Bio


Pianetta's research is directed towards understanding how the atomic and electronic structure of semiconductor interfaces impacts device technology pertaining to advanced semiconductors and photocathodes. His research includes the development of new analytical tools for these studies based on the use of synchrotron radiation. These include the development of ultrasensitive methods to analyze trace impurities on the surface of silicon wafers at levels as low as 1e-6 monolayer (~1e8 atoms/cm2) and the use of various photoelectron spectroscopies (X-ray photoemission, NEXAFS, X-ray standing waves and photoelectron diffraction) to determine the bonding and atomic structure at the interface between silicon and different passivating layers. Recent projects include the development of high resolution (~30nm) x-ray spectromicroscopy with applications to energy materials such as Li batteries.

Academic Appointments


Administrative Appointments


  • Deputy Chief Research Officer, SLAC (2020 - Present)
  • Chair, Photon Science, SLAC (2016 - 2020)
  • Deputy Director for SSRL, SLAC (2014 - Present)
  • Director (Interim) for SSRL, SLAC (2012 - 2014)
  • Deputy Director for SSRL, SLAC (2010 - 2012)
  • Director (Acting) for SSRL, SLAC (2009 - 2010)
  • Deputy Director for SSRL, SLAC (2005 - 2009)
  • Assistant Director for SSRL, SLAC (1993 - 2005)
  • Associate Director, Stanford Synchrotron Radiation Laboratory (1985 - 1993)

Honors & Awards


  • Fellow, American Physical Society (2006)

Boards, Advisory Committees, Professional Organizations


  • Chair, Experimental Systems Advisory Committee, Advanced Photon Source, Argonne National Laboratory (2015 - Present)

Professional Education


  • PhD, Stanford University, Applied Physics (1977)
  • MS, Stanford University, Applied Physics (1973)
  • BS, Santa Clara University, Physics (1971)

Patents


  • L. Hesselink, R.F.W. Pease, P. Pianetta, J.R. Maldonado, ^. Cheng, J. Ryan. "United States Patent 9,520,260 Photo emitter x-ray source array (PeXSA)", The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US), Dec 13, 2016
  • J.R. Maldonado, Y-T Cheng, P. Pianetta, R.F.W. Pease, L. Hesselink. "United States Patent 9,406,488 Enhanced photoelectron sources using electron bombardment", The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA, Aug 2, 2016

2024-25 Courses


All Publications


  • Mesoscale interplay among composition heterogeneity, lattice deformation, and redox stratification in single-crystalline layered oxide cathode ESCIENCE Xue, Z., Wu, F., Ge, M., Huang, X., Chu, Y. S., Pianetta, P., Liu, Y. 2024; 4 (4)
  • Deep Learning for Spectroscopic X-ray Nano-Imaging Denoising ADVANCED INTELLIGENT SYSTEMS Fu, T., Zhang, K., Yuan, Q., Li, J., Pianetta, P., Liu, Y. 2024
  • Image registration for in situ X-ray nano-imaging of a composite battery cathode with deformation. Journal of synchrotron radiation Su, B., Qian, G., Gao, R., Tao, F., Zhang, L., Du, G., Deng, B., Pianetta, P., Liu, Y. 2024

    Abstract

    The structural and chemical evolution of battery electrodes at the nanoscale plays an important role in affecting the cell performance. Nano-resolution X-ray microscopy has been demonstrated as a powerful technique for characterizing the evolution of battery electrodes under operating conditions with sensitivity to their morphology, compositional distribution and redox heterogeneity. In real-world batteries, the electrode could deform upon battery operation, causing challenges for the image registration which is necessary for several experimental modalities, e.g. XANES imaging. To address this challenge, this work develops a deep-learning-based method for automatic particle identification and tracking. This approach was not only able to facilitate image registration with good robustness but also allowed quantification of the degree of sample deformation. The effectiveness of the method was first demonstrated using synthetic datasets with known ground truth. The method was then applied to an experimental dataset collected on an operating lithium battery cell, revealing a high degree of intra- and interparticle chemical complexity in operating batteries.

    View details for DOI 10.1107/S1600577524000146

    View details for PubMedID 38300132

  • Multi-modal X-ray microscopy for chemical analysis TRAC-TRENDS IN ANALYTICAL CHEMISTRY Su, B., Li, J., Deng, B., Pianetta, P., Liu, Y. 2024; 171
  • Asynchronous domain dynamics and equilibration in layered oxide battery cathode. Nature communications Xue, Z., Sharma, N., Wu, F., Pianetta, P., Lin, F., Li, L., Zhao, K., Liu, Y. 2023; 14 (1): 8394

    Abstract

    To improve lithium-ion battery technology, it is essential to probe and comprehend the microscopic dynamic processes that occur in a real-world composite electrode under operating conditions. The primary and secondary particles are the structural building blocks of battery cathode electrodes. Their dynamic inconsistency has profound but not well-understood impacts. In this research, we combine operando coherent multi-crystal diffraction and optical microscopy to examine the chemical dynamics in local domains of layered oxide cathode. Our results not only pinpoint the asynchronicity of the lithium (de)intercalation at the sub-particle level, but also reveal sophisticated diffusion kinetics and reaction patterns, involving various localized processes, e.g., chemical onset, reaction front propagation, domains equilibration, particledeformationand motion. These observations shed new lights onto the activation and degradation mechanisms of state-of-the-art battery cathode materials.

    View details for DOI 10.1038/s41467-023-44222-x

    View details for PubMedID 38110430

  • Stabilizing Ni-rich layered cathode for high-voltage operation through hierarchically heterogeneous doping with concentration gradient MATERIALS TODAY CHEMISTRY Chen, G., Qian, G., Zan, G., Lun, M., Su, F., Stripe, B., Chu, Y. S., Pianetta, P., Huang, X., Li, J. 2024; 35
  • Nanoscale chemical imaging with structured X-ray illumination. Proceedings of the National Academy of Sciences of the United States of America Li, J., Chen, S., Ratner, D., Blu, T., Pianetta, P., Liu, Y. 2023; 120 (49): e2314542120

    Abstract

    High-resolution imaging with compositional and chemical sensitivity is crucial for a wide range of scientific and engineering disciplines. Although synchrotron X-ray imaging through spectromicroscopy has been tremendously successful and broadly applied, it encounters challenges in achieving enhanced detection sensitivity, satisfactory spatial resolution, and high experimental throughput simultaneously. In this work, based on structured illumination, we develop a single-pixel X-ray imaging approach coupled with a generative image reconstruction model for mapping the compositional heterogeneity with nanoscale resolvability. This method integrates a full-field transmission X-ray microscope with an X-ray fluorescence detector and eliminates the need for nanoscale X-ray focusing and raster scanning. We experimentally demonstrate the effectiveness of our approach by imaging a battery sample composed of mixed cathode materials and successfully retrieving the compositional variations of the imaged cathode particles. Bridging the gap between structural and chemical characterizations using X-rays, this technique opens up vast opportunities in the fields of biology, environmental, and materials science, especially for radiation-sensitive samples.

    View details for DOI 10.1073/pnas.2314542120

    View details for PubMedID 38015849

  • The S-T component in the Si 2p photoemission spectrum from H-terminated and oxidized Si (001) surfaces JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A Herrera-Gomez, A., Vazquez-Lepe, M. O., Mani-Gonzalez, P. G., Pianetta, P., Aguirre-Tostado, F. S., Ceballos-Sanchez, O. 2023; 41 (4)

    View details for DOI 10.1116/6.0002690

    View details for Web of Science ID 000998428100001

  • Exploring the Ultrafast Charge-Transfer and Redox Dynamics in Layered Transition Metal Oxides CONDENSED MATTER Qian, G., Huang, X., Lee, J., Pianetta, P., Liu, Y. 2023; 8 (1)
  • Perspective-Morphology and Dynamics of Metal Dendrites in Batteries Revealed by X-ray Computed Tomography JOURNAL OF THE ELECTROCHEMICAL SOCIETY Qian, G., Zan, G., Pianetta, P., Liu, Y. 2022; 169 (12)
  • In-Situ Visualization of the Transition Metal Dissolution in Layered Cathodes JOURNAL OF ELECTROCHEMICAL ENERGY CONVERSION AND STORAGE Qian, G., Zan, G., Li, J., Zhang, J., Pianetta, P., Liu, Y. 2022; 19 (4)

    View details for DOI 10.1115/1.4054584

    View details for Web of Science ID 000861480100011

  • In situ visualization of multicomponents coevolution in a battery pouch cell. Proceedings of the National Academy of Sciences of the United States of America Zan, G., Qian, G., Gul, S., Li, J., Matusik, K., Wang, Y., Lewis, S., Yun, W., Pianetta, P., Vine, D. J., Li, L., Liu, Y. 2022; 119 (29): e2203199119

    Abstract

    Lithium-ion battery (LIB) is a broadly adopted technology for energy storage. With increasing demands to improve the rate capability, cyclability, energy density, safety, and cost efficiency, it is crucial to establish an in-depth understanding of the detailed structural evolution and cell-degradation mechanisms during battery operation. Here, we present a laboratory-based high-resolution and high-throughput X-ray micro-computed laminography approach, which is capable of in situ visualizing of an industry-relevant lithium-ion (Li-ion) pouch cell with superior detection fidelity, resolution, and reliability. This technique enables imaging of the pouch cell at a spatial resolution of 0.5 mum in a laboratory system and permits the identification of submicron features within cathode and anode electrodes. We also demonstrate direct visualization of the lithium plating in the imaged pouch cell, which is an important phenomenon relevant to battery fast charging and low-temperature cycling. Our development presents an avenue toward a thorough understanding of the correlation among multiscale structures, chemomechanical degradation, and electrochemical behavior of industry-scale battery pouch cells.

    View details for DOI 10.1073/pnas.2203199119

    View details for PubMedID 35858350

  • Data-Driven Lithium-Ion Battery Cathode Research with State-of- the-Art Synchrotron X-ray Techniques ACCOUNTS OF MATERIALS RESEARCH Xue, Z., Li, J., Pianetta, P., Liu, Y. 2022
  • Deep-Learning-Enabled Crack Detection and Analysis in Commercial Lithium-Ion Battery Cathodes ADVANCED FUNCTIONAL MATERIALS Fu, T., Monaco, F., Li, J., Zhang, K., Yuan, Q., Cloetens, P., Pianetta, P., Liu, Y. 2022
  • Dynamics of particle network in composite battery cathodes. Science (New York, N.Y.) Li, J., Sharma, N., Jiang, Z., Yang, Y., Monaco, F., Xu, Z., Hou, D., Ratner, D., Pianetta, P., Cloetens, P., Lin, F., Zhao, K., Liu, Y. 2022; 376 (6592): 517-521

    Abstract

    Improving composite battery electrodes requires a delicate control of active materials and electrode formulation. The electrochemically active particles fulfill their role as energy exchange reservoirs through interacting with the surrounding conductive network. We formulate a network evolution model to interpret the regulation and equilibration between electrochemical activity and mechanical damage of these particles. Through statistical analysis of thousands of particles using x-ray phase contrast holotomography in a LiNi0.8Mn0.1Co0.1O2-based cathode, we found that the local network heterogeneity results in asynchronous activities in the early cycles, and subsequently the particle assemblies move toward a synchronous behavior. Our study pinpoints the chemomechanical behavior of individual particles and enables better designs of the conductive network to optimize the utility of all the particles during operation.

    View details for DOI 10.1126/science.abm8962

    View details for PubMedID 35482882

  • Structural, Dynamic, and Chemical Complexities in Zinc Anode of an Operating Aqueous Zn-Ion Battery ADVANCED ENERGY MATERIALS Qian, G., Zan, G., Li, J., Lee, S., Wang, Y., Zhu, Y., Gul, S., Vine, D. J., Lewis, S., Yun, W., Ma, Z., Pianetta, P., Lee, J., Li, L., Liu, Y. 2022
  • Probing lattice defects in crystalline battery cathode using hard X-ray nanoprobe with data-driven modeling ENERGY STORAGE MATERIALS Li, J., Hong, Y., Yan, H., Chu, Y. S., Pianetta, P., Li, H., Ratner, D., Huang, X., Yu, X., Liu, Y. 2022; 45: 647-655
  • Value-creating upcycling of retired electric vehicle battery cathodes CELL REPORTS PHYSICAL SCIENCE Qian, G., Li, Z., Wang, Y., Xie, X., He, Y., Li, J., Zhu, Y., Xie, S., Cheng, Z., Che, H., Shen, Y., Chen, L., Huang, X., Pianetta, P., Ma, Z., Liu, Y., Li, L. 2022; 3 (2)
  • Thermal-healing of lattice defects for high-energy single-crystalline battery cathodes. Nature communications Li, S., Qian, G., He, X., Huang, X., Lee, S., Jiang, Z., Yang, Y., Wang, W., Meng, D., Yu, C., Lee, J., Chu, Y. S., Ma, Z., Pianetta, P., Qiu, J., Li, L., Zhao, K., Liu, Y. 2022; 13 (1): 704

    Abstract

    Single-crystalline nickel-rich cathodes are a rising candidate with great potential for high-energy lithium-ion batteries due to their superior structural and chemical robustness in comparison with polycrystalline counterparts. Within the single-crystalline cathode materials, the lattice strain and defects have significant impacts on the intercalation chemistry and, therefore, play a key role in determining the macroscopic electrochemical performance. Guided by our predictive theoretical model, we have systematically evaluated the effectiveness of regaining lost capacity by modulating the lattice deformation via an energy-efficient thermal treatment at different chemical states. We demonstrate that the lattice structure recoverability is highly dependent on both the cathode composition and the state of charge, providing clues to relieving the fatigued cathode crystal for sustainable lithium-ion batteries.

    View details for DOI 10.1038/s41467-022-28325-5

    View details for PubMedID 35121768

  • Structural and chemical evolution in layered oxide cathodes of lithium-ion batteries revealed by synchrotron techniques. National science review Qian, G., Wang, J., Li, H., Ma, Z., Pianetta, P., Li, L., Yu, X., Liu, Y. 2022; 9 (2): nwab146

    Abstract

    Rechargeable battery technologies have revolutionized electronics, transportation and grid energy storage. Many materials are being researched for battery applications, with layered transition metal oxides (LTMO) the dominating cathode candidate with remarkable electrochemical performance. Yet, daunting challenges persist in the quest for further battery developments targeting lower cost, longer lifespan, improved energy density and enhanced safety. This is, in part, because of the intrinsic complexity of real-world batteries, featuring sophisticated interplay among microstructural, compositional and chemical heterogeneities, which has motivated tremendous research efforts using state-of-the-art analytical techniques. In this research field, synchrotron techniques have been identified as a suite of effective methods for advanced battery characterization in a non-destructive manner with sensitivities to the lattice, electronic and morphological structures. This article provides a holistic overview of cutting-edge developments in synchrotron-based research on LTMO battery cathode materials. We discuss the complexity and evolution of LTMO's material properties upon battery operation and review recent synchrotron-based research works that address the frontier challenges and provide novel insights in this field. Finally, we formulate a perspective on future directions of synchrotron-based battery research, involving next-generation X-ray facilities and advanced computational developments.

    View details for DOI 10.1093/nsr/nwab146

    View details for PubMedID 35145703

  • In Situ Visualization of Li-Whisker with Grating-Interferometry-Based Tricontrast X-ray Microtomography ACS MATERIALS LETTERS Zan, G., Qian, G., Gul, S., Pan, H., Li, Q., Li, J., Vine, D. J., Lewis, S., Yun, W., Pianetta, P., Li, H., Yu, X., Liu, Y. 2021; 3 (12): 1786-1792
  • Machine-and-data intelligence for synchrotron science NATURE REVIEWS PHYSICS Li, J., Huang, X., Pianetta, P., Liu, Y. 2021
  • Deep-learning-based image registration for nano-resolution tomographic reconstruction. Journal of synchrotron radiation Fu, T., Zhang, K., Wang, Y., Li, J., Zhang, J., Yao, C., He, Q., Wang, S., Huang, W., Yuan, Q., Pianetta, P., Liu, Y. 2021; 28 (Pt 6): 1909-1915

    Abstract

    Nano-resolution full-field transmission X-ray microscopy has been successfully applied to a wide range of research fields thanks to its capability of non-destructively reconstructing the 3D structure with high resolution. Due to constraints in the practical implementations, the nano-tomography data is often associated with a random image jitter, resulting from imperfections in the hardware setup. Without a proper image registration process prior to the reconstruction, the quality of the result will be compromised. Here a deep-learning-based image jitter correction method is presented, which registers the projective images with high efficiency and accuracy, facilitating a high-quality tomographic reconstruction. This development is demonstrated and validated using synthetic and experimental datasets. The method is effective and readily applicable to a broad range of applications. Together with this paper, the source code is published and adoptions and improvements from our colleagues in this field are welcomed.

    View details for DOI 10.1107/S1600577521008481

    View details for PubMedID 34738945

  • The role of structural defects in commercial lithium-ion batteries CELL REPORTS PHYSICAL SCIENCE Qian, G., Monaco, F., Meng, D., Lee, S., Zan, G., Li, J., Karpov, D., Gul, S., Vine, D., Stripe, B., Zhang, J., Lee, J., Ma, Z., Yun, W., Pianetta, P., Yu, X., Li, L., Cloeten, P., Liu, Y. 2021; 2 (9)
  • Novel Ultrabright and Air-Stable Photocathodes Discovered from Machine Learning and Density Functional Theory Driven Screening. Advanced materials (Deerfield Beach, Fla.) Antoniuk, E. R., Schindler, P., Schroeder, W. A., Dunham, B., Pianetta, P., Vecchione, T., Reed, E. J. 2021: e2104081

    Abstract

    The high brightness, low emittance electron beams achieved in modern X-ray free-electron lasers (XFELs) have enabled powerful X-ray imaging tools, allowing molecular systems to be imaged at picosecond time scales and sub-nanometer length scales. One of the most promising directions for increasing the brightness of XFELs is through the development of novel photocathode materials. Whereas past efforts aimed at discovering photocathode materials have typically employed trial-and-error-based iterative approaches, this work represents the first data-driven screening for high brightness photocathode materials. Through screening over 74 000 semiconducting materials, a vast photocathode dataset is generated, resulting in statistically meaningful insights into the nature of high brightness photocathode materials. This screening results in a diverse list of photocathode materials that exhibit intrinsic emittances that are up to 4x lower than currently used photocathodes. In a second effort, multiobjective screening is employed to identify the family of M2 O (M = Na, K, Rb) that exhibits photoemission properties that are comparable to the current state-of-the-art photocathode materials, but with superior air stability. This family represents perhaps the first intrinsically bright, visible light photocathode materials that are resistant to reactions with oxygen, allowing for their transport and storage in dry air environments.

    View details for DOI 10.1002/adma.202104081

    View details for PubMedID 34510594

  • Multiphase, Multiscale Chemomechanics at Extreme Low Temperatures: Battery Electrodes for Operation in a Wide Temperature Range ADVANCED ENERGY MATERIALS Li, J., Li, S., Zhang, Y., Yang, Y., Russi, S., Qian, G., Mu, L., Lee, S., Yang, Z., Lee, J., Pianetta, P., Qiu, J., Ratner, D., Cloetens, P., Zhao, K., Lin, F., Liu, Y. 2021
  • High-resolution multicontrast tomography with an X-ray microarray anode-structured target source. Proceedings of the National Academy of Sciences of the United States of America Zan, G., Gul, S., Zhang, J., Zhao, W., Lewis, S., Vine, D. J., Liu, Y., Pianetta, P., Yun, W. 2021; 118 (25)

    Abstract

    Multicontrast X-ray imaging with high resolution and sensitivity using Talbot-Lau interferometry (TLI) offers unique imaging capabilities that are important to a wide range of applications, including the study of morphological features with different physical properties in biological specimens. The conventional X-ray TLI approach relies on an absorption grating to create an array of micrometer-sized X-ray sources, posing numerous limitations, including technical challenges associated with grating fabrication for high-energy operations. We overcome these limitations by developing a TLI system with a microarray anode-structured target (MAAST) source. The MAAST features an array of precisely controlled microstructured metal inserts embedded in a diamond substrate. Using this TLI system, tomography of a Drum fish tooth with high resolution and tri-contrast (absorption, phase, and scattering) reveals useful complementary structural information that is inaccessible otherwise. The results highlight the exceptional capability of high-resolution multicontrast X-ray tomography empowered by the MAAST-based TLI method in biomedical applications.

    View details for DOI 10.1073/pnas.2103126118

    View details for PubMedID 34140413

  • Fast Li Plating Behavior Probed by X-ray Computed Tomography. Nano letters Pan, H., Fu, T., Zan, G., Chen, R., Yao, C., Li, Q., Pianetta, P., Zhang, K., Liu, Y., Yu, X., Li, H. 2021

    Abstract

    Uneven lithium plating/stripping is an essential issue that inhibits stable cycling of a lithium metal anode and thus hinders its practical applications. The investigation of this process is challenging because it is difficult to observe lithium in an operating device. Here, we demonstrate that the microscopic lithium plating behavior can be observed in situ in a close-to-practical cell setup using X-ray computed tomography. The results reveal the formation of porous structure and its progressive evolution in space over the charging process with a large current. The elaborated analysis indicates that the microstructure of deposited lithium makes a significant impact on the subsequent lithium plating, and the impact of structural inhomogeneity, further exaggerated by the large-current charging, can lead to severely uneven lithium plating and eventually cell failure. Therefore, a codesign strategy involving delicate controls of microstructure and electrochemical conditions could be a necessity for the next-generation battery with lithium metal anode.

