–49
View details for DOI 10.1016/j.sab.2004.04.014
View details for Web of Science ID 000224622600026
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Electron scattering study within the depletion region of the GaN(0001) and the GaAs(100) surface
APPLIED PHYSICS LETTERS
2004; 85 (9): 1541-1543
View details for DOI 10.1063/1.1785865
View details for Web of Science ID 000223555000031
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Aerogel keystones: Extraction of complete hypervelocity impact events from aerogel collectors
METEORITICS & PLANETARY SCIENCE
2004; 39 (8): 1375-1386
View details for Web of Science ID 000223571200009
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Displacive phase transition in SrTiO3 thin films grown on Si(001)
50th International Symposium of the American-Vacuum-Society
A V S AMER INST PHYSICS. 2004: 1356–60
View details for DOI 10.1116/1.1765657
View details for Web of Science ID 000223322000045
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Quantitative evaluation of iron at the silicon surface after wet cleaning treatments
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
2004; 151 (5): G289-G296
View details for DOI 10.1149/1.1668993
View details for Web of Science ID 000221436900047
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Surface trace element characterization of synthetic single crystal Al2O3 at the SSRL
8th International Conference on Synchrotron Radiation Instrumentation (SRI 2003)
AMER INST PHYSICS. 2004: 1182–1185
View details for Web of Science ID 000222089000291
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The nucleation and growth of Cu nanoclusters on silicon surfaces
8th International Conference on Synchrotron Radiation Instrumentation (SRI 2003)
AMER INST PHYSICS. 2004: 1086–1089
View details for Web of Science ID 000222089000267
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Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL, beamline 3-3: Comparison of droplets with spin coated wafers
9th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods
PERGAMON-ELSEVIER SCIENCE LTD. 2003: 2105–12
View details for DOI 10.1016/S0584-8547(03)00218-0
View details for Web of Science ID 000187360200010
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Effect of oxygen adsorption on the efficiency of magnesium photocathodes
47th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication
A V S AMER INST PHYSICS. 2003: 2830–33
View details for DOI 10.1116/1.1624265
View details for Web of Science ID 000188193600100
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Optimization and characterization of III-V surface cleaning
15th International Vacuum Microelectronics Conference (IVMC)
A V S AMER INST PHYSICS. 2003: 1953–58
View details for DOI 10.1116/1.1593644
View details for Web of Science ID 000185080000140
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Oxygen species in Cs/O activated gallium nitride (GaN) negative electron affinity photocathodes
15th International Vacuum Microelectronics Conference (IVMC)
A V S AMER INST PHYSICS. 2003: 1863–69
View details for DOI 10.1116/1.1589512
View details for Web of Science ID 000185080000124
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Interfacial properties of ZrO2 on silicon
JOURNAL OF APPLIED PHYSICS
2003; 93 (10): 5945-5952
View details for DOI 10.1063/1.1563844
View details for Web of Science ID 000182789700015
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Photoelectron spectroscopy to probe the mechanism of electron transfer through oligo(phenylene vinylene) bridges
JOURNAL OF PHYSICAL CHEMISTRY B
2003; 107 (5): 1170-1173
View details for DOI 10.1021/jp026734a
View details for Web of Science ID 000180755800010
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Preparation of clean InP(100) surfaces studied by synchrotron radiation photoemission
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
2003; 21 (1): 219-225
View details for DOI 10.1116/1.1532738
View details for Web of Science ID 000182598200032
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Color filtering metallization for optoelectronic 100nm CMOS circuits
IEEE International Electron Devices Meeting
IEEE. 2003: 389–392
View details for Web of Science ID 000189158800089
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Fabrication and characterization of ultra-small polycrystalline silicon islands for advanced multi-level silicon-on-insulator applications
7th International Conference on Polycrystalline Semiconductors
TRANS TECH PUBLICATIONS LTD. 2003: 441–446
View details for Web of Science ID 000185572600066
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Quantitative evaluation of iron at the silicon surface after wet cleaning treatments
Symposium on Analytical Techniques for Semiconductor Materials and Process Characterization IV (ALTECH 2003) held at the 203rd Meeting of the Electrochemical-Society
ELECTROCHEMICAL SOCIETY INC. 2003: 493–504
View details for Web of Science ID 000184567900048
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Detection and characterization of trace element contamination on silicon wafers
19th International Conference on X-Ray and Inner-Shell Processes
AMER INST PHYSICS. 2003: 472–480
View details for Web of Science ID 000182316700053
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Preparation of clean GaAs(100) studied by synchrotron radiation photoemission
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
2003; 21 (1): 212-218
View details for DOI 10.1116/1.1532737
View details for Web of Science ID 000182598200031
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Looking at trace impurities on silicon wafers with synchrotron radiation
ANALYTICAL CHEMISTRY
2002; 74 (23): 608A-616A
View details for Web of Science ID 000179617700002
View details for PubMedID 12498179
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Role of oxygen in semiconductor negative electron affinity photocathodes
46th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication (EIPBN)
A V S AMER INST PHYSICS. 2002: 2721–25
View details for DOI 10.1116/1.1521742
View details for Web of Science ID 000180307300093
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Structural studies of ultrathin zirconia dielectrics
PHILOSOPHICAL MAGAZINE LETTERS
2002; 82 (9): 519-528
View details for DOI 10.1080/09500830210157108
View details for Web of Science ID 000177786400007
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Simple method for cleaning gallium nitride (0001)
49th International Symposium of the American-Vacuum-Society
A V S AMER INST PHYSICS. 2002: 1784–86
View details for DOI 10.116/1.11503782
View details for Web of Science ID 000178146700041
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Quadrupole effects in core and valence photoelectron emission from crystalline germanium measured via a spatially modulated x-ray interference field
PHYSICAL REVIEW B
2002; 65 (16)
View details for DOI 10.1103/PhysRevB.65.165219
View details for Web of Science ID 000175325000063
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Formation of (functionalized) monolayers and simultaneous surface patterning by scribing silicon in the presence of alkyl halides
CHEMISTRY OF MATERIALS
2002; 14 (1): 27-?
View details for DOI 10.1021/cm0108536
View details for Web of Science ID 000173459300010
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A study of fabrication and characterization of ultra-small polycrystalline silicon islands for advanced display and microsensor applications
Symposium on Amorphous and Heterogeneous Silicon-Based Films held at the 2002 MRS Spring Meeting
MATERIALS RESEARCH SOCIETY. 2002: 707–712
View details for Web of Science ID 000179162400102
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X-ray Absorption spectroscopy on copper trace impurities on silicon wafers
Symposium on Silicon Materials held at the 2002 MRS Spring Meeting
MATERIALS RESEARCH SOCIETY. 2002: 23–28
View details for Web of Science ID 000179334200004
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Photoemission from the Sr/Si(001) interface
JOURNAL OF APPLIED PHYSICS
2001; 90 (12): 6070-6072
View details for Web of Science ID 000172489800039
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Laboratory and synchrotron radiation total-reflection X-ray fluorescence: new perspectives in detection limits and data analysis
8th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods
PERGAMON-ELSEVIER SCIENCE LTD. 2001: 2049–56
View details for Web of Science ID 000172711200007
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Synchrotron radiation induced total reflection X-ray fluorescence of low Z elements on Si wafer surfaces at SSRL - comparison of excitation geometries and conditions
8th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods
PERGAMON-ELSEVIER SCIENCE LTD. 2001: 2085–94
View details for Web of Science ID 000172711200011
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X-ray standing-wave investigations of valence electronic structure
PHYSICAL REVIEW B
2001; 64 (12)
View details for Web of Science ID 000171244400038
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In situ x-ray photoelectron spectroscopy for thin film synthesis monitoring
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
2001; 19 (5): 2127-2133
View details for Web of Science ID 000171376700016
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Recent advances and perspectives in synchrotron radiation TXRF
7th International Conference on Synchrotron Radiation Instrumentation (SRI 2000)
ELSEVIER SCIENCE BV. 2001: 1198–1201
View details for Web of Science ID 000171012800088
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Partial density of occupied valence states by x-ray standing waves and high-resolution photoelectron spectroscopy
PHYSICAL REVIEW B
2001; 63 (4)
View details for Web of Science ID 000166750600012
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Effect of silicon surface termination on copper deposition in deionized water
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
2001; 148 (1): C16-C20
View details for Web of Science ID 000166129600028
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Investigation of trace metals analyses of dry residue on silicon wafer surfaces by TXRF and ICP-MS
5th International Symposium on Ultra Clean Processing of Silicon Surfaces (UCPSS 2000)
SCITEC PUBLICATIONS LTD. 2001: 75–79
View details for Web of Science ID 000168449500019
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Characterization of profiling techniques for ultralow energy arsenic implants
ELECTROCHEMICAL AND SOLID STATE LETTERS
2001; 4 (1): G1-G3
View details for Web of Science ID 000165499200010
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Prospect for high brightness III-nitride electron emitter
44th International Conference on Electron Ion and Photon Beam Technology and Nanofabrication (EIPBN)
A V S AMER INST PHYSICS. 2000: 3042–46
View details for Web of Science ID 000165935800081
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Role of delocalized nitrogen in determining the local atomic arrangement and mechanical properties of amorphous carbon nitride thin films
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
2000; 18 (6): 2964-2971
View details for Web of Science ID 000165388500047
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Aluminum impurities in silicon: Investigation of x-ray Raman scattering in total reflection x-ray fluorescence spectroscopy
JOURNAL OF APPLIED PHYSICS
2000; 88 (8): 4642-4647
View details for Web of Science ID 000089552800028
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Application of synchrotron radiation to TXRF analysis of metal contamination on silicon wafer surfaces
11th International Conference on Thin Films (ICTF-11)
ELSEVIER SCIENCE SA. 2000: 222–26
View details for Web of Science ID 000090045900049
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Geometrical structure of the 1/2-ML (2X1) and 1/3-ML (2X3) Ba/Si(001) interfaces
PHYSICAL REVIEW B
2000; 61 (19): 12988-12991
View details for Web of Science ID 000087159100080
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Characterization of arsenic dose loss at the Si/SiO2 interface
JOURNAL OF APPLIED PHYSICS
2000; 87 (5): 2255-2260
View details for Web of Science ID 000085529500030
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Direct measurement of valence-charge asymmetry by x-ray standing waves
PHYSICAL REVIEW LETTERS
2000; 84 (4): 773-776
Abstract
By monitoring valence-photoelectron emission under condition of strong x-ray Bragg reflection, we have determined that a majority of GaAs valence charge resides on the anion sites of this heteropolar crystal, in quantitative agreement with the GaAs bond polarity as calculated from the Hartree-Fock term values. In contrast, the valence-charge distribution in Ge is found to be symmetric. In both cases, the valence emission is found to be closely coupled to the atomic cores.
View details for Web of Science ID 000084891700049
View details for PubMedID 11017369
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Investigation of Na impurities on Si wafer surfaces using TXRF
11th US National Conference on Synchrotron Radiation Instrumentation
AMER INST PHYSICS. 2000: 161–166
View details for Web of Science ID 000088762600030
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The effect of dilute cleaning and rinsing chemistries on transition metal removal and si surface microroughness
6th International Symposium on Cleaning Technology in Semiconductor Device Manufacturing
ELECTROCHEMICAL SOCIETY INC. 2000: 17–24
View details for Web of Science ID 000088232900002
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Ultraviolet light stimulated halogen chemistry on cleaning silicon surfaces
6th International Symposium on Cleaning Technology in Semiconductor Device Manufacturing
ELECTROCHEMICAL SOCIETY INC. 2000: 129–36
View details for Web of Science ID 000088232900016
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Atomic-scale mechanistic study of iodine/alcohol passivated Si(100)
6th International Symposium on Cleaning Technology in Semiconductor Device Manufacturing
ELECTROCHEMICAL SOCIETY INC. 2000: 545–52
View details for Web of Science ID 000088232900070
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Low Z total reflection X-ray fluorescence analysis - challenges and answers
7th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF 98)
PERGAMON-ELSEVIER SCIENCE LTD. 1999: 1433–41
View details for Web of Science ID 000083433600007
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Synchrotron radiation-excited glancing incidence XRF for depth profile and thin-film analysis of light elements
European Conference on Energy Dispersive X-Ray Spectrometry 1998 (EDXRS-98)
JOHN WILEY & SONS LTD. 1999: 292–96
View details for Web of Science ID 000081693400015
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Can studies of the II-VIs profit from the use of synchrotron radiation and the DOE financial support thereof?
17th US Workshop on the Physics and Chemistry of II-VI Materials
SPRINGER. 1999: 804–9
View details for Web of Science ID 000080949300037
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Interpretation of x-ray photoelectron spectra of elastic amorphous carbon nitride thin films
APPLIED PHYSICS LETTERS
1999; 74 (22): 3290-3292
View details for Web of Science ID 000080474300016
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Bonding modifications in carbon nitride films induced by thermal annealing: An x-ray absorption near edge study
APPLIED PHYSICS LETTERS
1999; 74 (18): 2620-2622
View details for Web of Science ID 000079972400018
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Direct measurement of valence charge asymmetry in GaAs using X-ray standing waves
10th International Conference on XAFS (XAFS X)
WILEY-BLACKWELL. 1999: 341–343
View details for Web of Science ID 000081221700079
View details for PubMedID 15263301
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Alkyl-terminated Si(111) surfaces: A high-resolution, core level photoelectron spectroscopy study
JOURNAL OF APPLIED PHYSICS
1999; 85 (1): 213-221
View details for Web of Science ID 000077489200030
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Reaction of water with vacuum-cleaved CaO(100) surfaces: an X-ray photoemission spectroscopy study
SURFACE SCIENCE
1998; 416 (1-2): 326-340
View details for Web of Science ID 000076828200032
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Characterization of arsenic dose loss at the Si/SiO2 interface using high resolution X-ray Photoelectron Spectrometry
International Electron Devices Meeting (IEDM)
IEEE. 1998: 721–724
View details for Web of Science ID 000078581800166
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Update on synchrotron radiation TXRF: New results
Symposium on Applications of Synchrotron Radiation Techniques to Materials Science IV
MATERIALS RESEARCH SOCIETY. 1998: 245–249
View details for Web of Science ID 000075892800038
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Reactivity of the H-Si (111) surface
1st International Conference on Synchrotron Radiation in Materials Science (ICSRMS 96)
ELSEVIER SCIENCE BV. 1997: 94–101
View details for Web of Science ID 000071422800018
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Early work with synchrotron radiation at Stanford
JOURNAL OF SYNCHROTRON RADIATION
1997; 4: 380-395
Abstract
The use of synchrotron radiation in the soft and hard X-ray spectral region received major impetus with the start of parasitic operation of the Stanford Synchrotron Radiation Project (SSRP) in 1974. This was the first time that synchrotron radiation from a multi-GeV electron storage ring was made available in a user facility for studying the structure of matter. Here we review the early work at SSRP as well as the activities that preceded it, highlighting the scientific accomplishments (soft X-ray photoemission, EXAFS, protein crystallography), beamline instrumentation developments and source improvements. The early work using bending-magnet radiation led to the funding of several dedicated facilities in the US and elsewhere in the world - the so-called second-generation light sources. Early work with wiggler and undulator insertion devices led to funding of third-generation sources better optimized for insertion device sources, particularly undulators.