    View details for DOI 10.1021/acs.nanolett.1c01389

    View details for PubMedID 34105964

  • Selective dopant segregation modulates mesoscale reaction kinetics in layered transition metal oxide NANO ENERGY Qian, G., Huang, H., Hou, F., Wang, W., Wang, Y., Lin, J., Lee, S., Yan, H., Chu, Y. S., Pianetta, P., Huang, X., Ma, Z., Li, L., Liu, Y. 2021; 84
  • Understanding multi-scale battery degradation with a macro-to-nano zoom through its hierarchy JOURNAL OF MATERIALS CHEMISTRY A Zan, G., Zhang, J., Monaco, F., Gul, S., Qian, G., Li, J., Vine, D. J., Cloetens, P., Yun, W., Pianetta, P., Liu, Y. 2021

    View details for DOI 10.1039/d1ta02262h

    View details for Web of Science ID 000660244800001

  • Understanding the Mesoscale Degradation in Nickel-Rich Cathode Materials through Machine-Learning-Revealed Strain-Redox Decoupling ACS ENERGY LETTERS Qian, G., Zhang, J., Chu, S., Li, J., Zhang, K., Yuan, Q., Ma, Z., Pianetta, P., Li, L., Jung, K., Liu, Y. 2021; 6 (2): 687–93
  • Automatic 3D image registration for nano-resolution chemical mapping using synchrotron spectro-tomography. Journal of synchrotron radiation Zhang, J., Hu, J., Jiang, Z., Zhang, K., Liu, P., Wang, C., Yuan, Q., Pianetta, P., Liu, Y. 2021; 28 (Pt 1): 278–82

    Abstract

    Nano-resolution synchrotron X-ray spectro-tomography has been demonstrated as a powerful tool for probing the three-dimensional (3D) structural and chemical heterogeneity of a sample. By reconstructing a number of tomographic data sets recorded at different X-ray energy levels, the energy-dependent intensity variation in every given voxel fingerprints the corresponding local chemistry. The resolution and accuracy of this method, however, could be jeopardized by non-ideal experimental conditions, e.g. instability in the hardware system and/or in the sample itself. Herein is presented one such case, in which unanticipated sample deformation severely degrades the data quality. To address this issue, an automatic 3D image registration method is implemented to evaluate and correct this effect. The method allows the redox heterogeneity in partially delithiated LixTa0.3Mn0.4O2 battery cathode particles to be revealed with significantly improved fidelity.

    View details for DOI 10.1107/S1600577520014691

    View details for PubMedID 33399578

  • Depth-dependent valence stratification driven by oxygen redox in lithium-rich layered oxide. Nature communications Zhang, J., Wang, Q., Li, S., Jiang, Z., Tan, S., Wang, X., Zhang, K., Yuan, Q., Lee, S., Titus, C. J., Irwin, K. D., Nordlund, D., Lee, J., Pianetta, P., Yu, X., Xiao, X., Yang, X., Hu, E., Liu, Y. 2020; 11 (1): 6342

    Abstract

    Lithium-rich nickel-manganese-cobalt (LirNMC) layered material is a promising cathode for lithium-ion batteries thanks to its large energy density enabled by coexisting cation and anion redox activities. It however suffers from a voltage decay upon cycling, urging for an in-depth understanding of the particle-level structure and chemical complexity. In this work, we investigate the Li1.2Ni0.13Mn0.54Co0.13O2 particles morphologically, compositionally, and chemically in three-dimensions. While the composition is generally uniform throughout the particle, the charging induces a strong depth dependency in transition metal valence. Such a valence stratification phenomenon is attributed to the nature of oxygen redox which is very likely mostly associated with Mn. The depth-dependent chemistry could be modulated by the particles' core-multi-shell morphology, suggesting a structural-chemical interplay. These findings highlight the possibility of introducing a chemical gradient to address the oxygen-loss-induced voltage fade in LirNMC layered materials.

    View details for DOI 10.1038/s41467-020-20198-w

    View details for PubMedID 33311507

  • Operando Tailoring of Defects and Strains in Corrugated beta-Ni(OH)2 Nanosheets for Stable and High-Rate Energy Storage. Advanced materials (Deerfield Beach, Fla.) Li, S., Sharma, N., Yu, C., Zhang, Y., Wan, G., Fu, R., Huang, H., Sun, X., Lee, S., Lee, J., Nordlund, D., Pianetta, P., Zhao, K., Liu, Y., Qiu, J. 2020: e2006147

    Abstract

    Nickel hydroxide represents a technologically important material for energy storage, such as hybrid supercapacitors. It has two different crystallographic polymorphs, alpha- and beta-Ni(OH)2 , showing advantages in either theoretical capacity or cycling/rate performance, manifesting a trade-off trend that needs to be optimized for practical applications. Here, the synergistic superiorities in both activity and stability of corrugated beta-Ni(OH)2 nanosheets are demonstrated through an electrochemical abuse approach. With 91% capacity retention after 10000 cycles, the corrugated beta-Ni(OH)2 nanosheets can deliver a gravimetric capacity of 457 C g-1 at a high current density of 30 A g-1 , which is nearly two and four times that of the regular alpha- and beta-Ni(OH)2 , respectively. Operando spectroscopy and finite element analysis reveal that greatly enhanced chemical activity and structural robustness can be attributed to the in situ tailored lattice defects and the strain-induced highly curved micromorphology. This work demonstrates a multi-scale defect-and-strain co-design strategy, which is helpful for rational design and tuned fabrication of next-generation electrode materials for stable and high-rate energy storage.

    View details for DOI 10.1002/adma.202006147

    View details for PubMedID 33270282

  • Hybrid real- and reciprocal-space full-field imaging with coherent illumination JOURNAL OF OPTICS Li, P., Wakatsuki, S., Pianetta, P. A., Liu, Y. 2020; 22 (11)
  • Hierarchical Defect Engineering for LiCoO2 through Low-Solubility Trace Element Doping CHEM Hong, Y., Huang, X., Wei, C., Wang, J., Zhang, J., Yan, H., Chu, Y. S., Pianetta, P., Xiao, R., Yu, X., Liu, Y., Li, H. 2020; 6 (10): 2759–69
  • Mutual modulation between surface chemistry and bulk microstructure within secondary particles of nickel-rich layered oxides. Nature communications Li, S., Jiang, Z., Han, J., Xu, Z., Wang, C., Huang, H., Yu, C., Lee, S., Pianetta, P., Ohldag, H., Qiu, J., Lee, J., Lin, F., Zhao, K., Liu, Y. 2020; 11 (1): 4433

    Abstract

    Surface lattice reconstruction is commonly observed in nickel-rich layered oxide battery cathode materials, causing unsatisfactory high-voltage cycling performance. However, the interplay of the surface chemistry and the bulk microstructure remains largely unexplored due to the intrinsic structural complexity and the lack of integrated diagnostic tools for a thorough investigation at complementary length scales. Herein, by combining nano-resolution X-ray probes in both soft and hard X-ray regimes, we demonstrate correlative surface chemical mapping and bulk microstructure imaging over a single charged LiNi0.8Mn0.1Co0.1O2 (NMC811) secondary particle. We reveal that the sub-particle regions with more micro cracks are associated with more severe surface degradation. A mechanism of mutual modulation between the surface chemistry and the bulk microstructure is formulated based on our experimental observations and finite element modeling. Such a surface-to-bulk reaction coupling effect is fundamentally important for the design of the next generation battery cathode materials.

    View details for DOI 10.1038/s41467-020-18278-y

    View details for PubMedID 32895388

  • Generalizable density functional theory based photoemission model for the accelerated development of photocathodes and other photoemissive devices PHYSICAL REVIEW B Antoniuk, E. R., Yue, Y., Zhou, Y., Schindler, P., Schroeder, W., Dunham, B., Pianetta, P., Vecchione, T., Reed, E. J. 2020; 101 (23)
  • Machine-learning-revealed statistics of the particle-carbon/binder detachment in lithium-ion battery cathodes. Nature communications Jiang, Z., Li, J., Yang, Y., Mu, L., Wei, C., Yu, X., Pianetta, P., Zhao, K., Cloetens, P., Lin, F., Liu, Y. 2020; 11 (1): 2310

    Abstract

    The microstructure of a composite electrode determines how individual battery particles are charged and discharged in a lithium-ion battery. It is a frontier challenge to experimentally visualize and, subsequently, to understand the electrochemical consequences of battery particles' evolving (de)attachment with the conductive matrix. Herein, we tackle this issue with a unique combination of multiscale experimental approaches, machine-learning-assisted statistical analysis, and experiment-informed mathematical modeling. Our results suggest that the degree of particle detachment is positively correlated with the charging rate and that smaller particles exhibit a higher degree of uncertainty in their detachment from the carbon/binder matrix. We further explore the feasibility and limitation of utilizing the reconstructed electron density as a proxy for the state-of-charge. Our findings highlight the importance of precisely quantifying the evolving nature of the battery electrode's microstructure with statistical confidence, which is a key to maximize the utility of active particles towards higher battery capacity.

    View details for DOI 10.1038/s41467-020-16233-5

    View details for PubMedID 32385347

  • Quantifying redox heterogeneity in single-crystalline LiCoO2 cathode particles. Journal of synchrotron radiation Wei, C., Hong, Y., Tian, Y., Yu, X., Liu, Y., Pianetta, P. 2020; 27 (Pt 3): 713–19

    Abstract

    Active cathode particles are fundamental architectural units for the composite electrode of Li-ion batteries. The microstructure of the particles has a profound impact on their behavior and, consequently, on the cell-level electrochemical performance. LiCoO2 (LCO, a dominant cathode material) is often in the form of well-shaped particles, a few micrometres in size, with good crystallinity. In contrast to secondary particles (an agglomeration of many fine primary grains), which are the other common form of battery particles populated with structural and chemical defects, it is often anticipated that good particle crystallinity leads to superior mechanical robustness and suppressed charge heterogeneity. Yet, sub-particle level charge inhomogeneity in LCO particles has been widely reported inthe literature, posing a frontier challenge in this field. Herein, this topic isrevisited and it is demonstrated that X-ray absorption spectra on single-crystalline particles with highly anisotropic lattice structures are sensitive to thepolarization configuration of the incident X-rays, causing some degree of ambiguity in analyzing the local spectroscopic fingerprint. To tackle this issue, a methodology is developed that extracts the white-line peak energy in the X-ray absorption near-edge structure spectra as a key data attribute for representing the local state of charge in the LCO crystal. This method demonstrates significantly improved accuracy and reveals the mesoscale chemical complexity in LCO particles with better fidelity. In addition to the implications on the importance of particle engineering for LCO cathodes, the method developed herein also has significant impact on spectro-microscopic studies of single-crystalline materials at synchrotron facilities, which is broadly applicable to a wide range of scientific disciplines well beyond battery research.

    View details for DOI 10.1107/S1600577520002076

    View details for PubMedID 32381772

  • Operando Revealing Dynamic Reconstruction of NiCo Carbonate Hydroxide for High-Rate Energy Storage JOULE Li, S., Zhang, Y., Liu, N., Yu, C., Lee, S., Zhou, S., Fu, R., Yang, J., Guo, W., Huang, H., Lee, J., Wang, C., Kim, T., Nordlund, D., Pianetta, P., Du, X., Zhao, J., Liu, Y., Qiu, J. 2020; 4 (3): 673–87
  • Revealing the inhomogeneous surface chemistry on the spherical layered oxide polycrystalline cathode particles CHINESE PHYSICS B Jiang, Z., Li, S., Xu, Z., Nordlund, D., Ohldag, H., Pianetta, P., Lee, J., Lin, F., Liu, Y. 2020; 29 (2)
  • Surface Photovoltage-Induced Ultralow Work Function Material for Thermionic Energy Converters ACS ENERGY LETTERS Schindler, P., Riley, D. C., Bargatin, I., Sahasrahuddhe, K., Schwede, J. W., Sun, S., Pianetta, P., Shen, Z., Howe, R. T., Melosh, N. A. 2019; 4 (10): 2436–43

    Abstract

    Low work function materials are essential for efficient thermionic energy converters (TECs), electronics, and electron emission devices. Much effort has been put into finding thermally stable material combinations that exhibit low work functions. Submonolayer coatings of alkali metals have proven to significantly reduce the work function; however, a work function less than 1 eV has not been reached. We report a record-low work function of 0.70 eV by inducing a surface photovoltage (SPV) in an n-type semiconductor with an alkali metal coating. Ultraviolet photoelectron spectroscopy indicates a work function of 1.06 eV for cesium/oxygen-activated GaAs consistent with density functional theory model predictions. By illuminating with a 532 nm laser we induce an additional shift down to 0.70 eV due to the SPV. Further, we apply the SPV to the collector of an experimental TEC and demonstrate an I-V curve shift consistent with the collector work function reduction. This method opens an avenue toward efficient TECs and next-generation electron emission devices.

    View details for DOI 10.1021/acsenergylett.9b01214

    View details for Web of Science ID 000490365500011

    View details for PubMedID 31633034

    View details for PubMedCentralID PMC6792473

  • Simultaneous three-dimensional elemental mapping of Hollandite and Pyrochlore material phases in ceramic waste form materials JOURNAL OF THE AMERICAN CERAMIC SOCIETY Damian, P. C., Cocco, A. P., Wrubel, J. A., Hong, T., Bordia, R. K., Liu, Y., Pianetta, P., Amoroso, J. W., Brinkman, K. S., Chiu, W. S. 2019; 102 (9): 5620–31

    View details for DOI 10.1111/jace.16371

    View details for Web of Science ID 000479010400059

  • Quantification of Heterogeneous Degradation in Li-Ion Batteries ADVANCED ENERGY MATERIALS Yang, Y., Xu, R., Zhang, K., Lee, S., Mu, L., Liu, P., Waters, C. K., Spence, S., Xu, Z., Wei, C., Kautz, D. J., Yuan, Q., Dong, Y., Yu, Y., Xiao, X., Lee, H., Pianetta, P., Cloetens, P., Lee, J., Zhao, K., Lin, F., Liu, Y. 2019; 9 (25)
  • High-Voltage Charging-Induced Strain, Heterogeneity, and Micro-Cracks in Secondary Particles of a Nickel-Rich Layered Cathode Material ADVANCED FUNCTIONAL MATERIALS Mao, Y., Wang, X., Xia, S., Zhang, K., Wei, C., Bak, S., Shadike, Z., Liu, X., Yang, Y., Xu, R., Pianetta, P., Ermon, S., Stavitski, E., Zhao, K., Xu, Z., Lin, F., Yang, X., Hu, E., Liu, Y. 2019; 29 (18)
  • Surface-to-Bulk Redox Coupling through Thermally Driven Li Redistribution in Li- and Mn-Rich Layered Cathode Materials. Journal of the American Chemical Society Li, S. n., Lee, S. J., Wang, X. n., Yang, W. n., Huang, H. n., Swetz, D. S., Doriese, W. B., O'Neil, G. C., Ullom, J. N., Titus, C. J., Irwin, K. D., Lee, H. K., Nordlund, D. n., Pianetta, P. n., Yu, C. n., Qiu, J. n., Yu, X. n., Yang, X. Q., Hu, E. n., Lee, J. S., Liu, Y. n. 2019

    Abstract

    Li- and Mn-rich (LMR) layered cathode materials have demonstrated impressive capacity and specific energy density thanks to their intertwined redox centers including transition metal cations and oxygen anions. Although tremendous efforts have been devoted to the investigation of the electrochemically driven redox evolution in LMR cathode at ambient temperature, their behavior under a mildly elevated temperature (up to ∼100 °C), with or without electrochemical driving force, remains largely unexplored. Here we show a systematic study of the thermally driven surface-to-bulk redox coupling effect in charged Li1.2Ni0.15Co0.1Mn0.55O2. We for the first time observed a charge transfer between the bulk oxygen anions and the surface transition metal cations under ∼100 °C, which is attributed to the thermally driven redistribution of Li ions. This finding highlights the nonequilibrium state and dynamic nature of the LMR material at deeply delithiated state upon a mild temperature perturbation.

    View details for DOI 10.1021/jacs.9b05349

    View details for PubMedID 31287957

  • Thermally driven mesoscale chemomechanical interplay in Li0.5Ni0.6Mn0.2Co0.2O2 cathode materials JOURNAL OF MATERIALS CHEMISTRY A Wei, C., Zhang, Y., Lee, S., Mu, L., Liu, J., Wang, C., Yang, Y., Doeff, M., Pianetta, P., Nordlund, D., Du, X., Tian, Y., Zhao, K., Lee, J., Lin, F., Liu, Y. 2018; 6 (45): 23055–61

    View details for DOI 10.1039/c8ta08973f

    View details for Web of Science ID 000451738200071

  • Chemomechanical interplay of layered cathode materials undergoing fast charging in lithium batteries NANO ENERGY Xia, S., Mu, L., Xu, Z., Wang, J., Wei, C., Liu, L., Pianetta, P., Zhao, K., Yu, X., Lin, F., Liu, Y. 2018; 53: 753–62
  • Automatic projection image registration for nanoscale X-ray tomographic reconstruction. Journal of synchrotron radiation Yu, H., Xia, S., Wei, C., Mao, Y., Larsson, D., Xiao, X., Pianetta, P., Yu, Y. S., Liu, Y. 2018; 25 (Pt 6): 1819–26

    Abstract

    Novel developments in X-ray sources, optics and detectors have significantly advanced the capability of X-ray microscopy at the nanoscale. Depending on the imaging modality and the photon energy, state-of-the-art X-ray microscopes are routinely operated at a spatial resolution of tens of nanometres for hard X-rays or 10 nm for soft X-rays. The improvement in spatial resolution, however, has led to challenges in the tomographic reconstruction due to the fact that the imperfections of the mechanical system become clearly detectable in the projection images. Without proper registration of the projection images, a severe point spread function will be introduced into the tomographic reconstructions, causing the reduction of the three-dimensional (3D) spatial resolution as well as the enhancement of image artifacts. Here the development of a method that iteratively performs registration of the experimentally measured projection images to those that are numerically calculated by reprojecting the 3D matrix in the corresponding viewing angles is shown. Multiple algorithms are implemented to conduct the registration, which corrects the translational and/or the rotational errors. A sequence that offers a superior performance is presented and discussed. Going beyond the visual assessment of the reconstruction results, the morphological quantification of a battery electrode particle that has gone through substantial cycling is investigated. The results show that the presented method has led to a better quality tomographic reconstruction, which, subsequently, promotes the fidelity in the quantification of the sample morphology.

    View details for DOI 10.1107/S1600577518013929

    View details for PubMedID 30407194

  • Understanding the Effect of Local Short-Range Ordering on Lithium Diffusion in Li1.3Nb0.3Mn0.4O2 Single-Crystal Cathode CHEM Kan, W., Deng, B., Xu, Y., Shukla, A., Bo, T., Zhang, S., Liu, J., Pianetta, P., Wang, B., Liu, Y., Chen, G. 2018; 4 (9): 2108–23
  • Propagation topography of redox phase transformations in heterogeneous layered oxide cathode materials NATURE COMMUNICATIONS Mu, L., Yuan, Q., Tian, C., Wei, C., Zhang, K., Liu, J., Pianetta, P., Doeff, M. M., Liu, Y., Lin, F. 2018; 9: 2810

    Abstract

    Redox phase transformations are relevant to a number of metrics pertaining to the electrochemical performance of batteries. These phase transformations deviate from and are more complicated than the conventional theory of phase nucleation and propagation, owing to simultaneous changes of cationic and anionic valence states as well as the polycrystalline nature of battery materials. Herein, we propose an integrative approach of mapping valence states and constructing chemical topographies to investigate the redox phase transformation in polycrystalline layered oxide cathode materials under thermal abuse conditions. We discover that, in addition to the three-dimensional heterogeneous phase transformation, there is a mesoscale evolution of local valence curvatures in valence state topographies. The relative probability of negative and positive local valence curvatures alternates during the layered-to-spinel/rocksalt phase transformation. The implementation of our method can potentially provide a universal approach to study phase transformation behaviors in battery materials and beyond.

    View details for PubMedID 30022082

  • Mesoscale Battery Science: The Behavior of Electrode Particles Caught on a Multispectral X-ray Camera. Accounts of chemical research Wei, C., Xia, S., Huang, H., Mao, Y., Pianetta, P., Liu, Y. 2018

    Abstract

    Functional materials and devices are usually morphologically complex and chemically heterogeneous. Their structures are often designed to be hierarchical because of the desired functionalities, which usually require many different components to work together in a coherent manner. The lithium ion battery, as an energy storage device, is a very typical example of this kind of structure. In a lithium ion battery, the cathode, anode, and separator are soaked in a liquid electrolyte, facilitating the back and forward shuttling of the lithium ions for energy storage and release. The desired performance of a lithium ion battery has many different aspects that need to be engineered and balanced depending on the targeted applications. In most cases, the cathode material has become the limiting factor for further improvements and, thus, has attracted intense attention from the research community. While the improvement in the overall performance of the lithium ion battery is the ultimate goal of the research in this field, understanding the relationship between the microscopic properties and the macroscopic behaviors of the materials/devices can inform the design of better battery chemistries for practical applications. As a result, it is of great fundamental and practical importance to investigate the electrode materials using experimental probes that can provide good chemical sensitivity and sufficient spatial resolution, ideally, under operating conditions. With this motivation, our group has been focusing on the development of the nanoscale full-field X-ray spectro-microscopy, which has now become a well-recognized tool for imaging battery electrode materials at the particle level. With nanoscale spatial resolution, this technique can effectively and efficiently tackle the intrinsically complicated mesoscale chemistry. It allows us to monitor the particles' morphological and chemical evolution upon battery operation, providing valuable insights that can be incorporated into the design of new battery chemistries. In this Account, we review a series of our recent studies of battery electrode materials using nanoscale full-field X-ray spectro-microscopy. The materials that are the subjects of our studies, including layer-structured and spinel-structured oxide cathodes, are technically very important as they not only play an important role in today's devices but also possess promising potential for future developments. We discuss how the subparticle level compositional and state-of-charge heterogeneity can be visualized and linked to the bulk performance through systematic quantification of the imaging data. Subsequently, we highlight recent ex situ and in situ observations of the cathode particles' response to different reaction conditions, including the spontaneously adjusted reaction pathways and the morphological changes for the mechanical strain release. The important role of surface chemistry in the system is also discussed. While the microscopic investigation at the particle level provides useful insights, the degree to which this represents the overall properties of the battery is always a question for further generalizing the conclusions. In order to address this concern, we finally discuss a high throughput experimental approach, in which a large number of cathode particles are scanned. We discuss a case study that demonstrates the identification and analysis of functionally important minority phases in an operating battery cell through big data mining methods. With an emphasis on the data/information mining aspect of the nanoscale X-ray spectro-microscopic study of battery cathode particles, we anticipate that this Account will attract more research to this field.