View details for Web of Science ID A1997YH05900007
View details for PubMedID 16699252
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Determination of the bonding of alkyl monolayers to the Si(111) surface using chemical-shift, scanned-energy photoelectron diffraction
APPLIED PHYSICS LETTERS
1997; 71 (8): 1056-1058
View details for Web of Science ID A1997XR75400022
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Total reflection X-ray fluorescence analysis of light elements with synchrotron radiation and special X-ray tubes
6th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF 96)
PERGAMON-ELSEVIER SCIENCE LTD. 1997: 861–72
View details for Web of Science ID A1997XH53500010
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New surface phases for potassium adatoms on cleaved Si(111)
SURFACE SCIENCE
1997; 380 (2-3): 365-376
View details for Web of Science ID A1997XF84300026
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Microscopic chemical state identification of a silicon-carbide fiber by soft x-ray photoabsorption spectroscopy
APPLIED PHYSICS LETTERS
1997; 70 (18): 2389-2391
View details for Web of Science ID A1997WZ07600019
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Comparative magnetic-field imaging, electric-field imaging, and scanning Auger microscopy study of metal-matrix composites
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
1997; 84 (1-3): 99-107
View details for Web of Science ID A1997XH46800009
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State-of-the-art evaluation of ultra-clean ULSI processes
Symposium on Science and Technology of Semiconductor Surface Preparation, at the 1997 MRS Spring Meeting
MATERIALS RESEARCH SOCIETY. 1997: 403–407
View details for Web of Science ID A1997BJ73X00054
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Synthesis and characterization of amorphous carbon nitride films
23rd International Conference on Metallurgical Coatings and Thin Films
ELSEVIER SCIENCE SA. 1996: 94–98
View details for Web of Science ID A1996WB81900020
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Near-edge x-ray absorption of carbon materials for determining bond hybridization In mixed sp2/sp3 bonded materials
APPLIED PHYSICS LETTERS
1996; 69 (4): 568-570
View details for Web of Science ID A1996WB36400044
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Interaction of hydrogen ions with oxidized GaAs(100) and AlAs(100) surfaces
23rd Annual Conference on the Physics and Chemistry of Semiconductor Interfaces
A V S AMER INST PHYSICS. 1996: 2914–17
View details for Web of Science ID A1996VD93100081
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Surface-sensitive x-ray standing-wave study of Si(111)root 3x root 3-Ag
PHYSICAL REVIEW B
1996; 53 (23): 15425-15428
View details for Web of Science ID A1996UT77000013
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Evidence for
Physical review. B, Condensed matter
1996; 53 (23): 15571-15576
View details for PubMedID 9983389
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Evidence for [1s2p]3p shake-up channels in compounds and oxides of third-period elements
PHYSICAL REVIEW B
1996; 53 (23): 15571-15576
View details for Web of Science ID A1996UT77000041
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Photoemission study of Na and Cs adsorption on MgO(100)1 x 1
15th European Conference on Surface Science
ELSEVIER SCIENCE BV. 1996: 451–456
View details for Web of Science ID A1996UV25400087
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Photoelectron emission from the cesiated diamond (110) surface
Symposium on Diamond for Electronic Applications
MATERIALS RESEARCH SOC. 1996: 449–454
View details for Web of Science ID A1996BF31Q00064
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Silicon wafer trace impurity analysis using synchrotron radiation
International Workshop on Semiconductor Characterization - Present Status and Future Needs
AIP PRESS. 1996: 273–277
View details for Web of Science ID A1996BE98R00033
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THE EFFECT OF RAPID THERMAL N2O NITRIDATION ON THE OXIDE/SI(100) INTERFACE STRUCTURE
APPLIED PHYSICS LETTERS
1995; 67 (19): 2836-2838
View details for Web of Science ID A1995TC98500029
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HIGH-SENSITIVITY TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROSCOPY OF SILICON-WAFERS USING SYNCHROTRON-RADIATION
5th Workshop on Total Reflection X-Ray Fluorescence Spectroscopy and Related Spectroscopical Methods
JAPAN SOC ANALYTICAL CHEM. 1995: 515–18
View details for Web of Science ID A1995RD29200034
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CONSTRUCTION OF A NEW IMAGING BANDPASS ANALYZER FOR A MAGNETIC PROJECTION PHOTOELECTRON MICROSCOPE
REVIEW OF SCIENTIFIC INSTRUMENTS
1995; 66 (5): 3159-3167
View details for Web of Science ID A1995QZ06900010
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TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROSCOPY USING SYNCHROTRON-RADIATION FOR WAFER SURFACE TRACE IMPURITY ANALYSIS
5th International Conference on Synchrotron Radiation Instrumentation
AMER INST PHYSICS. 1995: 1293–97
View details for Web of Science ID A1995QK98100006
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Negative electron affinity on GaAs(110) with Cs and NF3: A surface science study
Photodetectors and Power Meters II Conference
SPIE-INT SOC OPTICAL ENGINEERING. 1995: 132–141
View details for Web of Science ID A1995BE29H00016
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BEHAVIOR OF TELLURIUM ON SILICON(100)
SURFACE SCIENCE
1994; 321 (3): L183-L188
View details for Web of Science ID A1994QA55200004
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SYNCHROTRON-RADIATION TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROSCOPY FOR WAFER SURFACE TRACE IMPURITY ANALYSIS
AMER CHEMICAL SOC. 1994: 60-IEC
View details for Web of Science ID A1994PA26102137
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SHORT-WAVELENGTH FELS USING THE SLAC LINAC
8th National Conference on Synchrotron Radiation Instrumentation
ELSEVIER SCIENCE BV. 1994: 199–205
View details for Web of Science ID A1994PD42900035
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WIDE BAND-PASS APPROACHES TO TOTAL-REFLECTION X-RAY-FLUORESCENCE USING SYNCHROTRON-RADIATION
8th National Conference on Synchrotron Radiation Instrumentation
ELSEVIER SCIENCE BV. 1994: 417–21
View details for Web of Science ID A1994PD42900077
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PHOTOEMISSION-STUDY OF AU, GE, AND O2 DEPOSITION ON NH4F ETCHED SI(111)
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
1994; 12 (4): 1869-1875
View details for Web of Science ID A1994NZ03200015
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GEOMETRICAL STRUCTURE OF THE BI/GAP (110) INTERFACE - AN X-RAY STANDING-WAVE TRIANGULATION STUDY OF A NONIDEAL SYSTEM
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
1994; 12 (4): 2473-2477
View details for Web of Science ID A1994NZ03200125
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CAF2 OVERLAYERS TO PRESERVE THE IDEAL TERMINATION OF SB/GAAS(110)
40th National Symposium of the American-Vacuum-Society
A V S AMER INST PHYSICS. 1994: 1158–69
View details for Web of Science ID A1994NZ03000045
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STRUCTURAL STUDY OF MONOLAYERS OF SB ON GE(111) WITH DIFFERENT SURFACE RECONSTRUCTIONS
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
1994; 12 (4): 1843-1847
View details for Web of Science ID A1994NZ03200010
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TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS OF LIGHT-ELEMENTS USING SYNCHROTRON-RADIATION
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
1994; 345 (2): 399-403
View details for Web of Science ID A1994NQ03200026
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THE SLAC SOFT-X-RAY HIGH-POWER FEL
15th International Free Electron Laser Conference
ELSEVIER SCIENCE BV. 1994: 326–30
View details for Web of Science ID A1994NA78800072
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BORON RECONSTRUCTED SI(111) SURFACES PRODUCED BY B2O3 DECOMPOSITION
Workshop Program on Interface Formation and Dynamics in Layered Structures, at the Scanning Microscopy 1994 Meeting
SCANNING MICROSCOPY INT. 1994: 835–40
View details for Web of Science ID A1994RT32500010
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A PERFORMANCE AND APPLICATIONS STUDY OF THE PHOTOELECTRON SPECTROMICROSCOPE
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
1993; 66 (1-2): 189-207
View details for Web of Science ID A1993MT80800021
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STRUCTURAL INFORMATION ON Y-IONS IN C82 FROM EXAFS EXPERIMENTS
CHEMICAL PHYSICS LETTERS
1993; 213 (1-2): 196-201
View details for Web of Science ID A1993LZ69200032
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IN/SI(111)-ROOT-3X-ROOT-3 INTERFACE - AN UNRELAXED T(4) GEOMETRY
PHYSICAL REVIEW LETTERS
1993; 71 (8): 1204-1207
View details for Web of Science ID A1993LU28000022