    View details for DOI 10.1021/acs.accounts.8b00123

    View details for PubMedID 29889493

  • Intensity modulation of the Shirley background of the Cr 3p spectra with photon energies around the Cr 2p edge SURFACE AND INTERFACE ANALYSIS Herrera-Gomez, A., Cabrera-German, D., Dutoi, A. D., Vazquez-Lepe, M., Aguirre-Tostado, S., Pianetta, P., Nordlund, D., Cortazar-Martinez, O., Torres-Ochoa, A., Ceballos-Sanchez, O., Gomez-Munoz, L. 2018; 50 (2): 246–52

    View details for DOI 10.1002/sia.6364

    View details for Web of Science ID 000425944500015

  • Finding a Needle in the Haystack: Identification of Functionally Important Minority Phases in an Operating Battery NANO LETTERS Zhang, K., Ren, F., Wang, X., Hu, E., Xu, Y., Yang, X., Li, H., Chen, L., Pianetta, P., Mehta, A., Yu, X., Liu, Y. 2017; 17 (12): 7782–88
  • Three-dimensional mapping of crystalline ceramic waste form materials JOURNAL OF THE AMERICAN CERAMIC SOCIETY Cocco, A. P., DeGostin, M. B., Wrubel, J. A., Damian, P. J., Hong, T., Xu, Y., Liu, Y., Pianetta, P., Amoroso, J. W., Brinkman, K. S., Chiu, W. S. 2017; 100 (8): 3722-3735

    View details for DOI 10.1111/jace.14885

    View details for Web of Science ID 000408731300043

  • In situ Visualization of State-of-Charge Heterogeneity within a LiCoO2 Particle that Evolves upon Cycling at Different Rates ACS ENERGY LETTERS Xu, Y., Hu, E., Zhang, K., Wang, X., Borzenets, V., Sun, Z., Pianetta, P., Yu, X., Liu, Y., Yang, X., Li, H. 2017; 2 (5): 1240-1245
  • Ultrasensitive probing of the local electronic structure of nitrogen doped carbon and its applications to 2D electronics, catalysis and bio-physics Lee, S., Mori, R., Alpert, B., Baker, M., Berry, J., Cho, H., Denison, E., Doriese, W., Fowler, J., Gaffney, K., Gao, B., Gard, J., Hilton, G., Irwin, K., Joe, Y., Kaya, S., Kenney, C., Knight, J., Kroll, T., Li, D., Marks, R., Minitti, M., Morgan, K., Nordlund, D., O'Neil, G., Ogasawara, H., Pianetta, P., Reintsema, C., Schiros, T., Schmidt, D., Sokaras, D., Song, Y., Swetz, D., Titus, C., Ullom, J., Weng, T., Williams, C., Wolcott, A., Young, B. AMER CHEMICAL SOC. 2017
  • Applications of x-ray tomography across multiple length scales Pianetta, P. AMER CHEMICAL SOC. 2017
  • Back-gated graphene anode for more efficient thermionic energy converters NANO ENERGY Yuan, H., Riley, D. C., Shen, Z., Pianetta, P. A., Melosh, N. A., Howe, R. T. 2017; 32: 67-72
  • Determination of copper nanoparticle size distributions with total reflection X-ray fluorescence spectroscopy JOURNAL OF SYNCHROTRON RADIATION Singh, A., Luening, K., Brennan, S., Homma, T., Kubo, N., Nowak, S. H., Pianetta, P. 2017; 24: 283-287

    Abstract

    Total reflection X-ray fluorescence (TXRF) analysis is extensively used by the semiconductor industry for measuring trace metal contamination on silicon surfaces. In addition to determining the quantity of impurities on a surface, TXRF can reveal information about the vertical distribution of contaminants by measuring the fluorescence signal as a function of the angle of incidence. In this study, two samples were intentionally contaminated with copper in non-deoxygenated and deoxygenated ultrapure water (UPW) resulting in impurity profiles that were either atomically dispersed in a thin film or particle-like, respectively. The concentration profile of the samples immersed into deoxygenated UPW was calculated using a theoretical concentration profile representative of particles, yielding a mean particle height of 16.1 nm. However, the resulting theoretical profile suggested that a distribution of particle heights exists on the surface. The fit of the angular distribution data was further refined by minimizing the residual error of a least-squares fit employing a model with a Gaussian distribution of particle heights about the mean height. The presence of a height distribution was also confirmed with atomic force microscopy measurements.

    View details for DOI 10.1107/S1600577516015484

    View details for Web of Science ID 000391724900028

    View details for PubMedID 28009568

  • Analysis of Cathodic Reaction Process of SiCl4 during Si Electrodeposition in Ionic Liquids JOURNAL OF THE ELECTROCHEMICAL SOCIETY Tsuyuki, Y., Fujimura, T., Kunimoto, M., Fukunaka, Y., Pianetta, P., Homma, T. 2017; 164 (14): D994–D998
  • Unsupervised Data Mining in nanoscale X-ray Spectro-Microscopic Study of NdFeB Magnet SCIENTIFIC REPORTS Duan, X., Yang, F., Antono, E., Yang, W., Pianetta, P., Ermon, S., Mehta, A., Liu, Y. 2016; 6

    Abstract

    Novel developments in X-ray based spectro-microscopic characterization techniques have increased the rate of acquisition of spatially resolved spectroscopic data by several orders of magnitude over what was possible a few years ago. This accelerated data acquisition, with high spatial resolution at nanoscale and sensitivity to subtle differences in chemistry and atomic structure, provides a unique opportunity to investigate hierarchically complex and structurally heterogeneous systems found in functional devices and materials systems. However, handling and analyzing the large volume data generated poses significant challenges. Here we apply an unsupervised data-mining algorithm known as DBSCAN to study a rare-earth element based permanent magnet material, Nd2Fe14B. We are able to reduce a large spectro-microscopic dataset of over 300,000 spectra to 3, preserving much of the underlying information. Scientists can easily and quickly analyze in detail three characteristic spectra. Our approach can rapidly provide a concise representation of a large and complex dataset to materials scientists and chemists. For example, it shows that the surface of common Nd2Fe14B magnet is chemically and structurally very different from the bulk, suggesting a possible surface alteration effect possibly due to the corrosion, which could affect the material's overall properties.

    View details for DOI 10.1038/srep34406

    View details for Web of Science ID 000384188300001

    View details for PubMedID 27680388

    View details for PubMedCentralID PMC5041149

  • Interface Engineering for Atomic Layer Deposited Alumina Gate Dielectric on SiGe Substrates. ACS applied materials & interfaces Zhang, L., Guo, Y., Hassan, V. V., Tang, K., Foad, M. A., Woicik, J. C., Pianetta, P., Robertson, J., McIntyre, P. C. 2016; 8 (29): 19110-19118

    Abstract

    Optimization of the interface between high-k dielectrics and SiGe substrates is a challenging topic due to the complexity arising from the coexistence of Si and Ge interfacial oxides. Defective high-k/SiGe interfaces limit future applications of SiGe as a channel material for electronic devices. In this paper, we identify the surface layer structure of as-received SiGe and Al2O3/SiGe structures based on soft and hard X-ray photoelectron spectroscopy. As-received SiGe substrates have native SiOx/GeOx surface layers, where the GeOx-rich layer is beneath a SiOx-rich surface. Silicon oxide regrows on the SiGe surface during Al2O3 atomic layer deposition, and both SiOx and GeOx regrow during forming gas anneal in the presence of a Pt gate metal. The resulting mixed SiOx-GeOx interface layer causes large interface trap densities (Dit) due to distorted Ge-O bonds across the interface. In contrast, we observe that oxygen-scavenging Al top gates decompose the underlying SiOx/GeOx, in a selective fashion, leaving an ultrathin SiOx interfacial layer that exhibits dramatically reduced Dit.

    View details for DOI 10.1021/acsami.6b03331

    View details for PubMedID 27345195

  • Recent applications of hard x-ray photoelectron spectroscopy JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A Weiland, C., Rumaiz, A. K., Pianetta, P., Woicik, J. C. 2016; 34 (3)

    View details for DOI 10.1116/1.4946046

    View details for Web of Science ID 000379792200001

  • Reverse engineering ancient Athenian pottery: A collaboration between cultural heritage, industry, and academia Trentelman, K., Cianchetta, I., Walton, M., Mehta, A., Pianetta, P., Foran, B., Saunders, D., Maish, J. AMER CHEMICAL SOC. 2016
  • Imaging of hierarchical structures with x-rays Pianetta, P. AMER CHEMICAL SOC. 2016
  • To get the most out of high resolution X-ray tomography: A review of the post-reconstruction analysis SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY Liu, Y., Kiss, A. M., Larsson, D. H., Yang, F., Pianetta, P. 2016; 117: 29-41
  • Formation of Si1+ in the early stages of the oxidation of the Si[001] 2x1 surface JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A Herrera-Gomez, A., Aguirre-Tostado, F., Pianetta, P. 2016; 34 (2)

    View details for DOI 10.1116/1.4936336

    View details for Web of Science ID 000372352300009

  • Characterization of electronic structure of periodically strained graphene APPLIED PHYSICS LETTERS Aslani, M., Garner, C. M., Kumar, S., Nordlund, D., Pianetta, P., Nishi, Y. 2015; 107 (18)

    View details for DOI 10.1063/1.4934701

    View details for Web of Science ID 000364580800063

  • Engineering Ultra-Low Work Function of Graphene NANO LETTERS Yuan, H., Chang, S., Bargatin, I., Wang, N. C., Riley, D. C., Wang, H., Schwede, J. W., Provine, J., Pop, E., Shen, Z., Pianetta, P. A., Melosh, N. A., Howe, R. T. 2015; 15 (10): 6475-6480

    Abstract

    Low work function materials are critical for energy conversion and electron emission applications. Here, we demonstrate for the first time that an ultralow work function graphene is achieved by combining electrostatic gating with a Cs/O surface coating. A simple device is built from large-area monolayer graphene grown by chemical vapor deposition, transferred onto 20 nm HfO2 on Si, enabling high electric fields capacitive charge accumulation in the graphene. We first observed over 0.7 eV work function change due to electrostatic gating as measured by scanning Kelvin probe force microscopy and confirmed by conductivity measurements. The deposition of Cs/O further reduced the work function, as measured by photoemission in an ultrahigh vacuum environment, which reaches nearly 1 eV, the lowest reported to date for a conductive, nondiamond material.

    View details for DOI 10.1021/acs.nanolett.5b01916

    View details for PubMedID 26401728

  • High gradient rf gun studies of CsBr photocathodes PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS Vecchione, T., Maldonado, J. R., Gierman, S., Corbett, J., Hartmann, N., Pianetta, P. A., Hesselink, L., Schmerge, J. F. 2015; 18 (4)
  • Registration of the rotation axis in X-ray tomography. Journal of synchrotron radiation Yang, Y., Yang, F., Hingerl, F. F., Xiao, X., Liu, Y., Wu, Z., Benson, S. M., Toney, M. F., Andrews, J. C., Pianetta, P. 2015; 22: 452-457

    Abstract

    There is high demand for efficient, robust and automated routines for tomographic data reduction, particularly for synchrotron data. Registration of the rotation axis in data processing is a critical step affecting the quality of the reconstruction and is not easily implemented with automation. Existing methods for calculating the center of rotation have been reviewed and an improved algorithm to register the rotation axis in tomographic data is presented. The performance of the proposed method is evaluated using synchrotron-based microtomography data on geological samples with and without artificial reduction of the signal-to-noise ratio. The proposed method improves the reconstruction quality by correcting both the tilting error and the translational offset of the rotation axis. The limitation of this promising method is also discussed.

    View details for DOI 10.1107/S160057751402726X

    View details for PubMedID 25723947

  • Evidence for an unorthodox firing sequence employed by the Berlin Painter: deciphering ancient ceramic firing conditions through high-resolution material characterization and replication JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY Cianchetta, I., Trentelman, K., Maish, J., Saunders, D., Foran, B., Walton, M., Sciau, P., Wang, T., Pouyet, E., Cotte, M., Meirer, F., Liu, Y., Pianetta, P., Mehta, A. 2015; 30 (3): 666-676

    View details for DOI 10.1039/c4ja00376d

    View details for Web of Science ID 000350650800012

  • Nanoscale Morphological and Chemical Changes of High Voltage Lithium Manganese Rich NMC Composite Cathodes with Cycling NANO LETTERS Yang, F., Liu, Y., Martha, S. K., Wu, Z., Andrews, J. C., Ice, G. E., Pianetta, P., Nanda, J. 2014; 14 (8): 4334-4341

    Abstract

    Understanding the evolution of chemical composition and morphology of battery materials during electrochemical cycling is fundamental to extending battery cycle life and ensuring safety. This is particularly true for the much debated high energy density (high voltage) lithium-manganese rich cathode material of composition Li(1 + x)M(1 - x)O2 (M = Mn, Co, Ni). In this study we combine full-field transmission X-ray microscopy (TXM) with X-ray absorption near edge structure (XANES) to spatially resolve changes in chemical phase, oxidation state, and morphology within a high voltage cathode having nominal composition Li1.2Mn0.525Ni0.175Co0.1O2. Nanoscale microscopy with chemical/elemental sensitivity provides direct quantitative visualization of the cathode, and insights into failure. Single-pixel (∼ 30 nm) TXM XANES revealed changes in Mn chemistry with cycling, possibly to a spinel conformation and likely including some Mn(II), starting at the particle surface and proceeding inward. Morphological analysis of the particles revealed, with high resolution and statistical sampling, that the majority of particles adopted nonspherical shapes after 200 cycles. Multiple-energy tomography showed a more homogeneous association of transition metals in the pristine particle, which segregate significantly with cycling. Depletion of transition metals at the cathode surface occurs after just one cycle, likely driven by electrochemical reactions at the surface.

    View details for DOI 10.1021/nl502090z

    View details for Web of Science ID 000340446200021

    View details for PubMedID 25054780

    View details for PubMedCentralID PMC4134180

  • A cesium bromide photocathode excited by 405 nm radiation APPLIED PHYSICS LETTERS Maldonado, J. R., Cheng, Y. T., Pianetta, P., Pease, F. W., Hesselink, L. 2014; 105 (2)

    View details for DOI 10.1063/1.4890538

    View details for Web of Science ID 000341151400008

  • Recent advances in synchrotron-based hard x-ray phase contrast imaging JOURNAL OF PHYSICS D-APPLIED PHYSICS Liu, Y., Nelson, J., HOLZNER, C., Andrews, J. C., Pianetta, P. 2013; 46 (49)
  • The plastic nature of the human bone-periodontal ligament-tooth fibrous joint BONE Ho, S. P., Kurylo, M. P., Grandfield, K., Hurng, J., Herber, R., Ryder, M. I., Altoe, V., Aloni, S., Feng, J. Q., Webb, S., Marshall, G. W., Curtis, D., Andrews, J. C., Pianetta, P. 2013; 57 (2): 455-467

    Abstract

    This study investigates bony protrusions within a narrowed periodontal ligament space (PDL-space) of a human bone-PDL-tooth fibrous joint by mapping structural, biochemical, and mechanical heterogeneity. Higher resolution structural characterization was achieved via complementary atomic force microscopy (AFM), nano-transmission X-ray microscopy (nano-TXM), and microtomography (MicroXCT™). Structural heterogeneity was correlated to biochemical and elemental composition, illustrated via histochemistry and microprobe X-ray fluorescence analysis (μ-XRF), and mechanical heterogeneity evaluated by AFM-based nanoindentation. Results demonstrated that the narrowed PDL-space was due to invasion of bundle bone (BB) into PDL-space. Protruded BB had a wider range with higher elastic modulus values (2-8GPa) compared to lamellar bone (0.8-6GPa), and increased quantities of Ca, P and Zn as revealed by μ-XRF. Interestingly, the hygroscopic 10-30μm interface between protruded BB and lamellar bone exhibited higher X-ray attenuation similar to cement lines and lamellae within bone. Localization of the small leucine rich proteoglycan biglycan (BGN) responsible for mineralization was observed at the PDL-bone interface and around the osteocyte lacunae. Based on these results, it can be argued that the LB-BB interface was the original site of PDL attachment, and that the genesis of protruded BB identified as protrusions occurred as a result of shift in strain. We emphasize the importance of bony protrusions within the context of organ function and that additional study is warranted.

    View details for DOI 10.1016/j.bone.2013.09.007

    View details for Web of Science ID 000326848000018

    View details for PubMedID 24063947

    View details for PubMedCentralID PMC3938967

  • Microgravity Induces Pelvic Bone Loss through Osteoclastic Activity, Osteocytic Osteolysis, and Osteoblastic Cell Cycle Inhibition by CDKN1a/p21 PLOS ONE Blaber, E. A., Dvorochkin, N., Lee, C., Alwood, J. S., Yousuf, R., Pianetta, P., Globus, R. K., Burns, B. P., Almeida, E. A. 2013; 8 (4)

    Abstract

    Bone is a dynamically remodeled tissue that requires gravity-mediated mechanical stimulation for maintenance of mineral content and structure. Homeostasis in bone occurs through a balance in the activities and signaling of osteoclasts, osteoblasts, and osteocytes, as well as proliferation and differentiation of their stem cell progenitors. Microgravity and unloading are known to cause osteoclast-mediated bone resorption; however, we hypothesize that osteocytic osteolysis, and cell cycle arrest during osteogenesis may also contribute to bone loss in space. To test this possibility, we exposed 16-week-old female C57BL/6J mice (n = 8) to microgravity for 15-days on the STS-131 space shuttle mission. Analysis of the pelvis by µCT shows decreases in bone volume fraction (BV/TV) of 6.29%, and bone thickness of 11.91%. TRAP-positive osteoclast-covered trabecular bone surfaces also increased in microgravity by 170% (p = 0.004), indicating osteoclastic bone degeneration. High-resolution X-ray nanoCT studies revealed signs of lacunar osteolysis, including increases in cross-sectional area (+17%, p = 0.022), perimeter (+14%, p = 0.008), and canalicular diameter (+6%, p = 0.037). Expression of matrix metalloproteinases (MMP) 1, 3, and 10 in bone, as measured by RT-qPCR, was also up-regulated in microgravity (+12.94, +2.98 and +16.85 fold respectively, p<0.01), with MMP10 localized to osteocytes, and consistent with induction of osteocytic osteolysis. Furthermore, expression of CDKN1a/p21 in bone increased 3.31 fold (p<0.01), and was localized to osteoblasts, possibly inhibiting the cell cycle during tissue regeneration as well as conferring apoptosis resistance to these cells. Finally the apoptosis inducer Trp53 was down-regulated by -1.54 fold (p<0.01), possibly associated with the quiescent survival-promoting function of CDKN1a/p21. In conclusion, our findings identify the pelvic and femoral region of the mouse skeleton as an active site of rapid bone loss in microgravity, and indicate that this loss is not limited to osteoclastic degradation. Therefore, this study offers new evidence for microgravity-induced osteocytic osteolysis, and CDKN1a/p21-mediated osteogenic cell cycle arrest.

    View details for DOI 10.1371/journal.pone.0061372

    View details for Web of Science ID 000317908700027

    View details for PubMedID 23637819

    View details for PubMedCentralID PMC3630201

  • Three-dimensional microstructural mapping of poisoning phases in the Neodymium Nickelate solid oxide fuel cell cathode SOLID STATE IONICS Harris, W. M., Lombardo, J. J., DeGostin, M. B., Nelson, G. J., Luebbe, H., Schuler, J. A., Van herle, J., Andrews, J. C., Liu, Y., Pianetta, P., Chen, Y. K., Wang, J., Chiu, W. K. 2013; 237: 16-21
  • Nanoscale Examination of Microdamage in Sheep Cortical Bone Using Synchrotron Radiation Transmission X-Ray Microscopy PLOS ONE Brock, G. R., Kim, G., Ingraffea, A. R., Andrews, J. C., Pianetta, P., van der Meulen, M. C. 2013; 8 (3)

    Abstract

    Microdamage occurs in bone through repeated and excessive loading. Accumulation of microdamage weakens bone, leading to a loss of strength, stiffness and energy dissipation in the tissue. Imaging techniques used to examine microdamage have typically been limited to the microscale. In the current study microdamage was examined at the nanoscale using transmission x-ray microscopy with an x-ray negative stain, lead-uranyl acetate. Microdamage was generated in notched and unnotched beams of sheep cortical bone (2×2×20 mm), with monotonic and fatigue loading. Bulk sections were removed from beams and stained with lead-uranyl acetate to identify microdamage. Samples were sectioned to 50 microns and imaged using transmission x-ray microscopy producing projection images of microdamage with nanoscale resolution. Staining indicated microdamage occurred in both the tensile and compressive regions. A comparison between monotonic and fatigue loading indicated a statistically significant greater amount of stain present in fatigue loaded sections. Microdamage occurred in three forms: staining to existing bone structures, cross hatch damage and a single crack extending from the notch tip. Comparison to microcomputed tomography demonstrated differences in damage morphology and total damage between the microscale and nanoscale. This method has future applications for understanding the underlying mechanisms for microdamage formation as well as three-dimensional nanoscale examination of microdamage.

    View details for DOI 10.1371/journal.pone.0057942

    View details for Web of Science ID 000315637900064

    View details for PubMedID 23472121

    View details for PubMedCentralID PMC3589441

  • In Vacuo Photoemission Studies of Platinum Atomic Layer Deposition Using Synchrotron Radiation JOURNAL OF PHYSICAL CHEMISTRY LETTERS Geyer, S. M., Methaapanon, R., Shong, B., Pianetta, P. A., Bent, S. F. 2013; 4 (1): 176-179

    Abstract

    The mechanism of platinum atomic layer deposition using (methylcyclopentadienyl)trimethylplatinum and oxygen is investigated with in vacuo photoemission spectroscopy at the Stanford Synchrotron Radiation Lightsource. With this surface-sensitive technique, the surface species following the Pt precursor half cycle and the oxygen counter-reactant half cycle can be directly measured. We observed significant amounts of carbonaceous species following the Pt precursor pulse, consistent with dehydrogenation of the precursor ligands. Significantly more carbon is observed when deposition is carried out in the thermal decomposition temperature region. The carbonaceous layer is removed during the oxygen counter reactant pulse, and the photoemission spectrum shows that a layer of adsorbed oxygen remains on the surface as previously predicted.

    View details for DOI 10.1021/jz301475z

    View details for Web of Science ID 000313142000029

  • In Vacuo Photoemission Studies of Platinum Atomic Layer Deposition Using Synchrotron Radiation. The journal of physical chemistry letters Geyer, S. M., Methaapanon, R., Shong, B., Pianetta, P. A., Bent, S. F. 2013; 4 (1): 176-9

    Abstract

    The mechanism of platinum atomic layer deposition using (methylcyclopentadienyl)trimethylplatinum and oxygen is investigated with in vacuo photoemission spectroscopy at the Stanford Synchrotron Radiation Lightsource. With this surface-sensitive technique, the surface species following the Pt precursor half cycle and the oxygen counter-reactant half cycle can be directly measured. We observed significant amounts of carbonaceous species following the Pt precursor pulse, consistent with dehydrogenation of the precursor ligands. Significantly more carbon is observed when deposition is carried out in the thermal decomposition temperature region. The carbonaceous layer is removed during the oxygen counter reactant pulse, and the photoemission spectrum shows that a layer of adsorbed oxygen remains on the surface as previously predicted.

    View details for DOI 10.1021/jz301475z

    View details for PubMedID 26291229

  • Portable atomic layer deposition reactor for in situ synchrotron photoemission studies. Review of scientific instruments Methaapanon, R., Geyer, S. M., Hagglund, C., Pianetta, P. A., Bent, S. F. 2013; 84 (1): 015104-?

    Abstract

    We report the design of a portable atomic layer deposition (ALD) reactor that can be integrated into synchrotron facilities for in situ synchrotron photoemission studies. The design allows for universal installation of the system onto different beam line end stations. The ALD reactor operates as a fully functional, low vacuum deposition system under the conditions of a typical ALD reactor while allowing the samples to be analyzed in an ultrahigh vacuum (UHV) chamber through a quick transfer without vacuum break. This system not only minimizes the exposure of the UHV chamber to the ALD reactants, but it also eliminates the necessity of a beam alignment step after installation. The system has been successfully installed at the synchrotron and tested in the mechanistic studies of platinum ALD following individual half reaction cycles.

    View details for DOI 10.1063/1.4773230

    View details for PubMedID 23387692

  • Study on the synthesis-microstructure-performance relationship of layered Li-excess nickel-manganese oxide as a Li-ion battery cathode prepared by high-temperature calcination JOURNAL OF MATERIALS CHEMISTRY A Chen, W., Song, Y., Wang, C., Liu, Y., Morris, D. T., Pianetta, P. A., Andrews, J. C., Wu, H., Wu, N. 2013; 1 (36): 10847-10856

    View details for DOI 10.1039/c3ta11716b

    View details for Web of Science ID 000323276200035

  • Data-processing strategies for nano-tomography with elemental specification SPIE X-ray Nanoimaging Conference - Instruments and Methods Liu, Y., Cats, K. H., Weker, J. N., Andrews, J. C., Weckhuysen, B. M., Pianetta, P. SPIE-INT SOC OPTICAL ENGINEERING. 2013

    View details for DOI 10.1117/12.2026436

    View details for Web of Science ID 000329578700007

  • Portable atomic layer deposition reactor for in situ synchrotron photoemission studies REVIEW OF SCIENTIFIC INSTRUMENTS Methaapanon, R., Geyer, S. M., Hagglund, C., Pianetta, P. A., Bent, S. F. 2013; 84 (1)

    View details for DOI 10.1063/1.4773230

    View details for Web of Science ID 000314729100063

    View details for PubMedID 23387692

  • Photocathode device using diamondoid and cesium bromide films APPLIED PHYSICS LETTERS Clay, W. A., Maldonado, J. R., Pianetta, P., Dahl, J. E., Carlson, R. M., Schreiner, P. R., Fokin, A. A., Tkachenko, B. A., Melosh, N. A., Shen, Z. 2012; 101 (24)

    View details for DOI 10.1063/1.4769043

    View details for Web of Science ID 000312490000024

  • Experimental verification of the 3-step model of photoemission for energy spread and emittance measurements of copper and CsBr-coated copper photocathodes suitable for free electron laser applications APPLIED PHYSICS LETTERS Maldonado, J. R., Pianetta, P., Dowell, D. H., Corbett, J., Park, S., Schmerge, J., Trautwein, A., Clay, W. 2012; 101 (23)

    View details for DOI 10.1063/1.4769220

    View details for Web of Science ID 000312243900003

  • Formation of arsenolite crystals at room temperature after very high dose arsenic implantation in silicon APPLIED PHYSICS LETTERS Meirer, F., Giubertoni, D., Demenev, E., Vanzetti, L., Gennaro, S., Fedrizzi, M., Pepponi, G., Mehta, A., Pianetta, P., Steinhauser, G., Vishwanath, V., Foad, M., Bersani, M. 2012; 101 (23)

    View details for DOI 10.1063/1.4769446

    View details for Web of Science ID 000312243900039

  • Extended depth of focus for transmission x-ray microscope OPTICS LETTERS Liu, Y., Wang, J., Hong, Y., Wang, Z., Zhang, K., Williams, P. A., Zhu, P., Andrews, J. C., Pianetta, P., Wu, Z. 2012; 37 (17): 3708-3710

    Abstract

    A fast discrete curvelet transform based focus-stacking algorithm for extending the depth of focus of a transmission x-ray microscope (TXM) is presented. By analyzing an image stack of a sample taken in a Z-scan, a fully in-focus image can be generated by the proposed scheme. With the extended depth of focus, it is possible to obtain 3D structural information over a large volume at nanometer resolution. The focus-stacking method has been demonstrated using a dataset taken with a laboratory x-ray source based TXM system. The possibility and limitations of generalizing this method to a synchrotron based TXM are also discussed. We expect the proposed method to be of important impact in 3D x-ray microscopy.

    View details for Web of Science ID 000308595300078

    View details for PubMedID 22940998

  • 3D elemental sensitive imaging using transmission X-ray microscopy ANALYTICAL AND BIOANALYTICAL CHEMISTRY Liu, Y., Meirer, F., Wang, J., Requena, G., Williams, P., Nelson, J., Mehta, A., Andrews, J. C., Pianetta, P. 2012; 404 (5): 1297-1301

    Abstract

    Determination of the heterogeneous distribution of metals in alloy/battery/catalyst and biological materials is critical to fully characterize and/or evaluate the functionality of the materials. Using synchrotron-based transmission x-ray microscopy (TXM), it is now feasible to perform nanoscale-resolution imaging over a wide X-ray energy range covering the absorption edges of many elements; combining elemental sensitive imaging with determination of sample morphology. We present an efficient and reliable methodology to perform 3D elemental sensitive imaging with excellent sample penetration (tens of microns) using hard X-ray TXM. A sample of an Al-Si piston alloy is used to demonstrate the capability of the proposed method.

    View details for DOI 10.1007/s00216-012-5818-9

    View details for Web of Science ID 000307957800004

    View details for PubMedID 22349401

  • In situ transmission X-ray microscopy and nanotomography on Fischer-Tropsch catalysts Cats, K., Gonzalez-Jimenez, I., Davidian, T., Ruitenbeek, M., Meirer, F., Liu, Y., Nelson, J., Andrews, J. C., Pianetta, P., de Groot, F. F., Weckhuysen, B. M. AMER CHEMICAL SOC. 2012
  • TXM-Wizard: a program for advanced data collection and evaluation in full-field transmission X-ray microscopy JOURNAL OF SYNCHROTRON RADIATION Liu, Y., Meirer, F., Williams, P. A., Wang, J., Andrews, J. C., Pianetta, P. 2012; 19: 281-287

    Abstract

    Transmission X-ray microscopy (TXM) has been well recognized as a powerful tool for non-destructive investigation of the three-dimensional inner structure of a sample with spatial resolution down to a few tens of nanometers, especially when combined with synchrotron radiation sources. Recent developments of this technique have presented a need for new tools for both system control and data analysis. Here a software package developed in MATLAB for script command generation and analysis of TXM data is presented. The first toolkit, the script generator, allows automating complex experimental tasks which involve up to several thousand motor movements. The second package was designed to accomplish computationally intense tasks such as data processing of mosaic and mosaic tomography datasets; dual-energy contrast imaging, where data are recorded above and below a specific X-ray absorption edge; and TXM X-ray absorption near-edge structure imaging datasets. Furthermore, analytical and iterative tomography reconstruction algorithms were implemented. The compiled software package is freely available.

    View details for DOI 10.1107/S0909049511049144

    View details for Web of Science ID 000300571300019

    View details for PubMedID 22338691

    View details for PubMedCentralID PMC3284347

  • Formation Of Arsenic Rich Silicon Oxide Under Plasma Immersion Ion Implantation And Laser Annealing 19th International Conference on Ion Implantation Technology (IIT) Meirer, F., Demenev, E., Giubertoni, D., Gennaro, S., VANZETTI, L., Pepponi, G., Bersani, M., Sahiner, M. A., Steinhauser, G., Foad, M. A., Woicik, J. C., Mehta, A., Pianetta, P. AMER INST PHYSICS. 2012: 183–188

    View details for DOI 10.1063/1.4766520

    View details for Web of Science ID 000312160700043

  • FULL FIELD IMAGING OF NICKEL OXIDATION STATES IN SOLID OXIDE FUEL CELL ANODE MATERIALS BY XANES NANOTOMOGRAPHY 9th International Conference on Fuel Cell Science, Engineering and Technology Harris, W. M., Nelson, G. J., Izzo, J. R., Grew, K. N., Chiu, W. K., Chu, Y. S., Yi, J., Andrews, J., Liu, Y., Pianetta, P. AMER SOC MECHANICAL ENGINEERS. 2012: 267–269
  • ANALYSIS OF SOLID OXIDE FUEL CELL LSM-YSZ COMPOSITE CATHODES WITH VARYING STARTING POWDER SIZES ASME International Mechanical Engineering Congress and Exposition (IMECE) Harris, W. M., Nelson, G. J., Lombardo, J. J., Cocco, A. P., Izzo, J. R., Chiu, W. K., Tanasini, P., Van herle, J., Comninellis, C., Andrews, J. C., Liu, Y., Pianetta, P., Chu, Y. S. AMER SOC MECHANICAL ENGINEERS. 2012: 581–584
  • Hard X-ray Nanotomography of Catalytic Solids at Work ANGEWANDTE CHEMIE-INTERNATIONAL EDITION Gonzalez-Jimenez, I. D., Cats, K., Davidian, T., Ruitenbeek, M., Meirer, F., Liu, Y., Nelson, J., Andrews, J. C., Pianetta, P., de Groot, F. M., Weckhuysen, B. M. 2012; 51 (48): 11986-11990

    View details for DOI 10.1002/anie.201204930

    View details for Web of Science ID 000311705000009

    View details for PubMedID 23090844

  • Ultrathin ALD-Al2O3 layers for Ge(001) gate stacks: Local composition evolution and dielectric properties JOURNAL OF APPLIED PHYSICS Swaminathan, S., Sun, Y., Pianetta, P., McIntyre, P. C. 2011; 110 (9)

    View details for DOI 10.1063/1.3647761

    View details for Web of Science ID 000297062100087

  • Electron bombardment of films used for reducing spurious charge in electrostatic electron optics JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B Maldonado, J. R., Pease, F., Hitzman, C. J., Brodie, A. D., Petric, P., Bevis, C., McCord, M., Tong, W. M., Kidwingira, F., Pianetta, P., Bibee, M., Mehta, A., Bhatia, R. 2011; 29 (6)

    View details for DOI 10.1116/1.3663957

    View details for Web of Science ID 000298538800025

  • Three-dimensional imaging of chemical phase transformations at the nanoscale with full-field transmission X-ray microscopy JOURNAL OF SYNCHROTRON RADIATION Meirer, F., Cabana, J., Liu, Y., Mehta, A., Andrews, J. C., Pianetta, P. 2011; 18: 773-781

    Abstract

    The ability to probe morphology and phase distribution in complex systems at multiple length scales unravels the interplay of nano- and micrometer-scale factors at the origin of macroscopic behavior. While different electron- and X-ray-based imaging techniques can be combined with spectroscopy at high resolutions, owing to experimental time limitations the resulting fields of view are too small to be representative of a composite sample. Here a new X-ray imaging set-up is proposed, combining full-field transmission X-ray microscopy (TXM) with X-ray absorption near-edge structure (XANES) spectroscopy to follow two-dimensional and three-dimensional morphological and chemical changes in large volumes at high resolution (tens of nanometers). TXM XANES imaging offers chemical speciation at the nanoscale in thick samples (>20 µm) with minimal preparation requirements. Further, its high throughput allows the analysis of large areas (up to millimeters) in minutes to a few hours. Proof of concept is provided using battery electrodes, although its versatility will lead to impact in a number of diverse research fields.

    View details for DOI 10.1107/S0909049511019364

    View details for Web of Science ID 000294821600014

    View details for PubMedID 21862859

    View details for PubMedCentralID PMC3161818

  • Transmission X-Ray Microscopy for Full-Field Nano Imaging of Biomaterials MICROSCOPY RESEARCH AND TECHNIQUE Andrews, J. C., Meirer, F., Liu, Y., Mester, Z., Pianetta, P. 2011; 74 (7): 671-681

    Abstract

    Imaging of cellular structure and extended tissue in biological materials requires nanometer resolution and good sample penetration, which can be provided by current full-field transmission X-ray microscopic techniques in the soft and hard X-ray regions. The various capabilities of full-field transmission X-ray microscopy (TXM) include 3D tomography, Zernike phase contrast, quantification of absorption, and chemical identification via X-ray fluorescence and X-ray absorption near edge structure imaging. These techniques are discussed and compared in light of results from the imaging of biological materials including microorganisms, bone and mineralized tissue, and plants, with a focus on hard X-ray TXM at ≤ 40-nm resolution.

    View details for DOI 10.1002/jemt.20907

    View details for Web of Science ID 000292570900011

    View details for PubMedID 20734414

    View details for PubMedCentralID PMC2992572

  • Device quality Sb-based compound semiconductor surface: A comparative study of chemical cleaning JOURNAL OF APPLIED PHYSICS Nainani, A., Sun, Y., Irisawa, T., Yuan, Z., Kobayashi, M., Pianetta, P., Bennett, B. R., Boos, J. B., Saraswat, K. C. 2011; 109 (11)

    View details for DOI 10.1063/1.3590167

    View details for Web of Science ID 000292214700167

  • Comparison of SOFC cathode microstructure quantified using X-ray nanotomography and focused ion beam-scanning electron microscopy ELECTROCHEMISTRY COMMUNICATIONS Nelson, G. J., Harris, W. M., Lombardo, J. J., Izzo, J. R., Chiu, W. K., Tanasini, P., Cantoni, M., Van herle, J., Comninellis, C., Andrews, J. C., Liu, Y., Pianetta, P., Chu, Y. S. 2011; 13 (6): 586-589
  • Schottky barrier height reduction for metal/n-GaSb contact by inserting TiO2 interfacial layer with low tunneling resistance APPLIED PHYSICS LETTERS Yuan, Z., Nainani, A., Sun, Y., Lin, J. J., Pianetta, P., Saraswat, K. C. 2011; 98 (17)

    View details for DOI 10.1063/1.3584862

    View details for Web of Science ID 000290046100032

  • Three-dimensional mapping of nickel oxidation states using full field x-ray absorption near edge structure nanotomography APPLIED PHYSICS LETTERS Nelson, G. J., Harris, W. M., Izzo, J. R., Grew, K. N., Chiu, W. K., Chu, Y. S., Yi, J., Andrews, J. C., Liu, Y., Pianetta, P. 2011; 98 (17)

    View details for DOI 10.1063/1.3574774

    View details for Web of Science ID 000290046100055

  • 3D nanoscale chemical imaging of Li-ion battery electrodes 241st National Meeting and Exposition of the American-Chemical-Society (ACS) Andrews, J. C., Meirer, F., Cabana, J., Liu, Y., Pianetta, P. AMER CHEMICAL SOC. 2011
  • Phase retrieval using polychromatic illumination for transmission X-ray microscopy OPTICS EXPRESS Liu, Y., Andrews, J. C., Wang, J., Meirer, F., Zhu, P., Wu, Z., Pianetta, P. 2011; 19 (2): 540-545

    Abstract

    An alternative method for quantitative phase retrieval in a transmission X-ray microscope system at sub-50-nm resolution is presented. As an alternative to moving the sample in the beam direction in order to analyze the propagation-introduced phase effect, we have illuminated the TXM using X-rays of different energy without any motor movement in the TXM system. Both theoretical analysis and experimental studies have confirmed the feasibility and the advantage of our method, because energy tuning can be performed with very high energy resolution using a double crystal monochromator at a synchrotron beam line, and there is zero motor error in TXM system in our approach. High-spatial-resolution phase retrieval is accomplished using the proposed method.

    View details for Web of Science ID 000286314600014

    View details for PubMedID 21263593

    View details for PubMedCentralID PMC3482903

  • Sub-15 nm Photo-electron Source Using a Nano-aperture Integrated with a Nano-antenna Conference on Lasers and Electro-Optics (CLEO) Cheng, Y., Takashima, Y., Maldonado, J. R., Scipioni, L., Ferranti, D., Pianetta, P. A., Hesselink, L., Pease, R. F. IEEE. 2011
  • 3D Imaging of Nickel Oxidation States using Full Field X-ray Absorption Near Edge Structure Nanotomography 12th International Symposium on Solid Oxide Fuel Cells (SOFC) Nelson, G. J., Harris, W. M., Izzo, J. R., Grew, K. N., Chiu, W. K., Chu, Y. S., Yi, J., Andrews, J. C., Liu, Y., Pianetta, P. ELECTROCHEMICAL SOC INC. 2011: 1315–21

    View details for DOI 10.1149/1.3570117

    View details for Web of Science ID 000300770102038

  • Comparison of X-ray Nanotomography and FIB-SEM in Quantifying the Composite LSM/YSZ SOFC Cathode Microstructure 12th International Symposium on Solid Oxide Fuel Cells (SOFC) Nelson, G. J., Harris, W. M., Lombardo, J. J., Izzo, J. R., Chiu, W. K., Tanasini, P., Cantoni, M., Van herle, J., Comninellis, C., Andrews, J. C., Liu, Y., Pianetta, P., Chu, Y. S. ELECTROCHEMICAL SOC INC. 2011: 2417–21

    View details for DOI 10.1149/1.3570238

    View details for Web of Science ID 000300770104049

  • Applications of Hard X-ray Full-Field Transmission X-ray Microscopy at SSRL 10th International Conference on X-ray Microscopy Liu, Y., Andrews, J. C., Meirer, F., Mehta, A., Carrasco Gil, S., Sciau, P., Mester, Z., Pianetta, P. AMER INST PHYSICS. 2011: 357–360

    View details for DOI 10.1063/1.3625377

    View details for Web of Science ID 000298672400084

  • A Condenser Scanner for Artifact-Free, Large Field of View, Full-Field X-ray Microscopy at Synchrotrons 10th International Conference on X-ray Microscopy Rudati, J., Irwin, J., Tkachuk, A., Andrews, J. C., Pianetta, P., Feser, M. AMER INST PHYSICS. 2011: 136–139
  • High-Mobility Ge N-MOSFETs and Mobility Degradation Mechanisms IEEE TRANSACTIONS ON ELECTRON DEVICES Kuzum, D., Krishnamohan, T., Nainani, A., Sun, Y., Pianetta, P. A., Wong, H. P., Saraswat, K. C. 2011; 58 (1): 59-66
  • Optical and computed evaluation of keyhole diffractive imaging for lensless x-ray microscopy 54th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication Dai, B., Zhu, D., Jaroensri, R., Kulalert, K., Pianetta, P., Pease, R. F. A V S AMER INST PHYSICS. 2010: C6Q1-C6Q5

    View details for DOI 10.1116/1.3501340

    View details for Web of Science ID 000285015200118

  • Photon-enhanced thermionic emission for solar concentrator systems NATURE MATERIALS Schwede, J. W., Bargatin, I., Riley, D. C., Hardin, B. E., Rosenthal, S. J., Sun, Y., Schmitt, F., Pianetta, P., Howe, R. T., Shen, Z., Melosh, N. A. 2010; 9 (9): 762-767

    Abstract

    Solar-energy conversion usually takes one of two forms: the 'quantum' approach, which uses the large per-photon energy of solar radiation to excite electrons, as in photovoltaic cells, or the 'thermal' approach, which uses concentrated sunlight as a thermal-energy source to indirectly produce electricity using a heat engine. Here we present a new concept for solar electricity generation, photon-enhanced thermionic emission, which combines quantum and thermal mechanisms into a single physical process. The device is based on thermionic emission of photoexcited electrons from a semiconductor cathode at high temperature. Temperature-dependent photoemission-yield measurements from GaN show strong evidence for photon-enhanced thermionic emission, and calculated efficiencies for idealized devices can exceed the theoretical limits of single-junction photovoltaic cells. The proposed solar converter would operate at temperatures exceeding 200 degrees C, enabling its waste heat to be used to power a secondary thermal engine, boosting theoretical combined conversion efficiencies above 50%.

    View details for DOI 10.1038/NMAT2814

    View details for Web of Science ID 000281178400029

    View details for PubMedID 20676086

  • 3D nanoscale imaging of the yeast, Schizosaccharomyces pombe, by full-field transmission X-ray microscopy at 5.4 keV ANALYTICAL AND BIOANALYTICAL CHEMISTRY Chen, J., Yang, Y., Zhang, X., Andrews, J. C., Pianetta, P., Guan, Y., Liu, G., Xiong, Y., Wu, Z., Tian, Y. 2010; 397 (6): 2117-2121

    Abstract

    Three-dimensional (3D) nanoscale structures of the fission yeast, Schizosaccharomyces pombe, can be obtained by full-field transmission hard X-ray microscopy with 30 nm resolution using synchrotron radiation sources. Sample preparation is relatively simple and the samples are portable across various imaging environments, allowing for high-throughput sample screening. The yeast cells were fixed and double-stained with Reynold's lead citrate and uranyl acetate. We performed both absorption contrast and Zernike phase contrast imaging on these cells in order to test this method. The membranes, nucleus, and subcellular organelles of the cells were clearly visualized using absorption contrast mode. The X-ray images of the cells could be used to study the spatial distributions of the organelles in the cells. These results show unique structural information, demonstrating that hard X-ray microscopy is a complementary method for imaging and analyzing biological samples.

    View details for DOI 10.1007/s00216-010-3617-8

    View details for Web of Science ID 000279453000010

    View details for PubMedID 20349228

    View details for PubMedCentralID PMC2896439

  • The dependence of the oxidation enhancement of InP(100) surface on the coverage of the adsorbed Cs JOURNAL OF APPLIED PHYSICS Sun, Y., Liu, Z., Pianetta, P. 2010; 107 (12)

    View details for DOI 10.1063/1.3452384

    View details for Web of Science ID 000279993900167

  • Reaction Mechanism, Bonding, and Thermal Stability of 1-Alkanethiols Self-Assembled on Halogenated Ge Surfaces LANGMUIR Ardalan, P., Sun, Y., Pianetta, P., Musgrave, C. B., Bent, S. F. 2010; 26 (11): 8419-8429

    Abstract

    We have employed synchrotron radiation photoemission spectroscopy to study the reaction mechanism, surface bonding, and thermal stability of 1-octadecanethiolate (ODT) self-assembled monolayers (SAMs) at Cl- and Br-terminated Ge(100) surfaces. Density functional theory (DFT) calculations were also carried out for the same reactions. From DFT calculations, we have found that adsorption of 1-octadecanethiol on the halide-terminated surface via hydrohalogenic acid elimination is kinetically favorable on both Cl- and Br-terminated Ge surfaces at room temperature, but the reactions are more thermodynamically favorable at Cl-terminated Ge surfaces. After ODT SAM formation at room temperature, photoemission spectroscopy experiments show that Ge(100) and (111) surfaces contain monothiolates and possibly dithiolates together with unbound thiol and atomic sulfur. Small coverages of residual halide are also observed, consistent with predictions by DFT. Annealing studies in ultrahigh vacuum show that the Ge thiolates are thermally stable up to 150 degrees C. The majority of the surface thiolates are converted to sulfide and carbide upon annealing to 350 degrees C. By 430 degrees C, no sulfur remains on the surface, whereas Ge carbide is stable to above 470 degrees C.