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PARTICLE-INDUCED AND PHOTOINDUCED CONDUCTIVITY IN TYPE-IIA DIAMONDS
JOURNAL OF APPLIED PHYSICS
1993; 74 (2): 1086-1095
View details for Web of Science ID A1993LM78200051
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ADATOM LOCATION ON THE SI(111) 7X7 AND SI(111) ROOT-3X-ROOT-3-IN SURFACES BY THE X-RAY STANDING-WAVE AND PHOTOEMISSION TECHNIQUES
39TH NATIONAL SYMP OF THE AMERICAN VACUUM SOC
A V S AMER INST PHYSICS. 1993: 2359–63
View details for Web of Science ID A1993LP00800130
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DETERMINATION OF THE GEOMETRICAL CONFIGURATION OF BI ON GAAS (110) BY X-RAY STANDING-WAVE TRIANGULATION
39TH NATIONAL SYMP OF THE AMERICAN VACUUM SOC
A V S AMER INST PHYSICS. 1993: 2354–58
View details for Web of Science ID A1993LP00800129
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PHOTOEMISSION-STUDY OF DIAMOND (100) SURFACE
39TH NATIONAL SYMP OF THE AMERICAN VACUUM SOC
A V S AMER INST PHYSICS. 1993: 1048–51
View details for Web of Science ID A1993LP00700058
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FERMI-LEVEL VARIATION ON GAAS(110) SURFACE WITH SB OVERLAYER STUDIED WITH A PHOTOELECTRON MICROSCOPE
20TH ANNUAL CONF ON THE PHYSICS AND CHEMISTRY OF SEMICONDUCTOR INTERFACES
A V S AMER INST PHYSICS. 1993: 1575–78
View details for Web of Science ID A1993LT45000063
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A 2 TO 4NM HIGH-POWER FEL ON THE SLAC LINAC
14TH INTERNATIONAL CONF ON FREE ELECTRON LASER ( FEL 92 )
ELSEVIER SCIENCE BV. 1993: 223–27
View details for Web of Science ID A1993LK37800045
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ATOMIC AND ELECTRONIC-STRUCTURE OF B/SI(100)
20TH ANNUAL CONF ON THE PHYSICS AND CHEMISTRY OF SEMICONDUCTOR INTERFACES
A V S AMER INST PHYSICS. 1993: 1455–58
View details for Web of Science ID A1993LT45000040
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X-RAY STANDING-WAVE STUDY OF THE SB/GAAS(110) INTERFACE STRUCTURE
39TH NATIONAL SYMP OF THE AMERICAN VACUUM SOC
A V S AMER INST PHYSICS. 1993: 2351–53
View details for Web of Science ID A1993LP00800128
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CHARACTERIZATION OF THE B/SI SURFACE ELECTRONIC-STRUCTURES
39TH NATIONAL SYMP OF THE AMERICAN VACUUM SOC
A V S AMER INST PHYSICS. 1993: 1817–22
View details for Web of Science ID A1993LP00800035
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STRUCTURE OF SB MONOLAYERS ON GE(111)2X1 - A COMBINED STUDY USING CORE-LEVEL PHOTOEMISSION, X-RAY STANDING WAVES, AND SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE
20TH ANNUAL CONF ON THE PHYSICS AND CHEMISTRY OF SEMICONDUCTOR INTERFACES
A V S AMER INST PHYSICS. 1993: 1449–54
View details for Web of Science ID A1993LT45000039
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IMAGING BAND-PASS ANALYZER USING DOUBLE 90-DEGREES SPHERICAL ANALYZERS
REVIEW OF SCIENTIFIC INSTRUMENTS
1993; 64 (5): 1187-1193
View details for Web of Science ID A1993LB84900013
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SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY OF THE (1 MONOLAYER SB) GAP(110) INTERFACE
PHYSICAL REVIEW B
1993; 47 (11): 6444-6449
View details for Web of Science ID A1993KT88200030
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TEMPERATURE-DEPENDENT MOBILITY IN SINGLE-CRYSTAL AND CHEMICAL VAPOR-DEPOSITED DIAMOND
JOURNAL OF APPLIED PHYSICS
1993; 73 (6): 2888-2894
View details for Web of Science ID A1993KT86900043
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THE EPITAXIAL-GROWTH OF GE ON SI(100) USING TE AS A SURFACTANT
SYMP ON COMMON THEMES AND MECHANISMS OF EPITAXIAL GROWTH, AT THE 1993 SPRING MEETING AT THE MATERIALS-RESEARCH-SOC
MATERIALS RESEARCH SOC. 1993: 243–248
View details for Web of Science ID A1993BZ22X00037
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SYNCHROTRON-RADIATION FOR MEASUREMENT OF CONTAMINANTS ON SILICON SURFACES
SYMP ON APPLICATIONS OF SYNCHROTON RADIATION TECHNIQUES TO MATERIALS SCIENCE, AT THE 1993 SPRING MEETING OF THE MATERIALS RESEARCH SOC
MATERIALS RESEARCH SOC. 1993: 125–130
View details for Web of Science ID A1993BY84N00020
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ELECTRICAL-PROPERTIES OF NATURAL IIA DIAMONDS USING PHOTO EXCITATION AND PARTICLE EXCITATION
1ST SYMP ON SEMICONDUCTORS FOR ROOM-TEMPERATURE RADIATION DETECTOR APPLICATIONS, AT THE 1993 SPRING MEETING OF THE MATERIALS RESEARCH SOC
MATERIALS RESEARCH SOC. 1993: 245–250
View details for Web of Science ID A1993BY84L00029
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A 2-4 NM LINAC COHERENT-LIGHT SOURCE (LCLS) USING THE SLAC LINAC
1993 Particle Accelerator Conference
I E E E. 1993: 1445–1447
View details for Web of Science ID A1993BA40R00478
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LINAC COHERENT-LIGHT SOURCE (LCLS) AT 2-4 NM USING THE SLAC LINAC
Conference on Electron-Beam Sources of High-Brightness Radiation
SPIE - INT SOC OPTICAL ENGINEERING. 1993: 116–125
View details for Web of Science ID A1993BZ78A00012
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X-RAY-BEAM LINES AND BEAM LINE COMPONENTS FOR THE SLAC LINAC COHERENT-LIGHT SOURCE (LCLS)
1993 Particle Accelerator Conference
I E E E. 1993: 1536–1538
View details for Web of Science ID A1993BA40R00508
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MICROSCOPIC STUDY OF THE SURFACTANT-ASSISTED SI, GE EPITAXIAL-GROWTH
APPLIED PHYSICS LETTERS
1992; 61 (19): 2347-2349
View details for Web of Science ID A1992JW88000031
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EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE DETERMINATION OF BOND-LENGTH CONSERVATION AT THE CLEAN INP(110) SURFACE
PHYSICAL REVIEW B
1992; 46 (15): 9869-9872
View details for Web of Science ID A1992JV11200085
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CA 3D UNOCCUPIED STATES IN BI2SR2CACU2O8 INVESTIGATED BY CA L(2,3) X-RAY-ABSORPTION NEAR-EDGE STRUCTURE
PHYSICAL REVIEW B
1992; 46 (13): 8487-8495
View details for Web of Science ID A1992JT04000063
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STRUCTURAL CHARACTERIZATION OF THE (1 MONOLAYER SB)/GAP(110) INTERFACE USING X-RAY STANDING WAVES
PHYSICAL REVIEW B
1992; 46 (11): 6869-6874
View details for Web of Science ID A1992JN82600023
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X-RAY STANDING-WAVE STUDY OF MONOLAYERS OF SB ON GAAS(110)
PHYSICAL REVIEW B
1992; 46 (11): 7276-7279
View details for Web of Science ID A1992JN82600086
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INSITU OPTICAL-ELEMENT CLEANING WITH PHOTON ACTIVATED OXYGEN
7TH NATIONAL CONF ON SYNCHROTRON RADIATION INSTRUMENTATION
ELSEVIER SCIENCE BV. 1992: 240–43
View details for Web of Science ID A1992JF67400039
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ELECTRONIC-STRUCTURE OF SINGLE-CRYSTAL C-60
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS
1992; 197 (3-4): 251-260
View details for Web of Science ID A1992JE33800006
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FERMI-LEVEL INHOMOGENEITIES ON THE GAAS (110) SURFACE IMAGED WITH A PHOTOELECTRON MICROSCOPE
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
1992; 10 (4): 1944-1948
View details for Web of Science ID A1992JJ60000117
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SI(100) AND GE(100) CORE-LEVEL SHIFTS - A REEVALUATION
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
1992; 10 (4): 2013-2017
View details for Web of Science ID A1992JJ60000131
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EXTENDED X-RAY ABSORPTION FINE-STRUCTURE AND X-RAY STANDING WAVE STUDY OF THE CLEAN INP(110) SURFACE RELAXATION
38TH NATIONAL SYMP OF THE AMERICAN VACUUM SOC
A V S AMER INST PHYSICS. 1992: 2041–45
View details for Web of Science ID A1992JE68200107
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CORE-LEVEL SHIFTS OF THE GE(100)-(2X1) SURFACE AND THEIR ORIGINS
PHYSICAL REVIEW B
1992; 45 (23): 13749-13752
View details for Web of Science ID A1992HZ24500078
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ELECTRICAL TRANSPORT-PROPERTIES OF UNDOPED CVD DIAMOND FILMS
SCIENCE
1992; 255 (5046): 830-833
Abstract
Polycrystalline diamond films synthesized by microwave-assisted chemical vapor deposition (MACVD) were examined with transient photoconductivity, and two fundamental electrical transport properties, the carrier mobility and lifetime, were measured. The highest mobility measured is 50 centimeters squared per volt per second at low initial carrier densities (<10(15) per cubic centimeter). Electron-hole scattering causes the carrier mobility to decrease at higher carrier densities. Although not measured directly, the carrier lifetime was inferred to be 40 picoseconds. The average drift length of the carriers is smaller than the average grain size and appears to be limited by defects within the grains. The carrier mobility in the MACVD films is higher than values measured in lower quality dc-plasma films but is much smaller than that of single-crystal natural diamond.