    View details for DOI 10.1021/la904864c

    View details for Web of Science ID 000277928100104

    View details for PubMedID 20433151

  • Synchrotron radiation-induced total reflection X-ray fluorescence analysis TRAC-TRENDS IN ANALYTICAL CHEMISTRY Meirer, F., Singh, A., Pepponi, G., Streli, C., Homma, T., Pianetta, P. 2010; 29 (6): 479-496
  • Nanoscale X-Ray Microscopic Imaging of Mammalian Mineralized Tissue MICROSCOPY AND MICROANALYSIS Andrews, J. C., Almeida, E., van der Meulen, M. C., Alwood, J. S., Lee, C., Liu, Y., Chen, J., Meirer, F., Feser, M., Gelb, J., Rudati, J., Tkachuk, A., Yun, W., Pianetta, P. 2010; 16 (3): 327-336

    Abstract

    A novel hard transmission X-ray microscope (TXM) at the Stanford Synchrotron Radiation Lightsource operating from 5 to 15 keV X-ray energy with 14 to 30 microm2 field of view has been used for high-resolution (30-40 nm) imaging and density quantification of mineralized tissue. TXM is uniquely suited for imaging of internal cellular structures and networks in mammalian mineralized tissues using relatively thick (50 microm), untreated samples that preserve tissue micro- and nanostructure. To test this method we performed Zernike phase contrast and absorption contrast imaging of mouse cancellous bone prepared under different conditions of in vivo loading, fixation, and contrast agents. In addition, the three-dimensional structure was examined using tomography. Individual osteocytic lacunae were observed embedded within trabeculae in cancellous bone. Extensive canalicular networks were evident and included processes with diameters near the 30-40 nm instrument resolution that have not been reported previously. Trabecular density was quantified relative to rod-like crystalline apatite, and rod-like trabecular struts were found to have 51-54% of pure crystal density and plate-like areas had 44-53% of crystal density. The nanometer resolution of TXM enables future studies for visualization and quantification of ultrastructural changes in bone tissue resulting from osteoporosis, dental disease, and other pathologies.

    View details for DOI 10.1017/S1431927610000231

    View details for Web of Science ID 000277902600011

    View details for PubMedID 20374681

    View details for PubMedCentralID PMC2873966

  • The effects of wet surface clean and in situ interlayer on In-0.52Al0.48As metal-oxide-semiconductor characteristics APPLIED PHYSICS LETTERS Kobayashi, M., Thareja, G., Sun, Y., Goel, N., Garner, M., Tsai, W., Pianetta, P., Nishi, Y. 2010; 96 (14)

    View details for DOI 10.1063/1.3379024

    View details for Web of Science ID 000276554600066

  • Effects of Al doping and annealing on chemical states and band diagram of Y2O3/Si gate stacks studied by photoemission and x-ray absorption spectroscopy JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A Toyoda, S., Okabayashi, J., Komatsu, M., Oshima, M., Lee, D., Sun, S., Sun, Y., Pianetta, P. A., Kukuruznyak, D., Chikyow, T. 2010; 28 (1): 16-19

    View details for DOI 10.1116/1.3259869

    View details for Web of Science ID 000273182800004

  • Deactivation of submelt laser annealed arsenic ultrashallow junctions in silicon during subsequent thermal treatment JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B Giubertoni, D., Pepponi, G., Sahiner, M. A., Kelty, S. P., Gennaro, S., Bersani, M., Kah, M., Kirkby, K. J., Doherty, R., Foad, M. A., Meirer, F., Streli, C., Woicik, J. C., Pianetta, P. 2010; 28 (1): C1B1-C1B5

    View details for DOI 10.1116/1.3242637

    View details for Web of Science ID 000275511800002

  • Hard X-ray Full Field Nano-imaging of Bone and Nanowires at SSRL 10th International Conference on Synchrotron Radiation Instrumentation Andrews, J. C., Pianetta, P., Meirer, F., Chen, J., Almeida, E., van der Meulen, M. C., Alwood, J. S., Lee, C., Zhu, J., Cui, Y. AMER INST PHYSICS. 2010: 79–82

    Abstract

    A hard X-ray full field microscope from Xradia Inc. has been installed at SSRL on a 54-pole wiggler end station at beam line 6-2. It has been optimized to operate from 5-14 keV with resolution as high as 30 nm. High quality images are achieved using a vertical beam stabilizer and condenser scanner with high efficiency zone plates with 30 nm outermost zone width. The microscope has been used in Zernike phase contrast, available at 5.4 keV and 8 keV, as well as absorption contrast to image a variety of biological, environmental and materials samples. Calibration of the X-ray attenuation with crystalline apatite enabled quantification of bone density of plate-like and rod-like regions of mouse bone trabecula. 3D tomography of individual lacuna revealed the surrounding cell canaliculi and processes. 3D tomography of chiral branched PbSe nanowires showed orthogonal branches around a central nanowire.

    View details for Web of Science ID 000283705500016

    View details for PubMedCentralID PMC2944249

  • Performance of a CsBr coated Nb photocathode at room temperature JOURNAL OF APPLIED PHYSICS Maldonado, J. R., Pianetta, P., Dowell, D. H., Smedley, J., Kneisel, P. 2010; 107 (1)

    View details for DOI 10.1063/1.3276222

    View details for Web of Science ID 000273689600006

  • Radical oxidation of germanium for interface gate dielectric GeO2 formation in metal-insulator-semiconductor gate stack JOURNAL OF APPLIED PHYSICS Kobayashi, M., Thareja, G., Ishibashi, M., Sun, Y., Griffin, P., McVittie, J., Pianetta, P., Saraswat, K., Nishi, Y. 2009; 106 (10)

    View details for DOI 10.1063/1.3259407

    View details for Web of Science ID 000272932300103

  • Apparatus to measure electron reflection JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B Maldonado, J. R., Sun, Y., Tsai, R., Pease, F., Pianetta, P. 2009; 27 (6): 2644-2647

    View details for DOI 10.1116/1.3242695

    View details for Web of Science ID 000272803400065

  • Iterative phase recovery using wavelet domain constraints JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B Baghaei, L., Rad, A., Dai, B., Pianetta, P., Miao, J., Pease, R. F. 2009; 27 (6): 3192-3195

    View details for DOI 10.1116/1.3258632

    View details for Web of Science ID 000272803400174

  • The surface activation layer of GaAs negative electron affinity photocathode activated by Cs, Li, and NF3 APPLIED PHYSICS LETTERS Sun, Y., Kirby, R. E., Maruyama, T., Mulhollan, G. A., BIERMAN, J. C., Pianetta, P. 2009; 95 (17)

    View details for DOI 10.1063/1.3257730

    View details for Web of Science ID 000271360400095

  • Using X-ray Microscopy and Hg L-3 XAMES To Study Hg Binding in the Rhizosphere of Spartina Cordgrass ENVIRONMENTAL SCIENCE & TECHNOLOGY Patty, C., Barnett, B., Mooney, B., Kahn, A., Levy, S., Liu, Y., Pianetta, P., Andrews, J. C. 2009; 43 (19): 7397-7402

    Abstract

    San Francisco Bay has been contaminated historically by mercury from mine tailings as well as contemporary industrial sources. Native Spartina foliosa and non-native S. alterniflora-hybrid cordgrasses are dominant florae within the SF Bay estuary environment. Understanding mercury uptake and transformations in these plants will help to characterize the significance of their roles in mercury biogeochemical cycling in the estuarine environment. Methylated mercury can be biomagnified up the food web, resulting in levels in sport fish up to 1 million times greater than in surrounding waters and resulting in advisories to limit fish intake. Understanding the uptake and methylation of mercury in the plant rhizosphere can yield insight into ways to manage mercury contamination. The transmission X-ray microscope on beamline 6-2 at the Stanford Synchrotron Radiation Lightsource (SSRL) was used to obtain absorption contrast images and 3D tomography of Spartina foliosa roots that were exposed to 1 ppm Hg (as HgCl2) hydroponically for 1 week. Absorption contrast images of micrometer-sized roots from S. foliosa revealed dark particles, and dark channels within the root, due to Hg absorption. 3D tomography showed that the particles are on the root surface, and slices from the tomographic reconstruction revealed that the particles are hollow, consistent with microorganisms with a thin layer of Hg on the surface. Hg L3 XANES of ground-up plant roots and Hg L3 micro-XANES from microprobe analysis of micrometer-sized roots (60-120 microm in size) revealed three main types of speciation in both Spartina species: Hg-S ligation in a form similar to Hg(II) cysteine, Hg-S bonding as in cinnabar and metacinnabar, and methylmercury-carboxyl bonding in a form similar to methylmercury acetate. These results are interpreted within the context of obtaining a "snapshot" of mercury methylation in progress.

    View details for DOI 10.1021/es901076q

    View details for Web of Science ID 000270136500040

    View details for PubMedID 19848152

    View details for PubMedCentralID PMC2768038

  • Study on mechanism of crystallization in HfO2 films on Si substrates by in-depth profile analysis using photoemission spectroscopy JOURNAL OF APPLIED PHYSICS Toyoda, S., Takahashi, H., Kumigashira, H., Oshima, M., Lee, D., Sun, S., Liu, Z., Sun, Y., Pianetta, P. A., Oshiyama, I., Tai, K., Fukuda, S. 2009; 106 (6)

    View details for DOI 10.1063/1.3212979

    View details for Web of Science ID 000270378100113

  • Gold Removal from Germanium Nanowires LANGMUIR Ratchford, J. B., Goldthorpe, I. A., Sun, Y., McIntyre, P. C., Pianetta, P. A., Chidsey, C. E. 2009; 25 (16): 9473-9479

    Abstract

    We report the selective removal of gold from the tips of germanium nanowires (GeNWs) grown by chemical vapor deposition on gold nanoparticles (AuNPs). Selective removal was accomplished by aqueous hydrochloric acid solutions containing either potassium triiodide or iodine. Measurement of the residual number of gold atoms on the GeNW samples using inductively coupled plasma-mass spectrometry shows that 99% of the gold was removed. Photoemission spectroscopy shows that the germanium surfaces of these samples were not further oxidized after treatment with these liquid etchants. Auger electron spectroscopy shows that AuNPs that did not yield GeNWs contain germanium and also that the addition of gaseous HCl to GeH(4) during GeNW growth increased the selectivity of germanium deposition to the AuNPs.

    View details for DOI 10.1021/la900725b

    View details for Web of Science ID 000268719900088

    View details for PubMedID 19419180

  • Hafnium oxide/germanium oxynitride gate stacks on germanium: Capacitance scaling and interface state density APPLIED PHYSICS LETTERS Oshima, Y., Shandalov, M., Sun, Y., Pianetta, P., McIntyre, P. C. 2009; 94 (18)

    View details for DOI 10.1063/1.3116624

    View details for Web of Science ID 000265933700046

  • Electron sources utilizing thin CsBr coatings 34th International Conference on Micro- and Nano-Engineering Maldonado, J. R., Liu, Z., Dowell, D. H., Kirby, R. E., Sun, Y., Pianetta, P., Pease, F. ELSEVIER SCIENCE BV. 2009: 529–31
  • Erase and Retention Improvements in Charge Trap Flash Through Engineered Charge Storage Layer IEEE ELECTRON DEVICE LETTERS Goel, N., Gilmer, D. C., Park, H., Diaz, V., Sun, Y., Price, J., PARK, C., Pianetta, P., Kirsch, P. D., Jammy, R. 2009; 30 (3): 216-218
  • High Quality GeO2/Ge Interface Formed by SPA Radical Oxidation and Uniaxial Stress Engineering for High Performance Ge NMOSFETs Symposium on VLSI Technology Kobayashi, M., Irisawa, T., Kope, B. M., Sun, Y., Saraswat, K., Wong, H. P., Pianetta, P., Nishi, Y. JAPAN SOCIETY APPLIED PHYSICS. 2009: 76–77
  • Full-field transmission x-ray microscopy for bio-imaging 9th International Conference on X-Ray Microscopy Andrews, J. C., Brennan, S., Liu, Y., Pianetta, P., Almeida, E. A., van der Meulen, M. C., Wu, Z., Mester, Z., Ouerdane, L., Gelb, J., Feser, M., Rudati, J., Tkachuk, A., Yun, W. IOP PUBLISHING LTD. 2009
  • Full-field transmission x-ray microscopy at SSRL 9th International Conference on X-Ray Microscopy Andrews, J. C., Brennan, S., Pianetta, P., Ishii, H., Gelb, J., Feser, M., Rudati, J., Tkachuk, A., Yun, W. IOP PUBLISHING LTD. 2009
  • Origin of the Monochromatic Photoemission Peak in Diamondoid Monolayers NANO LETTERS Clay, W. A., Liu, Z., Yang, W., Fabbri, J. D., Dahl, J. E., Carlson, R. M., Sun, Y., Schreiner, P. R., Fokin, A. A., Tkachenko, B. A., Fokina, N. A., Pianetta, P. A., Melosh, N., Shen, Z. 2009; 9 (1): 57-61

    Abstract

    Recent photoemission experiments have discovered a highly monochromatized secondary electron peak emitted from diamondoid self-assembled monolayers on metal substrates. New experimental data and simulation results are presented to show that a combination of negative electron affinity and strong electron-phonon scattering is responsible for this behavior. The simulation results are generated using a simple Monte Carlo transport algorithm. The simulated spectra recreate the main spectral features of the measured ones.

    View details for DOI 10.1021/nl802310k

    View details for Web of Science ID 000262519100010

    View details for PubMedID 18975993

  • Experimental Demonstration of High Mobility Ge NMOS IEEE International Electron Devices Meeting (IEDM 2009) Kuzum, D., Krishnamohan, T., Nainani, A., Sun, Y., Pianetta, P. A., Wong, H., Saraswat, K. C. IEEE. 2009: 420–423
  • Correlation of local structure and electrical activation in arsenic ultrashallow junctions in silicon JOURNAL OF APPLIED PHYSICS Giubertoni, D., Pepponi, G., Gennaro, S., Bersani, M., Sahiner, M. A., Kelty, S. P., Doherty, R., Foad, M. A., Kah, M., Kirkby, K. J., Woicik, J. C., Pianetta, P. 2008; 104 (10)

    View details for DOI 10.1063/1.3026706

    View details for Web of Science ID 000262605800082

  • Arsenic-dominated chemistry in the acid cleaning of InGaAs and InAlAs surfaces APPLIED PHYSICS LETTERS Sun, Y., Pianetta, P., Chen, P., Kobayashi, M., Nishi, Y., Goel, N., Garner, M., Tsai, W. 2008; 93 (19)

    View details for DOI 10.1063/1.3025852

    View details for Web of Science ID 000260944100134

  • Synchrotron radiation photoemission spectroscopic study of band offsets and interface self-cleaning by atomic layer deposited HfO2 on In0.53Ga0.47As and In0.52Al0.48As APPLIED PHYSICS LETTERS Kobayashi, M., Chen, P. T., Sun, Y., Goel, N., Majhi, P., GARNER, M., Tsai, W., Pianetta, P., Nishi, Y. 2008; 93 (18)

    View details for DOI 10.1063/1.3020298

    View details for Web of Science ID 000260778100030

  • X-ray diffraction microscopy: Reconstruction with partial magnitude and spatial a priori information 52nd International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication Rad, L. B., Downes, I., Dai, B., Zhu, D., Scherz, A., Ye, J., Pianetta, P., Pease, R. F. A V S AMER INST PHYSICS. 2008: 2362–66

    View details for DOI 10.1116/1.3002487

    View details for Web of Science ID 000261385600098

  • Evaluation of electron energy spread in CsBr based photocathodes 52nd International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication Maldonado, J. R., Sun, Y., Liu, Z., Liu, X., Tanimoto, S., Pianetta, P., Pease, F. A V S AMER INST PHYSICS. 2008: 2085–90

    View details for DOI 10.1116/1.2976572

    View details for Web of Science ID 000261385600045

  • The effectiveness of HCl and HF cleaning of Si0.85Ge0.15 surface JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A Sun, Y., Liu, Z., Sun, S., Pianetta, P. 2008; 26 (5): 1248-1250

    View details for DOI 10.1116/1.2966428

    View details for Web of Science ID 000259296000023

  • The work function of submonolayer cesium-covered gold: A photoelectron spectroscopy study JOURNAL OF CHEMICAL PHYSICS LaRue, J. L., White, J. D., Nahler, N. H., Liu, Z., Sun, Y., Pianetta, P. A., Auerbach, D. J., Wodtke, A. M. 2008; 129 (2)

    Abstract

    Using visible and x-ray photoelectron spectroscopy, we measured the work function of a Au(111) surface at a well-defined submonolayer coverage of Cs. For a Cs coverage producing a photoemission maximum with a He-Ne laser, the work function is 1.61+/-0.08 eV, consistent with previous assumptions used to analyze vibrationally promoted electron emission. A discussion of possible Cs layer structures is also presented.

    View details for DOI 10.1063/1.2953712

    View details for Web of Science ID 000257629100046

    View details for PubMedID 18624554

  • Photoemission study of Cs-NF3 activated GaAs(100) negative electron affinity photocathodes APPLIED PHYSICS LETTERS Liu, Z., Sun, Y., Peterson, S., Pianetta, P. 2008; 92 (24)

    View details for DOI 10.1063/1.2945276

    View details for Web of Science ID 000256934900007

  • Analytical methods for discriminating stardust in aerogel capture media 56th Annual Conference on Applications of X-Ray Analysis Brennan, S., Luening, K., Ignatyev, K., Pianetta, P., Ishii, H. A., Bradley, J. P. J C P D S-INT CENTRE DIFFRACTION DATA. 2008: 81–86

    View details for DOI 10.1154/1.2912328

    View details for Web of Science ID 000256745700003

  • Robust CsBr/Cu photocathodes for the linac coherent light source PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS Maldonado, J. R., Liu, Z., Dowell, D. H., Kirby, R. E., Sun, Y., Pianetta, P., Pease, F. 2008; 11 (6)
  • Ge-interface engineering with ozone oxidation for low interface-state density IEEE ELECTRON DEVICE LETTERS Kuzum, D., Krishnamohan, T., Pethe, A. J., Okyay, A. K., Oshima, Y., Sun, Y., McVittie, J. P., Pianetta, P. A., McIntyre, P. C., Saraswat, K. C. 2008; 29 (4): 328-330
  • HfO2 gate dielectric on (NH4)(2)S passivated (100) GaAs grown by atomic layer deposition JOURNAL OF APPLIED PHYSICS Chen, P. T., Sun, Y., Kim, E., McIntyre, P. C., Tsai, W., GARNER, M., Pianetta, P., Nishi, Y., Chui, C. O. 2008; 103 (3)

    View details for DOI 10.1063/1.2838471

    View details for Web of Science ID 000253238100054

  • Recovering the elemental composition of comet Wild 2 dust in five Stardust impact tracks and terminal particles in aerogel METEORITICS & PLANETARY SCIENCE Ishii, H. A., Brennan, S., Bradley, J. P., Luening, K., Ignatyev, K., Pianetta, P. 2008; 43 (1-2): 215-231
  • Addressing The Gate Stack Challenge For High Mobility InxGa1-xAs Channels For NFETs IEEE International Electron Devices Meeting Goel, N., Heh, D., Koveshnikov, S., Ok, I., Oktyabrsky, S., Tokranov, V., KAMBHAMPATI, R., Yakimov, M., Sun, Y., Pianetta, P., Gaspe, C. K., Santos, M. B., Lee, J., Datta, S., Majhi, P., Tsai, W. IEEE. 2008: 363–366
  • Ge Interface Passivation Techniques and Their Thermal Stability 3rd International SiGe, Ge and Related Compounds Symposium Kuzum, D., Krishnamohan, T., Pethe, A., Oshima, Y., Sun, Y., McVittie, J., Pianetta, P. A., McIntyre, P. C., Saraswat, K. C. ELECTROCHEMICAL SOCIETY INC. 2008: 1025–29

    View details for DOI 10.1149/1.2986865

    View details for Web of Science ID 000273336700114

  • Chemical Bonding, Interfaces, and Defects in Hafnium Oxide/Germanium Oxynitride Gate Stacks on Ge(100) JOURNAL OF THE ELECTROCHEMICAL SOCIETY Oshima, Y., Sun, Y., Kuzum, D., Sugawara, T., Saraswat, K. C., Pianetta, P., McIntyrea, P. C. 2008; 155 (12): G304-G309

    View details for DOI 10.1149/1.2995832

    View details for Web of Science ID 000260479700067

  • Angular dependence of the photoelectron energy distribution of InP(100) and GaAs(100) negative electron affinity photocathodes APPLIED PHYSICS LETTERS Lee, D., Sun, Y., Liu, Z., Sun, S., Pianetta, P. 2007; 91 (19)

    View details for DOI 10.1063/1.2805775

    View details for Web of Science ID 000250810300036

  • Influence of Taoism on the invention of the purple pigment used on the Qin terracotta warriors JOURNAL OF ARCHAEOLOGICAL SCIENCE Liu, Z., Mehta, A., Tamura, N., Pickard, D., Rong, B., Zhou, T., Pianetta, P. 2007; 34 (11): 1878-1883
  • CsBr/GaN heterojunction photoelectron source 51st International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication Maldonado, J. R., Liu, Z., Sun, Y., Schuetter, S., Pianetta, P., Pease, R. F. A V S AMER INST PHYSICS. 2007: 2266–70

    View details for DOI 10.1116/1.2779042

    View details for Web of Science ID 000251611900100

  • Rapid partial melt crystallization of silicon for monolithic three-dimensional integration 51st International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication Witte, D. J., Pickard, D. S., Crnogorac, F., Pianetta, P., Pease, R. F. A V S AMER INST PHYSICS. 2007: 1989–92

    View details for DOI 10.1116/1.2798732

    View details for Web of Science ID 000251611900041

  • The distribution of oxide species in the Cs/O activation layer on InP(100) negative electron affinity photocathodes JOURNAL OF APPLIED PHYSICS Lee, D., Sun, Y., Liu, Z., Sun, S., Peterson, S., Pianetta, P. 2007; 102 (7)

    View details for DOI 10.1063/1.2786885

    View details for Web of Science ID 000250147700154

  • Formation of cesium peroxide and cesium superoxide on InP photocathode activated by cesium and oxygen JOURNAL OF APPLIED PHYSICS Sun, Y., Liu, Z., Pianetta, P., Lee, D. 2007; 102 (7)

    View details for DOI 10.1063/1.2786882

    View details for Web of Science ID 000250147700153

  • Band offsets between amorphous LaAlO3 and In0.53Ga0.47As APPLIED PHYSICS LETTERS Goel, N., Tsai, W., Garner, C. M., Sun, Y., Pianetta, P., Warusawithana, M., Schlom, D. G., Wen, H., Gaspe, C., Keay, J. C., Santos, M. B., Goncharova, L. V., Garfunkel, E., Gustafsson, T. 2007; 91 (11)

    View details for DOI 10.1063/1.2783264

    View details for Web of Science ID 000249474000106

  • Surface dipole formation and lowering of the Work function by Cs adsorption on InP(100) surface JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A Sun, Y., Liu, Z., Pianetta, P. 2007; 25 (5): 1351-1356

    View details for DOI 10.1116/1.2753845

    View details for Web of Science ID 000249664400004

  • High current density GaN/CsBr heterojunction photocathode with improved photoyield APPLIED PHYSICS LETTERS Liu, Z., Sun, Y., Pianetta, P., Maldonado, J. R., Pease, R. F., Schuetter, S. 2007; 90 (23)

    View details for DOI 10.1063/1.2746959

    View details for Web of Science ID 000247145500015

  • Lamellar crystallization of silicon for 3-dimensional integration 32nd International Conference on Micro- and Nano-Engineering Witte, D. J., Crnogorac, F., Pickard, D. S., Mehta, A., Liu, Z., Rajendran, B., Pianetta, P., Pease, R. F. ELSEVIER SCIENCE BV. 2007: 1186–89
  • Dynamics modelling of biolistic gene guns PHYSICS IN MEDICINE AND BIOLOGY Zhang, M., Tao, W., Pianetta, P. A. 2007; 52 (5): 1485-1493

    Abstract

    The gene transfer process using biolistic gene guns is a highly dynamic process. To achieve good performance, the process needs to be well understood and controlled. Unfortunately, no dynamic model is available in the open literature for analysing and controlling the process. This paper proposes such a model. Relationships of the penetration depth with the helium pressure, the penetration depth with the acceleration distance, and the penetration depth with the micro-carrier radius are presented. Simulations have also been conducted. The results agree well with experimental results in the open literature. The contribution of this paper includes a dynamic model for improving and manipulating performance of the biolistic gene gun.

    View details for DOI 10.1088/0031-9155/52/5/017

    View details for Web of Science ID 000244714200017

    View details for PubMedID 17301466

  • A high resolution full field transmission X-ray microscope at SSRL 9th International Conference on Synchrotron Radiation Instrumentation (SRI 2006) Luening, K., Pianetta, P., Yun, W., Almeida, E., van der Meulen, M. AMER INST PHYSICS. 2007: 1333–1336
  • Micro scanning XRF, XANES and XRD studies of the decorated surface of Roman Terra Sigillata ceramics Mirguet, C., Sciau, P., Goudeau, P., Metha, A., Pianetta, P., Liu, Z., Tamura, N. INT UNION CRYSTALLOGRAPHY. 2007: S107
  • First X-ray fluorescence MicroCT results from micrometeorites at SSRL 9th International Conference on Synchrotron Radiation Instrumentation (SRI 2006) Ignatyev, K., Huwig, K., Harvey, R., Ishii, H., Bradley, J., Luening, K., Brennan, S., Pianetta, P. AMER INST PHYSICS. 2007: 1337–1340
  • Interface-engineered Ge (100) and (111), N- and P-FETs with high mobility IEEE International Electron Devices Meeting Kuzum, D., Pethe, A. J., Krishnamohan, T., Oshima, Y., Sun, Y., McVittie, J. P., Pianetta, P. A., McIntyre, P. C., Saraswat, K. C. IEEE. 2007: 723–726
  • Elemental compositions of comet 81P/Wild 2 samples collected by Stardust SCIENCE Flynn, G. J., Bleuet, P., Borg, J., Bradley, J. P., Brenker, F. E., Brennan, S., Bridges, J., Brownlee, D. E., Bullock, E. S., Burghammer, M., Clark, B. C., Dai, Z. R., Daghlian, C. P., Djouadi, Z., Fakra, S., Ferroir, T., Floss, C., Franchi, I. A., Gainsforth, Z., Gallien, J., Gillet, P., Grant, P. G., Graham, G. A., Green, S. F., Grossemy, F., Heck, P. R., Herzog, G. F., Hoppe, P., Hoerz, F., Huth, J., Ignatyev, K., Ishii, H. A., Janssens, K., Joswiak, D., Kearsley, A. T., Khodja, H., Lanzirotti, A., Leitner, J., Lemelle, L., Leroux, H., Luening, K., MacPherson, G. J., Marhas, K. K., Marcus, M. A., Matrajt, G., Nakamura, T., Nakamura-Messenger, K., Nakano, T., Newville, M., Papanastassiou, D. A., Pianetta, P., Rao, W., Riekel, C., Rietmeijer, F. J., Rost, D., Schwandt, C. S., See, T. H., Sheffield-Parker, J., Simionovici, A., Sitnitsky, I., Snead, C. J., Stadermann, F. J., Stephan, T., Stroud, R. M., Susini, J., Suzuki, Y., Sutton, S. R., Taylor, S., Teslich, N., Troadec, D., Tsou, P., Tsuchiyama, A., Uesugi, K., Vekemans, B., Vicenzi, E. P., Vincze, L., Westphal, A. J., Wozniakiewicz, P., Zinner, E., Zolensky, M. E. 2006; 314 (5806): 1731-1735

    Abstract

    We measured the elemental compositions of material from 23 particles in aerogel and from residue in seven craters in aluminum foil that was collected during passage of the Stardust spacecraft through the coma of comet 81P/Wild 2. These particles are chemically heterogeneous at the largest size scale analyzed ( approximately 180 ng). The mean elemental composition of this Wild 2 material is consistent with the CI meteorite composition, which is thought to represent the bulk composition of the solar system, for the elements Mg, Si, Mn, Fe, and Ni to 35%, and for Ca and Ti to 60%. The elements Cu, Zn, and Ga appear enriched in this Wild 2 material, which suggests that the CI meteorites may not represent the solar system composition for these moderately volatile minor elements.

    View details for DOI 10.1126/science.1136141

    View details for Web of Science ID 000242833600046

    View details for PubMedID 17170294

  • Comet 81P/Wild 2 under a microscope. Science Brownlee, D., Tsou, P., Aléon, J., Alexander, C. M., Araki, T., Bajt, S., Baratta, G. A., Bastien, R., Bland, P., Bleuet, P., Borg, J., Bradley, J. P., Brearley, A., Brenker, F., Brennan, S., Bridges, J. C., Browning, N. D., Brucato, J. R., Bullock, E., Burchell, M. J., Busemann, H., Butterworth, A., Chaussidon, M., Cheuvront, A., Chi, M., Cintala, M. J., Clark, B. C., Clemett, S. J., Cody, G., Colangeli, L., Cooper, G., Cordier, P., Daghlian, C., Dai, Z., D'Hendecourt, L., Djouadi, Z., Dominguez, G., Duxbury, T., Dworkin, J. P., Ebel, D. S., Economou, T. E., Fakra, S., Fairey, S. A., Fallon, S., Ferrini, G., Ferroir, T., Fleckenstein, H., Floss, C., Flynn, G., Franchi, I. A., Fries, M., Gainsforth, Z., Gallien, J., Genge, M., Gilles, M. K., Gillet, P., Gilmour, J., Glavin, D. P., Gounelle, M., Grady, M. M., Graham, G. A., Grant, P. G., Green, S. F., Grossemy, F., Grossman, L., Grossman, J. N., Guan, Y., Hagiya, K., Harvey, R., Heck, P., Herzog, G. F., Hoppe, P., Hörz, F., Huth, J., Hutcheon, I. D., Ignatyev, K., Ishii, H., Ito, M., Jacob, D., Jacobsen, C., Jacobsen, S., Jones, S., Joswiak, D., Jurewicz, A., Kearsley, A. T., Keller, L. P., Khodja, H., Kilcoyne, A. L., Kissel, J., Krot, A., Langenhorst, F., Lanzirotti, A., Le, L., Leshin, L. A., Leitner, J., Lemelle, L., Leroux, H., Liu, M., Luening, K., Lyon, I., MacPherson, G., Marcus, M. A., Marhas, K., Marty, B., Matrajt, G., McKeegan, K., Meibom, A., Mennella, V., Messenger, K., Messenger, S., Mikouchi, T., Mostefaoui, S., Nakamura, T., Nakano, T., Newville, M., Nittler, L. R., Ohnishi, I., Ohsumi, K., Okudaira, K., Papanastassiou, D. A., Palma, R., Palumbo, M. E., Pepin, R. O., Perkins, D., Perronnet, M., Pianetta, P., Rao, W., Rietmeijer, F. J., Robert, F., Rost, D., Rotundi, A., Ryan, R., Sandford, S. A., Schwandt, C. S., See, T. H., Schlutter, D., Sheffield-Parker, J., Simionovici, A., Simon, S., Sitnitsky, I., Snead, C. J., Spencer, M. K., Stadermann, F. J., Steele, A., Stephan, T., Stroud, R., Susini, J., Sutton, S. R., Suzuki, Y., Taheri, M., Taylor, S., Teslich, N., Tomeoka, K., Tomioka, N., Toppani, A., Trigo-Rodríguez, J. M., Troadec, D., Tsuchiyama, A., Tuzzolino, A. J., Tyliszczak, T., Uesugi, K., Velbel, M., Vellenga, J., Vicenzi, E., Vincze, L., Warren, J., Weber, I., Weisberg, M., Westphal, A. J., Wirick, S., Wooden, D., Wopenka, B., Wozniakiewicz, P., Wright, I., Yabuta, H., Yano, H., Young, E. D., Zare, R. N., Zega, T., Ziegler, K., Zimmerman, L., Zinner, E., Zolensky, M. 2006; 314 (5806): 1711-1716

    Abstract

    The Stardust spacecraft collected thousands of particles from comet 81P/Wild 2 and returned them to Earth for laboratory study. The preliminary examination of these samples shows that the nonvolatile portion of the comet is an unequilibrated assortment of materials that have both presolar and solar system origin. The comet contains an abundance of silicate grains that are much larger than predictions of interstellar grain models, and many of these are high-temperature minerals that appear to have formed in the inner regions of the solar nebula. Their presence in a comet proves that the formation of the solar system included mixing on the grandest scales.

    View details for PubMedID 17170289

  • Research article - Comet 81P/Wild 2 under a microscope SCIENCE Brownlee, D., Tsou, P., Aleon, J., Alexander, C. M., Araki, T., Bajt, S., Baratta, G. A., Bastien, R., Bland, P., Bleuet, P., Borg, J., Bradley, J. P., Brearley, A., Brenker, F., Brennan, S., Bridges, J. C., Browning, N. D., Brucato, J. R., Bullock, E., Burchell, M. J., Busemann, H., Butterworth, A., Chaussidon, M., Cheuvront, A., Chi, M., Cintala, M. J., Clark, B. C., Clemett, S. J., Cody, G., Colangeli, L., Cooper, G., Cordier, P., Daghlian, C., Dai, Z., D'Hendecourt, L., Djouadi, Z., Dominguez, G., Duxbury, T., Dworkin, J. P., Ebel, D. S., Economou, T. E., Fakra, S., Fairey, S. A., Fallon, S., Ferrini, G., Ferroir, T., Fleckenstein, H., Floss, C., Flynn, G., Franchi, I. A., Fries, M., Gainsforth, Z., Gallien, J., Genge, M., Gilles, M. K., Gillet, P., Gilmour, J., Glavin, D. P., Gounelle, M., Grady, M. M., Graham, G. A., Grant, P. G., Green, S. F., Grossemy, F., Grossman, L., Grossman, J. N., Guan, Y., Hagiya, K., Harvey, R., Heck, P., Herzog, G. F., Hoppe, P., Hoerz, F., Huth, J., Hutcheon, I. D., Ignatyev, K., Ishii, H., Ito, M., Jacob, D., Jacobsen, C., Jacobsen, S., Jones, S., Joswiak, D., Jurewicz, A., Kearsley, A. T., Keller, L. P., Khodja, H., Kilcoyne, A. L., Kissel, J., Krot, A., Langenhorst, F., Lanzirotti, A., Le, L., Leshin, L. A., Leitner, J., Lemelle, L., Leroux, H., Liu, M., Luening, K., Lyon, I., MacPherson, G., Marcus, M. A., Marhas, K., Marty, B., Matrajt, G., McKeegan, K., Meibom, A., Mennella, V., Messenger, K., Messenger, S., Mikouchi, T., Mostefaoui, S., Nakamura, T., Nakano, T., Newville, M., Nittler, L. R., Ohnishi, I., Ohsumi, K., Okudaira, K., Papanastassiou, D. A., Palma, R., Palumbo, M. E., Pepin, R. O., Perkins, D., Perronnet, M., Pianetta, P., Rao, W., Rietmeijer, F. J., Robert, F., Rost, D., Rotundi, A., Ryan, R., Sandford, S. A., Schwandt, C. S., See, T. H., Schlutter, D., Sheffield-Parker, J., Simionovici, A., Simon, S., Sitnitsky, I., Snead, C. J., Spencer, M. K., Stadermann, F. J., Steele, A., Stephan, T., Stroud, R., Susini, J., Sutton, S. R., Suzuki, Y., Taheri, M., Taylor, S., Teslich, N., Tomeoka, K., Tomioka, N., Toppani, A., Trigo-Rodriguez, J. M., Troadec, D., Tsuchiyama, A., Tuzzolino, A. J., Tyliszczak, T., Uesugi, K., Velbel, M., Vellenga, J., Vicenzi, E., Vincze, L., Warren, J., Weber, I., Weisberg, M., Westphal, A. J., Wirick, S., Wooden, D., Wopenka, B., Wozniakiewicz, P., Wright, I., Yabuta, H., Yano, H., Young, E. D., Zare, R. N., Zega, T., Ziegler, K., Zimmerman, L., Zinner, E., Zolensky, M. 2006; 314 (5806): 1711-1716

    Abstract

    The Stardust spacecraft collected thousands of particles from comet 81P/Wild 2 and returned them to Earth for laboratory study. The preliminary examination of these samples shows that the nonvolatile portion of the comet is an unequilibrated assortment of materials that have both presolar and solar system origin. The comet contains an abundance of silicate grains that are much larger than predictions of interstellar grain models, and many of these are high-temperature minerals that appear to have formed in the inner regions of the solar nebula. Their presence in a comet proves that the formation of the solar system included mixing on the grandest scales.

    View details for DOI 10.1126/science.1135840

    View details for Web of Science ID 000242833600041

  • Roles of oxygen and water vapor in the oxidation of halogen terminated Ge(111) surfaces APPLIED PHYSICS LETTERS Sun, S., Sun, Y., Liu, Z., Lee, D., Pianetta, P. 2006; 89 (23)

    View details for DOI 10.1063/1.2403908

    View details for Web of Science ID 000242709200049

  • Photoelectron emission studies in CsBr at 257 nm 50th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication Maldonado, J. R., Liu, Z., Sun, Y., Pianetta, P. A., Pease, F. W. A V S AMER INST PHYSICS. 2006: 2886–91

    View details for DOI 10.1116/1.2363410

    View details for Web of Science ID 000243324400071

  • Chemical states and electrical properties of a high-k metal oxide/silicon interface with oxygen-gettering titanium-metal-overlayer APPLIED PHYSICS LETTERS Seo, K., Lee, D., Pianetta, P., Kim, H., Saraswat, K. C., McIntyre, P. C. 2006; 89 (14)

    View details for DOI 10.1063/1.2358834

    View details for Web of Science ID 000241056900088

  • CsBr photocathode at 257 nm: A rugged high current density electron source APPLIED PHYSICS LETTERS Liu, Z., Maldonado, J., Sun, Y., Pianetta, P., Pease, R. F. 2006; 89 (11)

    View details for DOI 10.1063/1.2354029

    View details for Web of Science ID 000240545400014

  • Surface termination and roughness of Ge(100) cleaned by HF and HCl solutions APPLIED PHYSICS LETTERS Sun, S. Y., Sun, Y., Liu, Z., Lee, D. I., Peterson, S., Pianetta, P. 2006; 88 (2)

    View details for DOI 10.1063/1.2162699

    View details for Web of Science ID 000234606900014

  • XRF microCT study of space objects at SSRL 5th Conference on Developments in X-Ray Tomography Ignatyev, K., Huwig, K., Harvey, R., Ishii, H., Bradley, J., Luening, K., Brennan, S., Pianetta, P. SPIE-INT SOC OPTICAL ENGINEERING. 2006

    View details for DOI 10.1117/12.681440

    View details for Web of Science ID 000241974100069

  • Dynamics modeling and analysis of gene guns for gene therapy IEEE International Conference on Robotics and Automation (ICRA) Zhang, M., Tao, W., Pianetta, P. A. IEEE. 2006: 1774–1779
  • Photoemission studies of passivation of germanium nanowires APPLIED PHYSICS LETTERS Adhikari, H., McIntyre, P. C., Sun, S. Y., Pianetta, P., Chidsey, C. E. 2005; 87 (26)

    View details for DOI 10.1063/1.2158027

    View details for Web of Science ID 000234338700081

  • Narrow cone emission from negative electron affinity photocathodes 49th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication Liu, Z., Sun, Y., Pianetta, P., Pease, R. F. A V S AMER INST PHYSICS. 2005: 2758–62

    View details for DOI 10.1116/1.2101726

    View details for Web of Science ID 000234613200092

  • Nitrogen doping and thermal stability in HfSiOxNy studied by photoemission and x-ray absorption spectroscopy APPLIED PHYSICS LETTERS Toyoda, S., Okabayashi, J., Takahashi, H., Oshima, M., Lee, D. I., Sun, S., Sun, S., Pianetta, P. A., Ando, T., Fukuda, S. 2005; 87 (18)

    View details for DOI 10.1063/1.2126112

    View details for Web of Science ID 000232886400059

  • Mercury transformations in chemical agent simulant as characterized by X-ray absorption fine spectroscopy TALANTA Skubal, L. R., Biedron, S. G., Newville, M., Schneider, J. F., Milton, S. V., Pianetta, P., O'Neill, H. J. 2005; 67 (4): 730-735

    Abstract

    Chemical analyses of U.S. stockpiled mustard chemical warfare agent show some agent destined for destruction contains mercury [L. Ember, Chem. Eng. News 82 (2004) 8]. Because of its toxicity, mercury must be removed from agent prior to incineration or be scrubbed from incineration exhaust to prevent release into the atmosphere. Understanding mercury/agent interactions is critical if either atmospheric or aqueous treatment processes are used. We investigate and compare the state of mercury in water to that in thiodiglycol, a mustard simulant, as co-contaminants are introduced. The effects of sodium hypochlorite and sodium hydroxide, common neutralization chemicals, on mercury in water and simulant with and without co-contaminants present are examined using X-ray absorption fine spectroscopy (XAFS).

    View details for DOI 10.1016/j.talanta.2005.03.030

    View details for Web of Science ID 000231992900010

    View details for PubMedID 18970232

  • Chemical states and electronic structure of a HfO2/Ge(001) interface APPLIED PHYSICS LETTERS Seo, K. I., McIntyre, P. C., Sun, S., Lee, D. I., Pianetta, P., Saraswat, K. C. 2005; 87 (4)

    View details for DOI 10.1063/1.2006211

    View details for Web of Science ID 000230725900045

  • Optimized cleaning method for producing device quality InP(100) surfaces JOURNAL OF APPLIED PHYSICS Sun, Y., Liu, Z., Machuca, F., Pianetta, P., SPICER, W. E. 2005; 97 (12)

    View details for DOI 10.1063/1.1935745

    View details for Web of Science ID 000230278100113

  • Zirconia-germanium interface photoemission spectroscopy using synchrotron radiation JOURNAL OF APPLIED PHYSICS Chui, C. O., Lee, D. I., Singh, A. A., Pianetta, P. A., Saraswat, K. C. 2005; 97 (11)

    View details for DOI 10.1063/1.1922090

    View details for Web of Science ID 000229804700034

  • William Edward Spicer - Obituary PHYSICS TODAY LINDAU, I., Pianetta, P. 2005; 58 (5): 86-87
  • Effects of post-deposition annealing on the material characteristics of ultrathin HfO2 films on silicon JOURNAL OF APPLIED PHYSICS Puthenkovilakam, R., Lin, Y. S., Choi, J., Lu, J., Blom, H. O., Pianetta, P., Devine, D., Sendler, M., Chang, J. P. 2005; 97 (2)

    View details for DOI 10.1063/1.1831543

    View details for Web of Science ID 000226700500051

  • Near-edge absorption spectroscopy of interplanetary dust particles PHYSICA SCRIPTA Brennan, S., Luening, K., Pianetta, P., Bradley, J., Graham, G., Westphal, A., Snead, C., Dominguez, G. 2005; T115: 261-263
  • Integrating molecular dynamics for DNA bio-chip fabrication and hybridization automation IEEE/ASME International Conference on Advanced Intelligent Mechatronics Zhang, M. J., Pianetta, P. A., Tarn, T. J. IEEE. 2005: 25–30
  • X-ray absorption fine-structure determination of interfacial polarization in SrTiO3 thin films grown on Si(001) PHYSICA SCRIPTA Woicik, J. C., Aguirre-Tostada, F. S., Herrera-Gomez, A., Droopad, R., Yu, Z., Schlom, D., Karapetrova, E., Zschack, P., Pianetta, P. 2005; T115: 620-622
  • Nucleation and growth of copper nanoparticles on silicon surfaces PHYSICA SCRIPTA Singh, A., Luening, K., Brennan, S., Homma, T., Kubo, N., Pianetta, P. 2005; T115: 714-716
  • Room temperature photo-oxidation of NH4F-prepared H-Si(111)(1x1) and H-x-Si(100) JOURNAL OF APPLIED PHYSICS Morse, K. A., Pianetta, P. 2004; 96 (11): 6851-6858

    View details for DOI 10.1063/1.1785835

    View details for Web of Science ID 000225300800141

  • Cs halide photocathode for multi-electron-beam pattern generator 48th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication Maldonado, J. R., Coyle, S. T., Shamoun, B., Yu, M., Gesley, M., Pianetta, P. A V S AMER INST PHYSICS. 2004: 3025–31