View details for Web of Science ID A1992HD54800031
View details for PubMedID 17756429
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X-RAY STANDING-WAVE DETERMINATION OF THE CLEAN INP(110) SURFACE RECONSTRUCTION
PHYSICAL REVIEW LETTERS
1992; 68 (3): 341-344
View details for Web of Science ID A1992GZ96700023
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THE STANFORD SYNCHROTRON RADIATION LABORATORY - AN UPDATE
4TH INTERNATIONAL CONF ON SYNCHROTRON RADIATION INSTRUMENTATION
AMER INST PHYSICS. 1992: 1609–10
View details for Web of Science ID A1992GZ94300194
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A PHOTOEMISSION-STUDY OF ELECTROCHEMICALLY ETCHED LIGHT-EMITTING SILICON
MATERIALS RESEARCH SOC. 1992: 421–426
View details for Web of Science ID A1992BX17N00059
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THE MULTISPECTRAL SOLAR TELESCOPE ARRAY .2. SOFT-X-RAY EUV REFLECTIVITY OF THE MULTILAYER MIRRORS
CONF ON MULTILAYER AND GRAZING INCIDENCE X-RAY/EUV OPTICS
SPIE - INT SOC OPTICAL ENGINEERING. 1992: 432–445
View details for Web of Science ID A1992BV05K00037
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PHOTOEMISSION-STUDY OF THE SI, GE EPITAXIAL-GROWTH PROCESS USING SURFACTANTS
MATERIALS RESEARCH SOC. 1992: 455–460
View details for Web of Science ID A1992BX17N00065
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DETERMINATION OF THE SB/SI(111) INTERFACIAL STRUCTURE BY BACK-REFLECTION X-RAY STANDING WAVES AND SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE
PHYSICAL REVIEW B
1991; 44 (7): 3475-3478
View details for Web of Science ID A1991GC06600098
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PHOTOCONDUCTIVE MEASUREMENTS ON MICROWAVE-ASSISTED PLASMA-ENHANCED CHEMICALLY VAPOR-DEPOSITED DIAMOND FILMS
1ST EUROPEAN CONF ON DIAMOND AND DIAMOND-LIKE CARBON COATINGS
ELSEVIER SCIENCE SA. 1991: 356–64
View details for Web of Science ID A1991GD45300041
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MULTISPECTRAL SOLAR TELESCOPE ARRAY .2. SOFT-X-RAY EUV REFLECTIVITY OF THE MULTILAYER MIRRORS
OPTICAL ENGINEERING
1991; 30 (8): 1067-1075
View details for Web of Science ID A1991FZ61200004
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SYNCHROTRON X-RAY STANDING-WAVE STUDY OF SB ON GAAS(110) AND INP(110)
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
1991; 9 (4): 2290-2293
View details for Web of Science ID A1991GB89700066
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SYNCHROTRON-BASED IMAGING WITH A MAGNETIC PROJECTION PHOTOELECTRON MICROSCOPE
ULTRAMICROSCOPY
1991; 36 (1-3): 117-129
View details for Web of Science ID A1991FR13800009
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SURFACE EXTENDED X-RAY ADSORPTION FINE-STRUCTURE STUDIES OF THE SI(001) 2X1-SB INTERFACE
37TH NATIONAL SYMP OF THE AMERICAN VACUUM SOC
A V S AMER INST PHYSICS. 1991: 1951–55
View details for Web of Science ID A1991FR76300132
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STRUCTURE OF THE SI(111) SQUARE-ROOT-OF-3 X SQUARE-ROOT-OF-3-SB INTERFACE BY SURFACE X-RAY ABSORPTION FINE-STRUCTURE AND PHOTOEMISSION
37TH NATIONAL SYMP OF THE AMERICAN VACUUM SOC
A V S AMER INST PHYSICS. 1991: 1956–61
View details for Web of Science ID A1991FR76300133
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X-RAY-INDUCED DAMAGE STUDIES IN SIC X-RAY-LITHOGRAPHY MASK MEMBRANES
MICROELECTRONIC ENGINEERING
1991; 13 (1-4): 263-266
View details for Web of Science ID A1991GA21700054
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LOCAL BONDING STRUCTURE OF SB ON SI(111) BY SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE AND PHOTOEMISSION
PHYSICAL REVIEW B
1991; 43 (5): 4331-4339
View details for Web of Science ID A1991EX92100064
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CONSERVATION OF BOND LENGTHS IN STRAINED GE-SI LAYERS
PHYSICAL REVIEW B
1991; 43 (3): 2419-2422
View details for Web of Science ID A1991EV60500069
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X-RAY-INDUCED DAMAGE STUDIES IN SIC X-RAY-LITHOGRAPHY MASK MEMBRANES
INTERNATIONAL CONF ON MICROLITHOGRAPHY
ELSEVIER SCIENCE PUBL B V. 1991: 263–266
View details for Web of Science ID A1991BT72V00053
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INTRINSIC PHOTOCONDUCTIVITY IN POLYCRYSTALLINE CVD DIAMOND FILMS AND IN NATURAL AND SYNTHETIC BULK DIAMONDS
2ND INTERNATIONAL CONF ON THE NEW DIAMOND SCIENCE AND TECHNOLOGY
MATERIALS RESEARCH SOC. 1991: 729–734
View details for Web of Science ID A1991BU83N00104
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TEMPERATURE-DEPENDENT PHOTOCONDUCTIVITY MEASUREMENTS ON TYPE IIA DIAMONDS AND POLYCRYSTALLINE DIAMOND FILMS
1ST INTERNATIONAL CONF ON THE APPLICATIONS OF DIAMOND FILMS AND RELATED MATERIALS ( ADC 91 )
ELSEVIER SCIENCE PUBL B V. 1991: 341–346
View details for Web of Science ID A1991BV44Y00047
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SURFACE EXTENDED-X-RAY-ABSORPTION FINE-STRUCTURE AND SCANNING TUNNELING MICROSCOPY OF SI(001)2X1-SB
PHYSICAL REVIEW LETTERS
1990; 65 (27): 3417-3420
View details for Web of Science ID A1990EQ33800015
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SOFT-X-RAY DETECTION WITH DIAMOND PHOTOCONDUCTIVE DETECTORS
8TH TOPICAL CONF ON HIGH TEMPERATURE PLASMA DIAGNOSTICS
AMER INST PHYSICS. 1990: 2765–67
View details for Web of Science ID A1990EE83700012
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CARRIER DENSITY DEPENDENT PHOTOCONDUCTIVITY IN DIAMOND
APPLIED PHYSICS LETTERS
1990; 57 (6): 623-625
View details for Web of Science ID A1990DR71200032
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MULTILAYER DIFFRACTION GRATINGS - APPLICATION TO SYNCHROTRON RADIATION INSTRUMENTATION
CONF ON X-RAY/EUV OPTICS FOR ASTRONOMY AND MICROSCOPY
SOC PHOTO-OPT INSTRUM ENG. 1990: 738–44
View details for Web of Science ID A1990DP55600008
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ABSOLUTE X-RAY POWER MEASUREMENTS WITH SUBNANOSECOND TIME RESOLUTION USING TYPE IIA DIAMOND PHOTOCONDUCTORS
JOURNAL OF APPLIED PHYSICS
1990; 68 (1): 124-130
View details for Web of Science ID A1990DK37700023
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SEMICONDUCTOR SURFACE CORE LEVEL SHIFTS BY USE OF SELECTED OVERLAYERS
PHYSICA SCRIPTA
1990; 41 (6): 1034-1036
View details for Web of Science ID A1990DP11700072
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A NOVEL DIFFERENTIAL PUMP FOR SYNCHROTRON BEAMLINES - TESTS, MODELS AND APPLICATIONS
6TH NATIONAL CONF ON SYNCHROTRON RADIATION INSTRUMENTATION
ELSEVIER SCIENCE BV. 1990: 350–56
View details for Web of Science ID A1990DL89700064
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FROM SMALL-AREA TO IMAGING PHOTOABSORPTION SPECTROSCOPY
6TH NATIONAL CONF ON SYNCHROTRON RADIATION INSTRUMENTATION
ELSEVIER SCIENCE BV. 1990: 19–25
View details for Web of Science ID A1990DL89700005
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CORE LEVEL PHOTOELECTRON MICROSCOPY
4TH INTERNATIONAL CONF ON ELECTRON SPECTROSCOPY ( ICES4 )
ELSEVIER SCIENCE BV. 1990: 797–810
View details for Web of Science ID A1990DC75600066
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SMALL AREA PHOTOEMISSION AND PHOTOABSORPTION MEASUREMENTS USING A PHOTOELECTRON MICROSCOPE
PHYSICA SCRIPTA
1990; 41 (4): 413-417
View details for Web of Science ID A1990DC54000007
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TRANSIENT PHOTOCONDUCTIVE MEASUREMENTS OF MICROWAVE AND DC PLASMA CVD PRODUCED DIAMOND FILMS
PERGAMON-ELSEVIER SCIENCE LTD. 1990: 791–91
View details for Web of Science ID A1990DX38700033
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CE PROMOTED OXIDATION OF GAAS(100) SURFACES
20TH INTERNATIONAL CONF ON THE PHYSICS OF SEMICONDUCTORS
WORLD SCIENTIFIC PUBL CO PTE LTD. 1990: 243–246
View details for Web of Science ID A1990BS85G00046
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SI(111) 2 X-1 SURFACE CORE-LEVEL SHIFTS INVESTIGATED BY USE OF GE OVERLAYER
PHYSICAL REVIEW B
1989; 40 (18): 12463-12467
View details for Web of Science ID A1989CH60200048
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IMAGE-PROCESSING OF MULTISPECTRAL X-RAY PHOTOELECTRON-SPECTROSCOPY IMAGES
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
1989; 7 (6): 3301-3304
View details for Web of Science ID A1989AZ99000025
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CORE LEVEL PHOTOELECTRON MICROSCOPY WITH SYNCHROTRON RADIATION
REVIEW OF SCIENTIFIC INSTRUMENTS
1989; 60 (7): 1686-1689
View details for Web of Science ID A1989AG22100066
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SILICON(111) 2X1 SURFACE-STATES - K-EDGE TRANSITIONS AND SURFACE SELECTIVE L2,3VV AUGER LINESHAPE
PHYSICA B-CONDENSED MATTER
1989; 158 (1-3): 576-577
View details for Web of Science ID A1989AE26500216
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SILICON(111) 2X1 SURFACE-STATES - K-EDGE TRANSITIONS AND SURFACE-SELECTIVE L2,3VV AUGER LINE-SHAPE
PHYSICAL REVIEW B
1989; 39 (12): 8593-8604
View details for Web of Science ID A1989U356800060
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PHOTON-ENERGY-SENSITIVE SIL2,3VV AUGER SATELLITE
PHYSICAL REVIEW B
1989; 39 (9): 6048-6051
View details for Web of Science ID A1989T823500060
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MULTILAYER DIFFRACTION GRATINGS - APPLICATION TO SYNCHROTRON RADIATION INSTRUMENTATION
CONF ON X-RAY/EUV OPTICS FOR ASTRONOMY AND MICROSCOPY
SPIE - INT SOC OPTICAL ENGINEERING. 1989: 636–647
View details for Web of Science ID A1989BQ26H00062
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PROCESS-CONTROL WITH CHEMICAL AMPLIFICATION RESISTS USING DEEP ULTRAVIOLET AND X-RAY-RADIATION
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
1988; 6 (6): 2303-2307
View details for Web of Science ID A1988R607100138
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ORIENTATIONAL DISORDER IN AMORPHOUS-SILICON PROBED BY XANES (X-RAY ABSORPTION NEAR EDGE STRUCTURE)
PHYSICA SCRIPTA
1988; 38 (3): 408-411
View details for Web of Science ID A1988Q383500011
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KAPPA-RESOLVED ALLOY BOWING IN PSEUDOBINARY INXGA1-XAS ALLOYS
PHYSICAL REVIEW LETTERS
1988; 61 (7): 877-880
View details for Web of Science ID A1988P707100029
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THE EFFECT OF STRAIN ON THE BAND-STRUCTURE OF INXGA1-XAS
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
1988; 6 (4): 1234-1239
View details for Web of Science ID A1988P729100033
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THE EFFECT OF STRAIN ON THE BAND-STRUCTURE OF GAAS AND IN0.2GA0.8AS
A V S AMER INST PHYSICS. 1988: 1348–49
View details for Web of Science ID A1988N974800006
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BONDING AT THE K/SI(100)2X1 INTERFACE - A SURFACE EXTENDED X-RAY ABSORPTION FINE-STRUCTURE STUDY
A V S AMER INST PHYSICS. 1988: 879–80
View details for Web of Science ID A1988N974600124
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BONDING AT THE K/SI(100) 2X1 INTERFACE - A SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY
PHYSICAL REVIEW B
1988; 37 (12): 7115-7117
View details for Web of Science ID A1988N126800066
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SOFT-X-RAY DOSIMETRY AND ITS APPLICATION ON THE LITHOGRAPHY BEAMLINE AT SSRL
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
1988; 266 (1-3): 612-618
View details for Web of Science ID A1988M829100107
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APPLICATIONS OF MULTILAYERS TO SYNCHROTRON RADIATION
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
1988; 266 (1-3): 441-446
View details for Web of Science ID A1988M829100079
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MULTI-UNDULATOR BEAM LINE-V AT SSRL - A PROGRESS REPORT
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
1988; 266 (1-3): 83-90
View details for Web of Science ID A1988M829100017
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SYNCHROTRON-BASED X-RAY-LITHOGRAPHY AT STANFORD-UNIVERSITY
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
1988; 266 (1-3): 287-292
View details for Web of Science ID A1988M829100051
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SPLITTING OF THE WHITE LINE 1S ABSORPTION-EDGE IN CRYSTALLINE SI, SIGE, AND DILUTE SIGE
SOLID STATE COMMUNICATIONS
1988; 65 (7): 685-688
View details for Web of Science ID A1988M052600029
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EFFECT OF STRAIN ON THE BAND-STRUCTURE OF GAAS AND IN0.2GA0.8AS
APPLIED PHYSICS LETTERS
1988; 52 (4): 308-310
View details for Web of Science ID A1988L732400021
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RADIATION-DAMAGE IN BORON-NITRIDE X-RAY-LITHOGRAPHY MASKS
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
1988; 6 (1): 162-166
View details for Web of Science ID A1988M172300029
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DETERMINATION OF THE NATURAL VALENCE-BAND OFFSET IN THE INXGA1-XAS SYSTEM
APPLIED PHYSICS LETTERS
1987; 51 (20): 1632-1633
View details for Web of Science ID A1987K762000023
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MULTIPLE-SCATTERING EFFECTS IN THE K-EDGE X-RAY-ABSORPTION NEAR-EDGE STRUCTURE OF CRYSTALLINE AND AMORPHOUS-SILICON
PHYSICAL REVIEW B
1987; 36 (12): 6426-6433
View details for Web of Science ID A1987K690800024
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MOLYBDENUM-SILICON MULTILAYER MONOCHROMATOR FOR THE EXTREME ULTRAVIOLET
APPLIED PHYSICS LETTERS
1987; 50 (25): 1841-1843
View details for Web of Science ID A1987H773100024
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THE SILICON GERMANIUM(111) INTERFACE - THE ONSET OF EPITAXY
JOURNAL DE PHYSIQUE
1986; 47 (C-8): 497-501
View details for Web of Science ID A1986G515900093
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SI/INP(110) HETEROJUNCTION
PHYSICAL REVIEW B
1986; 34 (10): 7069-7075
View details for Web of Science ID A1986E842800061
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PERFORMANCE OF LAYERED SYNTHETIC MICROSTRUCTURES IN MONOCHROMATOR APPLICATIONS IN THE SOFT-X-RAY REGION
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
1986; 246 (1-3): 352-355
View details for Web of Science ID A1986C799900074
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SUBNANOSECOND TIME RESOLVED MEASUREMENTS OF SYNCHROTRON X-RAY PULSES USING PHOTOCONDUCTIVE DETECTORS
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
1986; 246 (1-3): 534-536
View details for Web of Science ID A1986C799900115
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SOFT-X-RAY PHOTOEMISSION WITH THE SSX-100 SPECTROMETER
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
1986; 246 (1-3): 806-809
View details for Web of Science ID A1986C799900167
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CRYSTAL HEATING ON THE JUMBO DOUBLE CRYSTAL MONOCHROMATOR AT SSRL
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
1986; 246 (1-3): 440-443
View details for Web of Science ID A1986C799900097
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X-RAY-LITHOGRAPHY AT THE STANFORD SYNCHROTRON RADIATION LABORATORY
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
1986; 246 (1-3): 641-643
View details for Web of Science ID A1986C799900135
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X-RAY-LITHOGRAPHY AT THE STANFORD-SYNCHROTRON-RADIATION-LABORATORY (SSRL)
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
1985; 537: 69-74
View details for Web of Science ID A1985AML2300010
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EFFECT OF AN AL INTERLAYER ON THE GAAS/GE(100) HETEROJUNCTION FORMATION
PHYSICAL REVIEW B
1985; 32 (6): 4071-4076
View details for Web of Science ID A1985AQN2000088
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HETEROJUNCTION BAND DISCONTINUITY AT THE SI-GE(111) INTERFACE
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
1985; 3 (4): 1252-1255
View details for Web of Science ID A1985APG4000069
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X-RAY RESIST CHARACTERIZATION WITH MONOCHROMATIC SYNCHROTRON RADIATION
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
1984; 471: 121-126
View details for Web of Science ID A1984SY56500017
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COPPER L2,3 NEAR-EDGE STRUCTURE IN CU2O
PHYSICAL REVIEW B
1984; 30 (4): 2120-2126
View details for Web of Science ID A1984TE51300062
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DESIGN CONSIDERATIONS FOR THE X-RAY-LITHOGRAPHY STATION AT THE STANFORD SYNCHROTRON RADIATION LABORATORY
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
1984; 222 (1-2): 355-358
View details for Web of Science ID A1984TA71500067
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PULSED SOFT-X-RAY RESPONSE OF INP-FE PHOTOCONDUCTORS
APPLIED PHYSICS LETTERS
1984; 44 (11): 1059-1061
View details for Web of Science ID A1984SS31700015
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ELECTRON-ESCAPE DEPTH VARIATION IN THIN SIO2-FILMS MEASURED WITH VARIABLE PHOTON ENERGY
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
1984; 2 (2): 584-587
View details for Web of Science ID A1984SS70300122
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DESIGN AND MODELING CONSIDERATIONS FOR SSRL BEAM LINE WUNDER