    View details for DOI 10.1116/1.1823433

    View details for Web of Science ID 000226439800084

  • Elastic anomaly for SrTiO3 thin films grown on Si(001) PHYSICAL REVIEW B Aguirre-Tostado, F. S., Herrera-Gomez, A., Woicik, J. C., Droopad, R., Yu, Z., Schlom, D. G., Zschack, P., Karapetrova, E., Pianetta, P., Hellberg, C. S. 2004; 70 (20)
  • Nondestructive dose determination and depth profiling of arsenic ultrashallow junctions with total reflection X-ray fluorescence analysis compared to dynamic secondary ion mass spectrometry 10th Symposium on Total Reflection X-Ray Fluorescence Analysis/39th Discussion Meeting on Chemical Analysis Pepponi, G., Streli, C., Wobrauschek, P., Zoeger, N., Luening, K., Pianetta, P., Giubertoni, D., Barozzi, M., Bersani, M. PERGAMON-ELSEVIER SCIENCE LTD. 2004: 1243–49
  • Electron scattering study within the depletion region of the GaN(0001) and the GaAs(100) surface APPLIED PHYSICS LETTERS Liu, Z., Machuca, F., Pianetta, P., SPICER, W. E., Pease, R. F. 2004; 85 (9): 1541-1543

    View details for DOI 10.1063/1.1785865

    View details for Web of Science ID 000223555000031

  • Aerogel keystones: Extraction of complete hypervelocity impact events from aerogel collectors METEORITICS & PLANETARY SCIENCE Westphal, A. J., Snead, C., Butterworth, A., Graham, G. A., Bradley, J. P., Bajt, S., Grant, P. G., Bench, G., Brennan, S., Pianetta, P. 2004; 39 (8): 1375-1386
  • Displacive phase transition in SrTiO3 thin films grown on Si(001) 50th International Symposium of the American-Vacuum-Society Aguirre-Tostado, F. S., Herrera-Gomez, A., Woicik, J. C., Droopad, R., Yu, Z., Schlom, D. G., Karapetrova, J., Zschack, P., Pianetta, P. A V S AMER INST PHYSICS. 2004: 1356–60

    View details for DOI 10.1116/1.1765657

    View details for Web of Science ID 000223322000045

  • Quantitative evaluation of iron at the silicon surface after wet cleaning treatments JOURNAL OF THE ELECTROCHEMICAL SOCIETY Caputo, D., Bacciaglia, P., Carpanese, C., Polignano, M. L., Lazzeri, P., Bersani, M., VANZETTI, L., Pianetta, P., Moro, L. 2004; 151 (5): G289-G296

    View details for DOI 10.1149/1.1668993

    View details for Web of Science ID 000221436900047

  • Surface trace element characterization of synthetic single crystal Al2O3 at the SSRL 8th International Conference on Synchrotron Radiation Instrumentation (SRI 2003) McGuire, S. C., Baham, M. J., Preddie, E., Brennan, S., Luening, K., Pianetta, P., Singh, A. AMER INST PHYSICS. 2004: 1182–1185
  • The nucleation and growth of Cu nanoclusters on silicon surfaces 8th International Conference on Synchrotron Radiation Instrumentation (SRI 2003) Singh, A., Luening, K., Brennan, S., Homma, T., Kubo, N., Pianetta, P. AMER INST PHYSICS. 2004: 1086–1089
  • Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL, beamline 3-3: Comparison of droplets with spin coated wafers 9th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods Streli, C., Pepponi, G., Wobrauschek, P., Zoger, N., Pianetta, P., Baur, K., Pahlke, S., Fabry, L., Mantler, C., Kanngiesser, B., Malzer, W. PERGAMON-ELSEVIER SCIENCE LTD. 2003: 2105–12
  • Effect of oxygen adsorption on the efficiency of magnesium photocathodes 47th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication Yuan, Q., Baum, A. W., Pease, R. F., Pianetta, P. A V S AMER INST PHYSICS. 2003: 2830–33

    View details for DOI 10.1116/1.1624265

    View details for Web of Science ID 000188193600100

  • Optimization and characterization of III-V surface cleaning 15th International Vacuum Microelectronics Conference (IVMC) Liu, Z., Sun, Y., Machuca, F., Pianetta, P., SPICER, W. E., Pease, R. F. A V S AMER INST PHYSICS. 2003: 1953–58

    View details for DOI 10.1116/1.1593644

    View details for Web of Science ID 000185080000140

  • Oxygen species in Cs/O activated gallium nitride (GaN) negative electron affinity photocathodes 15th International Vacuum Microelectronics Conference (IVMC) Machuca, F., Liu, Z., Sun, Y., Pianetta, P., SPICER, W. E., Pease, R. F. A V S AMER INST PHYSICS. 2003: 1863–69

    View details for DOI 10.1116/1.1589512

    View details for Web of Science ID 000185080000124

  • Interfacial properties of ZrO2 on silicon JOURNAL OF APPLIED PHYSICS Lin, Y. S., Puthenkovilakam, R., CHANG, J. P., Bouldin, C., Levin, I., Nguyen, N. V., Ehrstein, J., Sun, Y., Pianetta, P., Conard, T., Vandervorst, W., Venturo, V., Selbrede, S. 2003; 93 (10): 5945-5952

    View details for DOI 10.1063/1.1563844

    View details for Web of Science ID 000182789700015

  • Photoelectron spectroscopy to probe the mechanism of electron transfer through oligo(phenylene vinylene) bridges JOURNAL OF PHYSICAL CHEMISTRY B Sikes, H. D., Sun, Y., Dudek, S. P., Chidsey, C. E., Pianetta, P. 2003; 107 (5): 1170-1173

    View details for DOI 10.1021/jp026734a

    View details for Web of Science ID 000180755800010

  • Preparation of clean InP(100) surfaces studied by synchrotron radiation photoemission JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A Sun, Y., Liu, Z., Machuca, F., Pianetta, P., SPICER, W. E. 2003; 21 (1): 219-225

    View details for DOI 10.1116/1.1532738

    View details for Web of Science ID 000182598200032

  • Color filtering metallization for optoelectronic 100nm CMOS circuits IEEE International Electron Devices Meeting Schmidt, D. J., Pianetta, P. A. IEEE. 2003: 389–392
  • Fabrication and characterization of ultra-small polycrystalline silicon islands for advanced multi-level silicon-on-insulator applications 7th International Conference on Polycrystalline Semiconductors Schmidt, D., Pianetta, P. TRANS TECH PUBLICATIONS LTD. 2003: 441–446
  • Quantitative evaluation of iron at the silicon surface after wet cleaning treatments Symposium on Analytical Techniques for Semiconductor Materials and Process Characterization IV (ALTECH 2003) held at the 203rd Meeting of the Electrochemical-Society Caputo, D., Bacciaglia, P., Carpanese, C., Polignano, M. L., Lazzeri, P., Bersani, M., VANZETTI, L., Pianetta, P., Moro, L. ELECTROCHEMICAL SOCIETY INC. 2003: 493–504
  • Detection and characterization of trace element contamination on silicon wafers 19th International Conference on X-Ray and Inner-Shell Processes Singh, A., Baur, K., Brennan, S., Homma, T., Kubo, N., Pianetta, P. AMER INST PHYSICS. 2003: 472–480
  • Preparation of clean GaAs(100) studied by synchrotron radiation photoemission JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A Liu, Z., Sun, Y., Machuca, F., Pianetta, P., SPICER, W. E., Pease, R. F. 2003; 21 (1): 212-218

    View details for DOI 10.1116/1.1532737

    View details for Web of Science ID 000182598200031

  • Looking at trace impurities on silicon wafers with synchrotron radiation ANALYTICAL CHEMISTRY Baur, K., Brennan, S., Pianetta, P., Opila, R. 2002; 74 (23): 608A-616A

    View details for Web of Science ID 000179617700002

    View details for PubMedID 12498179

  • Role of oxygen in semiconductor negative electron affinity photocathodes 46th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication (EIPBN) Machuca, F., Liu, Z., Sun, Y., Pianetta, P., SPICER, W. E., Pease, R. F. A V S AMER INST PHYSICS. 2002: 2721–25

    View details for DOI 10.1116/1.1521742

    View details for Web of Science ID 000180307300093

  • Structural studies of ultrathin zirconia dielectrics PHILOSOPHICAL MAGAZINE LETTERS Ramanathan, S., McIntyre, P. C., Luning, J., Pianetta, P., Muller, D. A. 2002; 82 (9): 519-528
  • Simple method for cleaning gallium nitride (0001) 49th International Symposium of the American-Vacuum-Society Machuca, F., Liu, Z., Sun, Y., Pianetta, R., SPICER, W. E., Pease, R. F. A V S AMER INST PHYSICS. 2002: 1784–86

    View details for DOI 10.116/1.11503782

    View details for Web of Science ID 000178146700041

  • Quadrupole effects in core and valence photoelectron emission from crystalline germanium measured via a spatially modulated x-ray interference field PHYSICAL REVIEW B Nelson, E. J., Woicik, J. C., Pianetta, P., Vartanyants, I. A., Cooper, J. W. 2002; 65 (16)
  • Formation of (functionalized) monolayers and simultaneous surface patterning by scribing silicon in the presence of alkyl halides CHEMISTRY OF MATERIALS Niederhauser, T. L., Lua, Y. Y., Sun, Y., Jiang, G. L., Strossman, G. S., Pianetta, P., Linford, M. R. 2002; 14 (1): 27-?

    View details for DOI 10.1021/cm0108536

    View details for Web of Science ID 000173459300010

  • A study of fabrication and characterization of ultra-small polycrystalline silicon islands for advanced display and microsensor applications Symposium on Amorphous and Heterogeneous Silicon-Based Films held at the 2002 MRS Spring Meeting Schmidt, D., Shi, F., Pianetta, P. MATERIALS RESEARCH SOCIETY. 2002: 707–712
  • X-ray Absorption spectroscopy on copper trace impurities on silicon wafers Symposium on Silicon Materials held at the 2002 MRS Spring Meeting Singh, A., Baur, K., Brennan, S., Homma, T., Kubo, N., Pianetta, P. MATERIALS RESEARCH SOCIETY. 2002: 23–28
  • Photoemission from the Sr/Si(001) interface JOURNAL OF APPLIED PHYSICS Herrera-Gomez, A., Aguirre-Tostado, F. S., Sun, Y., Pianetta, P., Yu, Z., Marshall, D., Droopad, R., SPICER, W. E. 2001; 90 (12): 6070-6072
  • Laboratory and synchrotron radiation total-reflection X-ray fluorescence: new perspectives in detection limits and data analysis 8th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods Baur, K., Brennan, S., Burrow, B., Werho, D., Pianetta, P. PERGAMON-ELSEVIER SCIENCE LTD. 2001: 2049–56
  • Synchrotron radiation induced total reflection X-ray fluorescence of low Z elements on Si wafer surfaces at SSRL - comparison of excitation geometries and conditions 8th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods Streli, C., Wobrauschek, P., Kregsamer, P., Pepponi, G., Pianetta, P., Pahlke, S., Fabry, L. PERGAMON-ELSEVIER SCIENCE LTD. 2001: 2085–94
  • X-ray standing-wave investigations of valence electronic structure PHYSICAL REVIEW B Woicik, J. C., Nelson, E. J., Heskett, D., Warner, J., Berman, L. E., Karlin, B. A., Vartanyants, I. A., Hasan, M. Z., Kendelewicz, T., Shen, Z. X., Pianetta, P. 2001; 64 (12)
  • In situ x-ray photoelectron spectroscopy for thin film synthesis monitoring JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A Kelly, M. A., Shek, M. L., Pianetta, P., Gur, T. M., Beasley, M. R. 2001; 19 (5): 2127-2133
  • Recent advances and perspectives in synchrotron radiation TXRF 7th International Conference on Synchrotron Radiation Instrumentation (SRI 2000) Baur, K., Brennan, S., Werho, D., Moro, L., Pianetta, P. ELSEVIER SCIENCE BV. 2001: 1198–1201
  • Partial density of occupied valence states by x-ray standing waves and high-resolution photoelectron spectroscopy PHYSICAL REVIEW B Woicik, J. C., Nelson, E. J., Kendelewicz, T., Pianetta, P., Jain, M., Kronik, L., Chelikowsky, J. R. 2001; 63 (4)
  • Effect of silicon surface termination on copper deposition in deionized water JOURNAL OF THE ELECTROCHEMICAL SOCIETY Lim, S. W., Mo, R. T., Pianetta, P. A., Chidsey, C. E. 2001; 148 (1): C16-C20
  • Investigation of trace metals analyses of dry residue on silicon wafer surfaces by TXRF and ICP-MS 5th International Symposium on Ultra Clean Processing of Silicon Surfaces (UCPSS 2000) Wang, J., Balaz, M., Pianetta, P., Baur, K., Brennan, S. SCITEC PUBLICATIONS LTD. 2001: 75–79
  • Characterization of profiling techniques for ultralow energy arsenic implants ELECTROCHEMICAL AND SOLID STATE LETTERS Kasnavi, R., Sun, Y., Mount, G., Pianetta, P., Griffin, P. B., Plummer, J. D. 2001; 4 (1): G1-G3
  • Prospect for high brightness III-nitride electron emitter 44th International Conference on Electron Ion and Photon Beam Technology and Nanofabrication (EIPBN) Machuca, F., Sun, Y., Liu, Z., Ioakeimidi, K., Pianetta, P., Pease, R. F. A V S AMER INST PHYSICS. 2000: 3042–46
  • Role of delocalized nitrogen in determining the local atomic arrangement and mechanical properties of amorphous carbon nitride thin films JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A Holloway, B. C., Kraft, O., Shuh, D. K., Nix, W. D., Kelly, M., Pianetta, P., Hagstrom, S. 2000; 18 (6): 2964-2971
  • Aluminum impurities in silicon: Investigation of x-ray Raman scattering in total reflection x-ray fluorescence spectroscopy JOURNAL OF APPLIED PHYSICS Baur, K., Kerner, J., Brennan, S., Singh, A., Pianetta, P. 2000; 88 (8): 4642-4647
  • Application of synchrotron radiation to TXRF analysis of metal contamination on silicon wafer surfaces 11th International Conference on Thin Films (ICTF-11) Pianetta, P., Baur, K., Singh, A., Brennan, S., Kerner, J., Werho, D., Wang, J. ELSEVIER SCIENCE SA. 2000: 222–26
  • Geometrical structure of the 1/2-ML (2X1) and 1/3-ML (2X3) Ba/Si(001) interfaces PHYSICAL REVIEW B Herrera-Gomez, A., Pianetta, P., Marshall, D., Nelson, E., SPICER, W. E. 2000; 61 (19): 12988-12991
  • Characterization of arsenic dose loss at the Si/SiO2 interface JOURNAL OF APPLIED PHYSICS Kasnavi, R., Sun, Y., Mo, R., Pianetta, P., Griffin, P. B., Plummer, J. D. 2000; 87 (5): 2255-2260
  • Direct measurement of valence-charge asymmetry by x-ray standing waves PHYSICAL REVIEW LETTERS Woicik, J. C., Nelson, E. J., Pianetta, P. 2000; 84 (4): 773-776

    Abstract

    By monitoring valence-photoelectron emission under condition of strong x-ray Bragg reflection, we have determined that a majority of GaAs valence charge resides on the anion sites of this heteropolar crystal, in quantitative agreement with the GaAs bond polarity as calculated from the Hartree-Fock term values. In contrast, the valence-charge distribution in Ge is found to be symmetric. In both cases, the valence emission is found to be closely coupled to the atomic cores.

    View details for Web of Science ID 000084891700049

    View details for PubMedID 11017369

  • Investigation of Na impurities on Si wafer surfaces using TXRF 11th US National Conference on Synchrotron Radiation Instrumentation Baur, K., Singh, A., Wang, J., Kerner, J., Pianetta, P. AMER INST PHYSICS. 2000: 161–166
  • The effect of dilute cleaning and rinsing chemistries on transition metal removal and si surface microroughness 6th International Symposium on Cleaning Technology in Semiconductor Device Manufacturing CHANG, J. P., Sapjeta, J., Rosamilia, J. M., Boone, T., Eng, J., Opila, R. L., Brennan, S., Wiemer, C., Pianetta, P. ELECTROCHEMICAL SOCIETY INC. 2000: 17–24
  • Ultraviolet light stimulated halogen chemistry on cleaning silicon surfaces 6th International Symposium on Cleaning Technology in Semiconductor Device Manufacturing CHANG, J. P., Eng, J., Sapjeta, J., Opila, R. L., Cox, P., Pianetta, P. ELECTROCHEMICAL SOCIETY INC. 2000: 129–36
  • Atomic-scale mechanistic study of iodine/alcohol passivated Si(100) 6th International Symposium on Cleaning Technology in Semiconductor Device Manufacturing Mo, R. T., Burr, T. A., Merklin, G. T., Machuca, F., Pianetta, P. A., Kimerling, L. C., Chiarello, R. P., Chidsey, C. E. ELECTROCHEMICAL SOCIETY INC. 2000: 545–52
  • Low Z total reflection X-ray fluorescence analysis - challenges and answers 7th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF 98) Streli, C., Kregsamer, P., Wobrauschek, P., Gatterbauer, H., Pianetta, P., Pahlke, S., Fabry, L., Palmetshofer, L., Schmeling, M. PERGAMON-ELSEVIER SCIENCE LTD. 1999: 1433–41
  • Synchrotron radiation-excited glancing incidence XRF for depth profile and thin-film analysis of light elements European Conference on Energy Dispersive X-Ray Spectrometry 1998 (EDXRS-98) Kregsamer, P., Streli, C., Wobrauschek, P., Gatterbauer, H., Pianetta, P., Palmetshofer, L., Brehm, L. L. JOHN WILEY & SONS LTD. 1999: 292–96
  • Can studies of the II-VIs profit from the use of synchrotron radiation and the DOE financial support thereof? 17th US Workshop on the Physics and Chemistry of II-VI Materials SPICER, W. E., Herrera-Gomez, A., Pianetta, P. SPRINGER. 1999: 804–9
  • Interpretation of x-ray photoelectron spectra of elastic amorphous carbon nitride thin films APPLIED PHYSICS LETTERS Holloway, B. C., Kraft, O., Shuh, D. K., Kelly, M. A., Nix, W. D., Pianetta, P., Hagstrom, S. 1999; 74 (22): 3290-3292
  • Bonding modifications in carbon nitride films induced by thermal annealing: An x-ray absorption near edge study APPLIED PHYSICS LETTERS Jimenez, I., Tong, W. M., Shuh, D. K., Holloway, B. C., Kelly, M. A., Pianetta, P., Terminello, L. J., Himpsel, F. J. 1999; 74 (18): 2620-2622
  • Direct measurement of valence charge asymmetry in GaAs using X-ray standing waves 10th International Conference on XAFS (XAFS X) Nelson, E., Woicik, J., Pianetta, P. WILEY-BLACKWELL. 1999: 341–343

    View details for Web of Science ID 000081221700079

    View details for PubMedID 15263301

  • Alkyl-terminated Si(111) surfaces: A high-resolution, core level photoelectron spectroscopy study JOURNAL OF APPLIED PHYSICS Terry, J., Linford, M. R., Wigren, C., Cao, R. Y., Pianetta, P., Chidsey, C. E. 1999; 85 (1): 213-221
  • Reaction of water with vacuum-cleaved CaO(100) surfaces: an X-ray photoemission spectroscopy study SURFACE SCIENCE Liu, P., Kendelewicz, T., Brown, G. E., Parks, G. A., Pianetta, P. 1998; 416 (1-2): 326-340
  • Characterization of arsenic dose loss at the Si/SiO2 interface using high resolution X-ray Photoelectron Spectrometry International Electron Devices Meeting (IEDM) Kasnavi, R., Pianetta, P., Sun, Y., Mo, R. N., Griffin, P. B., Plummer, J. D. IEEE. 1998: 721–724
  • Update on synchrotron radiation TXRF: New results Symposium on Applications of Synchrotron Radiation Techniques to Materials Science IV Brennan, S., Pianetta, P., Ghosh, S., Takaura, N., Wiemer, C., Fischer-Colbrie, A., Laderman, S., Shimazaki, A., Waldhauer, A., Zaitz, M. A. MATERIALS RESEARCH SOCIETY. 1998: 245–249
  • Reactivity of the H-Si (111) surface 1st International Conference on Synchrotron Radiation in Materials Science (ICSRMS 96) Terry, J., Mo, R., Wigren, C., Cao, R. Y., Mount, G., Pianetta, P., Linford, M. R., Chidsey, C. E. ELSEVIER SCIENCE BV. 1997: 94–101
  • Early work with synchrotron radiation at Stanford JOURNAL OF SYNCHROTRON RADIATION Doniach, S., Hodgson, K., LINDAU, I., Pianetta, P., Winick, H. 1997; 4: 380-395

    Abstract

    The use of synchrotron radiation in the soft and hard X-ray spectral region received major impetus with the start of parasitic operation of the Stanford Synchrotron Radiation Project (SSRP) in 1974. This was the first time that synchrotron radiation from a multi-GeV electron storage ring was made available in a user facility for studying the structure of matter. Here we review the early work at SSRP as well as the activities that preceded it, highlighting the scientific accomplishments (soft X-ray photoemission, EXAFS, protein crystallography), beamline instrumentation developments and source improvements. The early work using bending-magnet radiation led to the funding of several dedicated facilities in the US and elsewhere in the world - the so-called second-generation light sources. Early work with wiggler and undulator insertion devices led to funding of third-generation sources better optimized for insertion device sources, particularly undulators.