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
1984; 447: 10-15
View details for Web of Science ID A1984SQ18400002
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DESIGN PROCESS AND MODELING STUDIES OF SSRL BEAM LINE WUNDER
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
1984; 222 (1-2): 70-79
View details for Web of Science ID A1984TA71500015
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FAST PHOTOCONDUCTORS FOR SYNCHROTRON RADIATION RESEARCH
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
1984; 222 (1-2): 270-273
View details for Web of Science ID A1984TA71500052
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X-RAY-LITHOGRAPHY STATION AT THE STANFORD-SYNCHROTRON RADIATION-LABORATORY (SSRL)
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
1984; 448: 60-63
View details for Web of Science ID A1984SQ18200007
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AN ANGLE-RESOLVED PHOTOEMISSION-STUDY OF THE CHEMISORPTION OF CHALCOGENS ON CU(100) .3. CU(100)+P(2X2)S
SURFACE SCIENCE
1983; 124 (1): 175-187
View details for Web of Science ID A1983QD48100016
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ANGLE-RESOLVED PHOTOEMISSION-STUDIES OF OXIDE FORMATION ON CU(100)
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
1982; 21 (1): 47-49
View details for Web of Science ID A1982NT51100009
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ANGLE-RESOLVED PHOTOEMISSION-STUDY OF THE CHEMISORPTION OF CHALCOGENS ON CU(100) .1. CLEAN SURFACE
SURFACE SCIENCE
1980; 92 (2-3): 350-364
View details for Web of Science ID A1980JK04200005
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AN ANGLE-RESOLVED PHOTOEMISSION-STUDY OF THE CHEMISORPTION OF CHALCOGENS ON CU(100) .2. CU(100) + C(2 X 2)O
SURFACE SCIENCE
1980; 95 (1): 89-106
View details for Web of Science ID A1980JY79900011
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PHOTOEMISSION-STUDY OF THE INTERACTION OF A1 WITH A GAAS (110) SURFACE
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
1979; 17 (4): 259-265
View details for Web of Science ID A1979HM98800005
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EXAFS STUDIES OF THE BONDING GEOMETRY OF OXYGEN ON SI(111) USING ELECTRON YIELD DETECTION
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
1979; 16 (5): 1221-1224
View details for Web of Science ID A1979JC00100029
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AD-ATOM INTERACTIONS WITH III-V-SEMICONDUCTOR SURFACES
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
1979; 15 (JAN): 197-200
View details for Web of Science ID A1979GH48900031
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PHOTOEMISSION-STUDIES OF THE INITIAL-STAGES OF OXIDATION OF GASB AND INP
SURFACE SCIENCE
1979; 88 (2-3): 439-460
View details for Web of Science ID A1979HV82400010
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EXTENDED-X-RAY-ABSORPTION-FINE-STRUCTURE STUDIES OF LOW-Z ATOMS IN SOLIDS AND ON SURFACES - STUDIES OF SI3N4, SIO2, AND OXYGEN ON SI(111)
PHYSICAL REVIEW B
1979; 20 (2): 664-680
View details for Web of Science ID A1979HG72800030
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OXYGEN-ADSORPTION ON CS COVERED GAAS(110) SURFACES
SURFACE SCIENCE
1979; 86 (JUL): 894-899
View details for Web of Science ID A1979HN71100101
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FUNDAMENTAL-STUDIES OF III-V SURFACES AND THE (III-V)-OXIDE INTERFACE
THIN SOLID FILMS
1979; 56 (1-2): 1-18
View details for Web of Science ID A1979GS54200001
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COMPARATIVE STUDIES OF OXYGEN-ADSORPTION ON GAAS(110) SURFACES WITH ULTRATHIN ALUMINUM AND CESIUM OVERLAYERS
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
1979; 16 (5): 1439-1442
View details for Web of Science ID A1979JC00100073
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STUDY OF P(2X2)-S OVERLAYERS ON CU (100) BY POLARIZATION-DEPENDENT ANGULARLY RESOLVED ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY (ARUPS)
AMER INST PHYSICS. 1979: 337–37
View details for Web of Science ID A1979GL33800715
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PHOTOEMISSION-STUDY OF THE SILICON-GOLD INTERFACE
AMER INST PHYSICS. 1979: 248–48
View details for Web of Science ID A1979GL33800126
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ELECTRON-SPECTROSCOPIC STUDIES OF THE EARLY STAGES OF THE OXIDATION OF SI
PHYSICAL REVIEW B
1979; 19 (8): 3944-3956
View details for Web of Science ID A1979GX79400014
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SURFACE ELECTRONIC-STRUCTURE OF 3-5 COMPOUNDS AND THE MECHANISM OF FERMI LEVEL PINNING BY OXYGEN (PASSIVATION) AND METALS (SCHOTTKY BARRIERS)
SURFACE SCIENCE
1979; 86 (JUL): 763-788
View details for Web of Science ID A1979HN71100087
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ADSORPTION STATES OF OXYGEN ON SILICON
AMER INST PHYSICS. 1978: 33–33
View details for Web of Science ID A1978EG45500148
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NEW METHOD FOR SCHOTTKY-BARRIER FORMATION
AMER INST PHYSICS. 1978: 400–401
View details for Web of Science ID A1978ER59001454
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VALENCE BAND STUDIES OF CLEAN AND OXYGEN EXPOSED GAAS(110) SURFACES
SURFACE SCIENCE
1978; 72 (2): 298-320
View details for Web of Science ID A1978ES85100006
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ADSORPTION OF OXYGEN ON CU(100) - STUDY BY ANGULARLY RESOLVED ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY (ARUPS)
AMER INST PHYSICS. 1978: 495–96
View details for Web of Science ID A1978EZ99900092
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NEW PHENOMENA IN SCHOTTKY-BARRIER FORMATION ON III-V-COMPOUNDS
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
1978; 15 (4): 1332-1339
View details for Web of Science ID A1978FM76100021
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UPS AND LEED STUDIES OF GAAS (110) AND (111) AS SURFACES
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
1978; 15 (4): 1219-1222
View details for Web of Science ID A1978FM76100001
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OXYGEN-ADSORPTION AND SURFACE ELECTRONIC-STRUCTURE OF GAAS (110)
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
1978; 13 (3): 155-160
View details for Web of Science ID A1978ES91100002
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AUGER PROFILING STUDIES OF LPE N-ALXGAL-XAS-N GAAS HETEROJUNCTIONS AND ABSENCE OF RECTIFICATION
AMER INST PHYSICS. 1978: 31–31
View details for Web of Science ID A1978EG45500137
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NEW PHENOMENON IN ABSORPTION OF OXYGEN ON SILICON
PHYSICAL REVIEW LETTERS
1978; 40 (6): 403-406
View details for Web of Science ID A1978EK27200017
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BONDING STATES OF OXYGEN ON SILICON
AMER INST PHYSICS. 1978: 1290–91
View details for Web of Science ID A1978FM76100015
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MECHANISM OF SCHOTTKY-BARRIER PINNING ON 3-5 SEMICONDUCTORS
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1978: 1360–61
View details for Web of Science ID A1978FU75100085
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CHEMISORPTION AND OXIDATION STUDIES OF (110) SURFACES OF GAAS, GASB, AND INP
PHYSICAL REVIEW B
1978; 18 (6): 2792-2806
View details for Web of Science ID A1978FU98100048
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SURFACE-CHEMISTRY OF ALUMINUM ADSORBED ON SI(111)
AMER INST PHYSICS. 1978: 399–99
View details for Web of Science ID A1978ER59001444
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X-RAY OPTICS AND MONOCHROMATORS .5. PHASE SPACE ANALYSIS APPLIED TO X-RAY OPTICS
NUCLEAR INSTRUMENTS & METHODS
1978; 152 (1): 155-159
View details for Web of Science ID A1978FC65200030
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CORE-LEVEL PHOTOEMISSION OF CS-O ADLAYER OF NEA GAAS CATHODES
APPLIED PHYSICS LETTERS
1978; 33 (11): 934-935
View details for Web of Science ID A1978FX88400013
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EVIDENCE FOR A NEW TYPE OF METAL-SEMICONDUCTOR INTERACTION ON GASB
PHYSICAL REVIEW B
1978; 17 (6): 2682-2684
View details for Web of Science ID A1978EV35600032
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PHOTOEMISSION STUDY OF AU SCHOTTKY-BARRIER FORMATION ON GASB, GAAS, AND INP USING SYNCHROTRON RADIATION
PHYSICAL REVIEW B
1978; 18 (10): 5545-5559
View details for Web of Science ID A1978GF66600046
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OXYGEN SORPTION AND EXCITONIC EFFECTS ON GAAS SURFACES
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
1977; 14 (4): 917-919
View details for Web of Science ID A1977DN66200012
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PHOTOEMISSION STUDIES OF OXIDATION OF GASB AND INP
AMER INST PHYSICS. 1977: 420–20
View details for Web of Science ID A1977CX84801135
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OXIDATION PROPERTIES OF GAAS (110) SURFACES - REPLY
PHYSICAL REVIEW B
1977; 16 (12): 5600-5602
View details for Web of Science ID A1977EH18900056
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SURFACE AND INTERFACE STATES ON GAAS(110) - EFFECTS OF ATOMIC AND ELECTRONIC REARRANGEMENTS)
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
1977; 14 (4): 885-893
View details for Web of Science ID A1977DN66200007
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COMPARISON OF LEED INTENSITY DATA FROM CHEMICALLY POLISHED AND CLEAVED GAAS(110)SURFACES
SURFACE SCIENCE
1977; 69 (2): 735-740
View details for Web of Science ID A1977EF04000031
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HIGH-RESOLUTION X-RAY SPECTROSCOPY USING SYNCHROTRON RADIATION - SOURCE CHARACTERISTICS AND OPTICAL SYSTEMS
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
1977; 11 (1): 13-38
View details for Web of Science ID A1977DE87800002
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PHOTOEMISSION STUDIES OF SURFACE ELECTRONIC-STRUCTURE OF SI (111) AND OXYGEN-CHEMISORPTION
AMER INST PHYSICS. 1977: 433–33
View details for Web of Science ID A1977CX84801228
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CORE LEVEL (SI 2P) SHIFTS FOR OXYGEN-CHEMISORPTION ON SI (111)
AMER INST PHYSICS. 1977: 418–18
View details for Web of Science ID A1977CX84801121
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AUGER PROFILING OF ALXGA1-XAS-GAAS HETEROJUNCTIONS GROWN BY LPE
AMER INST PHYSICS. 1977: 293–93
View details for Web of Science ID A1977CX84800283
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PHOTOEMISSION STUDIES OF SURFACE-STATES AND OXIDATION OF GROUP-IV SEMICONDUCTORS
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
1977; 14 (1): 372-375
View details for Web of Science ID A1977CV60700088
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DO AU 5D-BANDS NARROW AT SURFACE - COMPARISON WITH AU ALLOYS
PHYSICS LETTERS A
1977; 63 (3): 387-389
View details for Web of Science ID A1977EB03200076
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STUDIES OF SURFACE ELECTRONIC-STRUCTURE AND SURFACE-CHEMISTRY USING SYNCHROTRON RADIATION
PHYSICA SCRIPTA
1977; 16 (5-6): 388-397
View details for Web of Science ID A1977EU61900037
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PHOTOEMISSION STUDIES OF ELECTRONIC-STRUCTURE OF 3-5 SEMICONDUCTOR SURFACES
SURFACE SCIENCE
1977; 63 (1): 45-55
View details for Web of Science ID A1977DH66500006
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PHOTOEMISSION STUDIES OF OXIDATION OF 3-4 SEMICONDUCTOR SURFACES BY USING SYNCHROTRON RADIATION
AMER CHEMICAL SOC. 1976: 116–16
View details for Web of Science ID A1976CB10102536
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PHOTOEMISSION STUDIES OF SEMICONDUCTOR SURFACES USING SYNCHROTRON RADIATION
AMER INST PHYSICS. 1976: 942–42
View details for Web of Science ID A1976CC44000091
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VALENCE BAND ELECTRONIC-STRUCTURE OF CLEAN AND OXIDIZED (110) SURFACES OF GAAS, GASB AND INP
AMER INST PHYSICS. 1976: 321–21
View details for Web of Science ID A1976BH96900617
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OXIDATION PROPERTIES OF GAAS (110) SURFACES
PHYSICAL REVIEW LETTERS
1976; 37 (17): 1166-1169
View details for Web of Science ID A1976CG81600020
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OXIDATION OF GAAS(110) SURFACES - CORE LEVEL SPECTROSCOPY
AMER INST PHYSICS. 1976: 1313–14
View details for Web of Science ID A1976CM84500197
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SYNCHROTRON RADIATION STUDIES OF ELECTRONIC-STRUCTURE AND SURFACE-CHEMISTRY OF GAAS, GASB, AND INP
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
1976; 13 (4): 780-785
View details for Web of Science ID A1976CA52700008
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PHOTOEMISSION STUDIES OF GASB SURFACE AND INTERFACE STATES
AMER INST PHYSICS. 1976: 1313–13
View details for Web of Science ID A1976CM84500194
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PHOTOIONIZATION CROSS-SECTIONS OF 3D AND 4D LEVELS MEASURED BY PHOTOEMISSION TECHNIQUE
AMER INST PHYSICS. 1976: 417–17
View details for Web of Science ID A1976BH96901180
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FERMI LEVEL POSITION IN N-TYPE GAAS(110) AND GASB(110)
AMER INST PHYSICS. 1976: 319–19
View details for Web of Science ID A1976BH96900605
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DETERMINATION OF ESCAPE DEPTH OF PHOTOEMITTED ELECTRONS IN GOLD IN ENERGY-RANGE 25-75 EV BY USE OF SYNCHROTRON RADIATION
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
1976; 8 (6): 487-491
View details for Web of Science ID A1976BV57600008
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UPS STUDIES OF BONDING OF H2,O2,CO,C2H4 AND C2H2 ON FE AND CU
SURFACE SCIENCE
1976; 57 (1): 157-183
View details for Web of Science ID A1976BW85100014
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PHOTOEMISSION FROM SOME METALS AND SEMICONDUCTORS IN ENERGY-RANGE 5-350 EV
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
1976; 13 (1): 269-272
View details for Web of Science ID A1976BH29000070
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ENERGY-DEPENDENCE OF 4D PHOTOIONIZATION CROSS-SECTION OF IN AND SB
PHYSICS LETTERS A
1976; 57 (3): 225-226
View details for Web of Science ID A1976BX36300013
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RELATIONSHIP OF HEAT OF CHEMISORPTION TO PI-LEVEL AND SIGMA-LEVEL SHIFTS AS MEASURED BY PHOTOEMISSION
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
1976; 13 (1): 277-279
View details for Web of Science ID A1976BH29000072
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PHOTOEMISSION STUDIES OF ADSORPTION OF O2 AND OXIDATION OF CLEAVED SI
AMER INST PHYSICS. 1976: 1314–14
View details for Web of Science ID A1976CM84500201
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OXYGEN BONDING SITE ON GAAS, GASB AND INP (110) SURFACES
AMER INST PHYSICS. 1976: 320–21
View details for Web of Science ID A1976BH96900616
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PHOTOEMISSION OF GOLD IN ENERGY-RANGE 30-3000 EV USING SYNCHROTRON RADIATION
PHYSICAL REVIEW B
1976; 13 (2): 492-495
View details for Web of Science ID A1976BD87900003
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PHOTOEMISSION STUDIES OF GOLD IN WAVELENGTH REGION 30-300 EV
AMER INST PHYSICS. 1975: 475–75
View details for Web of Science ID A1975V675601194
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INTRINSIC LINEWIDTH OF 4F LEVELS IN GOLD AS DETERMINED BY PHOTOEMISSION
PHYSICS LETTERS A
1975; 54 (1): 47-48
View details for Web of Science ID A1975AP19200021
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DETERMINATION OF OXYGEN BINDING-SITE ON GAAS(110) USING SOFT-X-RAY-PHOTOEMISSION SPECTROSCOPY
PHYSICAL REVIEW LETTERS
1975; 35 (20): 1356-1359
View details for Web of Science ID A1975AV98000014
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VACUUM ULTRAVIOLET SYNCHROTRON RADIATION FROM SPEAR
AMER INST PHYSICS. 1975: 419–19
View details for Web of Science ID A1975V675600847
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SHORT-RANGE PROBE FOR INVESTIGATING METALLOPROTEIN STRUCTURES - FOURIER-ANALYSIS OF EXTENDED X-RAY ABSORPTION FINE-STRUCTURE
AMER INST PHYSICS. 1975: 317–17
View details for Web of Science ID A1975V675600218
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ULTRAVIOLET PHOTOEMISSION STUDIES OF O2, CO, C2H2 AND C2H4 CHEMISORBED ON COPPER
AMER INST PHYSICS. 1975: 359–59
View details for Web of Science ID A1975V675600475
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SHORT-RANGE PROBE FOR INVESTIGATING METALLOPROTEIN STRUCTURES - FOURIER-ANALYSIS OF EXTENDED X-RAY ABSORPTION FINE-STRUCTURE
JOURNAL OF CHEMICAL PHYSICS
1975; 62 (6): 2514-2515
View details for Web of Science ID A1975V975100076
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X-RAY PHOTOEMISSION SPECTROSCOPY
NATURE
1974; 250 (5463): 214-215
View details for Web of Science ID A1974T571500034
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ANTIFERROMAGNETIC LINEAR CHAINS IN CRYSTALLINE FREE-RADICAL BDPA
JOURNAL OF CHEMICAL PHYSICS
1972; 56 (6): 2555-&
View details for DOI 10.1063/1.1677580
View details for Web of Science ID A1972L903300011