    View details for Web of Science ID A1997YH05900007

    View details for PubMedID 16699252

  • Determination of the bonding of alkyl monolayers to the Si(111) surface using chemical-shift, scanned-energy photoelectron diffraction APPLIED PHYSICS LETTERS Terry, J., Linford, M. R., Wigren, C., Cao, R. Y., Pianetta, P., Chidsey, C. E. 1997; 71 (8): 1056-1058
  • Total reflection X-ray fluorescence analysis of light elements with synchrotron radiation and special X-ray tubes 6th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF 96) Streli, C., Wobrauschek, P., Bauer, V., Kregsamer, P., Gorgl, R., Pianetta, P., Ryon, R., Pahlke, S., Fabry, L. PERGAMON-ELSEVIER SCIENCE LTD. 1997: 861–72
  • New surface phases for potassium adatoms on cleaved Si(111) SURFACE SCIENCE Nelson, E. J., Kendelewicz, T., Liu, P., Pianetta, P. 1997; 380 (2-3): 365-376
  • Microscopic chemical state identification of a silicon-carbide fiber by soft x-ray photoabsorption spectroscopy APPLIED PHYSICS LETTERS Ma, Q., Rosenberg, R. A., Kim, C. Y., Grepstad, J., Pianetta, P. 1997; 70 (18): 2389-2391
  • Comparative magnetic-field imaging, electric-field imaging, and scanning Auger microscopy study of metal-matrix composites JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA Ma, Q., Rosenberg, R. A., Kim, C. Y., Grepstad, J., Pianetta, P., Droubay, T., Dunham, D., Tonner, B. 1997; 84 (1-3): 99-107
  • Synthesis and characterization of amorphous carbon nitride films 23rd International Conference on Metallurgical Coatings and Thin Films Holloway, B. C., Shuh, D. K., Kelly, M. A., Tong, W., Carlisle, J. A., Jimenez, I., Sutherland, D. G., Terminello, L. J., Pianetta, P., Hagstrom, S. ELSEVIER SCIENCE SA. 1996: 94–98
  • Near-edge x-ray absorption of carbon materials for determining bond hybridization In mixed sp2/sp3 bonded materials APPLIED PHYSICS LETTERS Coffman, F. L., Cao, R., Pianetta, P. A., Kapoor, S., Kelly, M., Terminello, L. J. 1996; 69 (4): 568-570
  • Interaction of hydrogen ions with oxidized GaAs(100) and AlAs(100) surfaces 23rd Annual Conference on the Physics and Chemistry of Semiconductor Interfaces Chang, Y. L., Cao, R., SPICER, W. E., Pianetta, P., Shi, S., Hu, E., Merz, J. A V S AMER INST PHYSICS. 1996: 2914–17
  • Surface-sensitive x-ray standing-wave study of Si(111)root 3x root 3-Ag PHYSICAL REVIEW B Woicik, J. C., Kendelewicz, T., YOSHIKAWA, S. A., Miyano, K. E., Herman, G. S., COWAN, P. L., Pianetta, P., SPICER, W. E. 1996; 53 (23): 15425-15428
  • Evidence for Physical review. B, Condensed matter Filipponi, Di Cicco A, Pianetta, Kendelewicz 1996; 53 (23): 15571-15576

    View details for PubMedID 9983389

  • Evidence for [1s2p]3p shake-up channels in compounds and oxides of third-period elements PHYSICAL REVIEW B Filipponi, A., DICICCO, A., Pianetta, P., Kendelewicz, T. 1996; 53 (23): 15571-15576
  • Photoemission study of Na and Cs adsorption on MgO(100)1 x 1 15th European Conference on Surface Science Kendelewicz, T., Liu, P., Brown, G. E., Nelson, E. J., Pianetta, P. ELSEVIER SCIENCE BV. 1996: 451–456
  • Photoelectron emission from the cesiated diamond (110) surface Symposium on Diamond for Electronic Applications Fox, C. A., Kelly, M. A., HAGSTROM, S. B., Cao, R., VERGARA, G., Pianetta, P., Pan, L. S., Hsu, W. L. MATERIALS RESEARCH SOC. 1996: 449–454
  • Silicon wafer trace impurity analysis using synchrotron radiation International Workshop on Semiconductor Characterization - Present Status and Future Needs LADERMAN, S. S., FISCHERCOLBRIE, A., Shimazaki, A., Miyazaki, K., Brennan, S., Takaura, N., Pianetta, P., Kortright, J. B. AIP PRESS. 1996: 273–277
  • THE EFFECT OF RAPID THERMAL N2O NITRIDATION ON THE OXIDE/SI(100) INTERFACE STRUCTURE APPLIED PHYSICS LETTERS LU, Z. H., Tay, S. P., Cao, R., Pianetta, P. 1995; 67 (19): 2836-2838
  • HIGH-SENSITIVITY TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROSCOPY OF SILICON-WAFERS USING SYNCHROTRON-RADIATION 5th Workshop on Total Reflection X-Ray Fluorescence Spectroscopy and Related Spectroscopical Methods LADERMAN, S. S., FISCHERCOLBRIE, A., Shimazaki, A., Miyazaki, K., Brennan, S., Takakura, N., Pianetta, P., Kortright, J. B. JAPAN SOC ANALYTICAL CHEM. 1995: 515–18
  • CONSTRUCTION OF A NEW IMAGING BANDPASS ANALYZER FOR A MAGNETIC PROJECTION PHOTOELECTRON MICROSCOPE REVIEW OF SCIENTIFIC INSTRUMENTS Kim, C., Pianetta, P., Kelly, M. A. 1995; 66 (5): 3159-3167
  • Negative electron affinity on GaAs(110) with Cs and NF3: A surface science study Photodetectors and Power Meters II Conference Cao, R., Tang, H., Pianetta, P. SPIE-INT SOC OPTICAL ENGINEERING. 1995: 132–141
  • BEHAVIOR OF TELLURIUM ON SILICON(100) SURFACE SCIENCE YOSHIKAWA, S. A., Nogami, J., Quate, C. F., Pianetta, P. 1994; 321 (3): L183-L188
  • SYNCHROTRON-RADIATION TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROSCOPY FOR WAFER SURFACE TRACE IMPURITY ANALYSIS LADERMAN, S. S., FISCHERCOLBRIE, A., Shimazaki, A., Miyazaki, K., Kaneko, M., Matsumura, T., Brennan, S., Takaura, N., Pianetta, P., Kortright, J. B. AMER CHEMICAL SOC. 1994: 60-IEC
  • SHORT-WAVELENGTH FELS USING THE SLAC LINAC 8th National Conference on Synchrotron Radiation Instrumentation Winick, H., Bane, K., Boyce, R., Cobb, J., Loew, G., Morton, P., Nuhn, H. D., Paterson, J., Pianetta, P., Raubenheimer, T., Seeman, J., Tatchyn, R., Vylet, V., Pellegrini, C., Rosenzweig, J., Travish, G., Prosnitz, D., Scharlemann, E. T., Halbach, K., Kim, K. J., Schlueter, R., Xie, M., Bonifacio, R., Desalvo, L., Pierini, P. ELSEVIER SCIENCE BV. 1994: 199–205
  • WIDE BAND-PASS APPROACHES TO TOTAL-REFLECTION X-RAY-FLUORESCENCE USING SYNCHROTRON-RADIATION 8th National Conference on Synchrotron Radiation Instrumentation Brennan, S., Tompkins, W., Takaura, N., Pianetta, P., LADERMAN, S. S., FISCHERCOLBRIE, A., Kortright, J. B., Madden, M. C., Wherry, D. C. ELSEVIER SCIENCE BV. 1994: 417–21
  • PHOTOEMISSION-STUDY OF AU, GE, AND O2 DEPOSITION ON NH4F ETCHED SI(111) JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A Terry, J., Cao, R., Wigren, C., Pianetta, P. 1994; 12 (4): 1869-1875
  • GEOMETRICAL STRUCTURE OF THE BI/GAP (110) INTERFACE - AN X-RAY STANDING-WAVE TRIANGULATION STUDY OF A NONIDEAL SYSTEM JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A HERRERAGOMEZ, A., Kendelewicz, T., Woicik, J. C., Miyano, K. E., Pianetta, P., Southworth, S., COWAN, P. L., Karlin, A., SPICER, W. E. 1994; 12 (4): 2473-2477
  • CAF2 OVERLAYERS TO PRESERVE THE IDEAL TERMINATION OF SB/GAAS(110) 40th National Symposium of the American-Vacuum-Society Green, A. M., SPICER, W. E., Kim, C., Cao, R., Pianetta, P. A V S AMER INST PHYSICS. 1994: 1158–69
  • STRUCTURAL STUDY OF MONOLAYERS OF SB ON GE(111) WITH DIFFERENT SURFACE RECONSTRUCTIONS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A Kendelewicz, T., Woicik, J. C., Miyano, K. E., YOSHIKAWA, S. A., Pianetta, P., SPICER, W. E. 1994; 12 (4): 1843-1847
  • TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS OF LIGHT-ELEMENTS USING SYNCHROTRON-RADIATION NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT Streli, C., Wobrauschek, P., LADISICH, W., Rieder, R., Aiginger, H., Ryon, R. W., Pianetta, P. 1994; 345 (2): 399-403
  • THE SLAC SOFT-X-RAY HIGH-POWER FEL 15th International Free Electron Laser Conference Pellegrini, C., Rosenzweig, J., Travish, G., Bane, K., Boyce, R., Loew, G., Morton, P., Nuhn, H. D., Paterson, J., Pianetta, P., Raubenheimer, T., Seeman, J., Tatchyn, R., Vylet, V., Winick, H., Halbach, K., Kim, K. J., Xie, M., Prosnitz, D., Scharlemann, E. T., Bonifacio, R., Desalvo, L., Pierini, P. ELSEVIER SCIENCE BV. 1994: 326–30
  • BORON RECONSTRUCTED SI(111) SURFACES PRODUCED BY B2O3 DECOMPOSITION Workshop Program on Interface Formation and Dynamics in Layered Structures, at the Scanning Microscopy 1994 Meeting Nogami, J., Yoshikawa, S., Glueckstein, J. C., Pianetta, P. SCANNING MICROSCOPY INT. 1994: 835–40
  • A PERFORMANCE AND APPLICATIONS STUDY OF THE PHOTOELECTRON SPECTROMICROSCOPE JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA Keenlyside, M., Pianetta, P. 1993; 66 (1-2): 189-207
  • STRUCTURAL INFORMATION ON Y-IONS IN C82 FROM EXAFS EXPERIMENTS CHEMICAL PHYSICS LETTERS Park, C. H., Wells, B. O., DiCarlo, J., Shen, Z. X., Salem, J. R., Bethune, D. S., Yannoni, C. S., Johnson, R. D., deVries, M. S., Booth, C., Bridges, F., Pianetta, P. 1993; 213 (1-2): 196-201
  • IN/SI(111)-ROOT-3X-ROOT-3 INTERFACE - AN UNRELAXED T(4) GEOMETRY PHYSICAL REVIEW LETTERS Woicik, J. C., Kendelewicz, T., HERRERAGOMEZ, A., Miyano, K. E., COWAN, P. L., Bouldin, C. E., Pianetta, P., SPICER, W. E. 1993; 71 (8): 1204-1207
  • PARTICLE-INDUCED AND PHOTOINDUCED CONDUCTIVITY IN TYPE-IIA DIAMONDS JOURNAL OF APPLIED PHYSICS Pan, L. S., Han, S., Kania, D. R., Zhao, S., Gan, K. K., Kagan, H., Kass, R., Malchow, R., Morrow, F., Palmer, W. F., White, C., Kim, S. K., SANNES, F., Schnetzer, S., Stone, R., Thomson, G. B., Sugimoto, Y., FRY, A., Kanda, S., Olsen, S., Franklin, M., Ager, J. W., Pianetta, P. 1993; 74 (2): 1086-1095
  • ADATOM LOCATION ON THE SI(111) 7X7 AND SI(111) ROOT-3X-ROOT-3-IN SURFACES BY THE X-RAY STANDING-WAVE AND PHOTOEMISSION TECHNIQUES 39TH NATIONAL SYMP OF THE AMERICAN VACUUM SOC Woicik, J. C., Kendelewicz, T., HERRERAGOMEZ, A., ANDREWS, A. B., Kim, B. S., COWAN, P. L., Miyano, K. E., Bouldin, C. E., Karlin, B. A., Herman, G. S., Erskine, J. L., Pianetta, P., SPICER, W. E. A V S AMER INST PHYSICS. 1993: 2359–63
  • DETERMINATION OF THE GEOMETRICAL CONFIGURATION OF BI ON GAAS (110) BY X-RAY STANDING-WAVE TRIANGULATION 39TH NATIONAL SYMP OF THE AMERICAN VACUUM SOC HERRERAGOMEZ, A., Kendelewicz, T., Woicik, J. C., Miyano, K. E., Pianetta, P., Southworth, S., COWAN, P. L., Karlin, B. A., SPICER, W. E. A V S AMER INST PHYSICS. 1993: 2354–58
  • PHOTOEMISSION-STUDY OF DIAMOND (100) SURFACE 39TH NATIONAL SYMP OF THE AMERICAN VACUUM SOC Wu, J., Cao, R., Yang, X., Pianetta, P., LINDAU, I. A V S AMER INST PHYSICS. 1993: 1048–51
  • A 2 TO 4NM HIGH-POWER FEL ON THE SLAC LINAC 14TH INTERNATIONAL CONF ON FREE ELECTRON LASER ( FEL 92 ) Pellegrini, C., Rosenzweig, J., Nuhn, H. D., Pianetta, P., Tatchyn, R., Winick, H., Bane, K., Morton, P., Raubenheimer, T., Seeman, J., Halbach, K., Kim, K. J., Kirz, J. ELSEVIER SCIENCE BV. 1993: 223–27
  • ATOMIC AND ELECTRONIC-STRUCTURE OF B/SI(100) 20TH ANNUAL CONF ON THE PHYSICS AND CHEMISTRY OF SEMICONDUCTOR INTERFACES Cao, R., Yang, X., Pianetta, P. A V S AMER INST PHYSICS. 1993: 1455–58
  • X-RAY STANDING-WAVE STUDY OF THE SB/GAAS(110) INTERFACE STRUCTURE 39TH NATIONAL SYMP OF THE AMERICAN VACUUM SOC Kendelewicz, T., Woicik, J. C., HERRERAGOMEZ, A., Miyano, K. E., COWAN, P. L., Karlin, B. A., Pianetta, P., SPICER, W. E. A V S AMER INST PHYSICS. 1993: 2351–53
  • CHARACTERIZATION OF THE B/SI SURFACE ELECTRONIC-STRUCTURES 39TH NATIONAL SYMP OF THE AMERICAN VACUUM SOC Cao, R., Yang, X., Pianetta, P. A V S AMER INST PHYSICS. 1993: 1817–22
  • STRUCTURE OF SB MONOLAYERS ON GE(111)2X1 - A COMBINED STUDY USING CORE-LEVEL PHOTOEMISSION, X-RAY STANDING WAVES, AND SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE 20TH ANNUAL CONF ON THE PHYSICS AND CHEMISTRY OF SEMICONDUCTOR INTERFACES Kendelewicz, T., Woicik, J. C., Miyano, K. E., HERRERAGOMEZ, A., COWAN, P. L., Pianetta, P., SPICER, W. E. A V S AMER INST PHYSICS. 1993: 1449–54
  • IMAGING BAND-PASS ANALYZER USING DOUBLE 90-DEGREES SPHERICAL ANALYZERS REVIEW OF SCIENTIFIC INSTRUMENTS Kim, C. Y., King, P. L., Pianetta, P., Kelly, M. A., Bryson, C. A. 1993; 64 (5): 1187-1193
  • SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY OF THE (1 MONOLAYER SB) GAP(110) INTERFACE PHYSICAL REVIEW B Miyano, K. E., Woicik, J. C., Kendelewicz, T., SPICER, W. E., Richter, M., Pianetta, P. 1993; 47 (11): 6444-6449
  • TEMPERATURE-DEPENDENT MOBILITY IN SINGLE-CRYSTAL AND CHEMICAL VAPOR-DEPOSITED DIAMOND JOURNAL OF APPLIED PHYSICS Pan, L. S., Kania, D. R., Pianetta, P., Ager, J. W., LANDSTRASS, M. I., Han, S. 1993; 73 (6): 2888-2894
  • THE EPITAXIAL-GROWTH OF GE ON SI(100) USING TE AS A SURFACTANT SYMP ON COMMON THEMES AND MECHANISMS OF EPITAXIAL GROWTH, AT THE 1993 SPRING MEETING AT THE MATERIALS-RESEARCH-SOC Yang, X., Cao, R., Li, J., Terry, J., Wu, J., Pianetta, P. MATERIALS RESEARCH SOC. 1993: 243–248
  • SYNCHROTRON-RADIATION FOR MEASUREMENT OF CONTAMINANTS ON SILICON SURFACES SYMP ON APPLICATIONS OF SYNCHROTON RADIATION TECHNIQUES TO MATERIALS SCIENCE, AT THE 1993 SPRING MEETING OF THE MATERIALS RESEARCH SOC Madden, M. C., Wherry, D. C., Pianetta, P., Brennan, S. MATERIALS RESEARCH SOC. 1993: 125–130
  • ELECTRICAL-PROPERTIES OF NATURAL IIA DIAMONDS USING PHOTO EXCITATION AND PARTICLE EXCITATION 1ST SYMP ON SEMICONDUCTORS FOR ROOM-TEMPERATURE RADIATION DETECTOR APPLICATIONS, AT THE 1993 SPRING MEETING OF THE MATERIALS RESEARCH SOC Pan, L. S., Han, S., Kania, D. R., Gan, K. K., Zhao, S., Kagan, H., Kass, R., Malchow, R., Morrow, F., Palmer, W. F., White, C., Kim, S. K., SANNES, F., Schnetzer, S., Stone, R., Thomson, G. B., Sugimoto, Y., FRY, A., Kanda, S., Olsen, S., Franklin, M., Ager, J. W., Pianetta, P. MATERIALS RESEARCH SOC. 1993: 245–250
  • LINAC COHERENT-LIGHT SOURCE (LCLS) AT 2-4 NM USING THE SLAC LINAC Conference on Electron-Beam Sources of High-Brightness Radiation Seeman, J. T., Bane, K., Boyce, R., Loew, G., Morton, P., Nuhn, H. D., Paterson, J., Pianetta, P., Raubenheimer, T., Tatchyn, R., Vylet, V., Winick, H., Pellegrini, C., Rosenzweig, J., Travish, G., Prosnitz, D., Scharlemann, E. T., Halbach, K., Kim, K. J., Xie, M. SPIE - INT SOC OPTICAL ENGINEERING. 1993: 116–125
  • X-RAY-BEAM LINES AND BEAM LINE COMPONENTS FOR THE SLAC LINAC COHERENT-LIGHT SOURCE (LCLS) 1993 Particle Accelerator Conference Tatchyn, R., Pianetta, P. I E E E. 1993: 1536–1538
  • MICROSCOPIC STUDY OF THE SURFACTANT-ASSISTED SI, GE EPITAXIAL-GROWTH APPLIED PHYSICS LETTERS Cao, R., Yang, X., Terry, J., Pianetta, P. 1992; 61 (19): 2347-2349
  • EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE DETERMINATION OF BOND-LENGTH CONSERVATION AT THE CLEAN INP(110) SURFACE PHYSICAL REVIEW B Woicik, J. C., Kendelewicz, T., Miyano, K. E., Richter, M., Bouldin, C. E., Pianetta, P., SPICER, W. E. 1992; 46 (15): 9869-9872
  • CA 3D UNOCCUPIED STATES IN BI2SR2CACU2O8 INVESTIGATED BY CA L(2,3) X-RAY-ABSORPTION NEAR-EDGE STRUCTURE PHYSICAL REVIEW B Borg, A., King, P. L., Pianetta, P., LINDAU, I., Mitzi, D. B., Kapitulnik, A., Soldatov, A. V., DELLALONGA, S., Bianconi, A. 1992; 46 (13): 8487-8495
  • STRUCTURAL CHARACTERIZATION OF THE (1 MONOLAYER SB)/GAP(110) INTERFACE USING X-RAY STANDING WAVES PHYSICAL REVIEW B Miyano, K. E., Kendelewicz, T., Woicik, J. C., COWAN, P. L., Bouldin, C. E., Karlin, B. A., Pianetta, P., SPICER, W. E. 1992; 46 (11): 6869-6874
  • X-RAY STANDING-WAVE STUDY OF MONOLAYERS OF SB ON GAAS(110) PHYSICAL REVIEW B Kendelewicz, T., Woicik, J. C., Miyano, K. E., HERRERAGOMEZ, A., COWAN, P. L., Karlin, B. A., Bouldin, C. E., Pianetta, P., SPICER, W. E. 1992; 46 (11): 7276-7279
  • ELECTRONIC-STRUCTURE OF SINGLE-CRYSTAL C-60 PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS Wu, J., Shen, Z. X., Dessau, D. S., Cao, R., Marshall, D. S., Pianetta, P., LINDAU, I., Yang, X., Terry, J., King, D. M., Wells, B. O., ELLOWAY, D., Wendt, H. R., Brown, C. A., HUNZIKER, H., deVries, M. S. 1992; 197 (3-4): 251-260
  • FERMI-LEVEL INHOMOGENEITIES ON THE GAAS (110) SURFACE IMAGED WITH A PHOTOELECTRON MICROSCOPE JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B Kim, C. Y., King, P. L., Pianetta, P. 1992; 10 (4): 1944-1948
  • SI(100) AND GE(100) CORE-LEVEL SHIFTS - A REEVALUATION JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B Yang, X., Cao, R., Terry, J., Pianetta, P. 1992; 10 (4): 2013-2017
  • EXTENDED X-RAY ABSORPTION FINE-STRUCTURE AND X-RAY STANDING WAVE STUDY OF THE CLEAN INP(110) SURFACE RELAXATION 38TH NATIONAL SYMP OF THE AMERICAN VACUUM SOC Woicik, J. C., Kendelewicz, T., Miyano, K. E., COWAN, P. L., Richter, M., Karlin, B. A., Bouldin, C. E., Pianetta, P., SPICER, W. E. A V S AMER INST PHYSICS. 1992: 2041–45
  • CORE-LEVEL SHIFTS OF THE GE(100)-(2X1) SURFACE AND THEIR ORIGINS PHYSICAL REVIEW B Cao, R., Yang, X., Terry, J., Pianetta, P. 1992; 45 (23): 13749-13752
  • ELECTRICAL TRANSPORT-PROPERTIES OF UNDOPED CVD DIAMOND FILMS SCIENCE Pan, L. S., Kania, D. R., Han, S., Ager, J. W., LANDSTRASS, M., Landen, O. L., Pianetta, P. 1992; 255 (5046): 830-833

    Abstract

    Polycrystalline diamond films synthesized by microwave-assisted chemical vapor deposition (MACVD) were examined with transient photoconductivity, and two fundamental electrical transport properties, the carrier mobility and lifetime, were measured. The highest mobility measured is 50 centimeters squared per volt per second at low initial carrier densities (<10(15) per cubic centimeter). Electron-hole scattering causes the carrier mobility to decrease at higher carrier densities. Although not measured directly, the carrier lifetime was inferred to be 40 picoseconds. The average drift length of the carriers is smaller than the average grain size and appears to be limited by defects within the grains. The carrier mobility in the MACVD films is higher than values measured in lower quality dc-plasma films but is much smaller than that of single-crystal natural diamond.

    View details for Web of Science ID A1992HD54800031

    View details for PubMedID 17756429

  • X-RAY STANDING-WAVE DETERMINATION OF THE CLEAN INP(110) SURFACE RECONSTRUCTION PHYSICAL REVIEW LETTERS Woicik, J. C., Kendelewicz, T., Miyano, K. E., COWAN, P. L., Bouldin, C. E., Karlin, B. A., Pianetta, P., SPICER, W. E. 1992; 68 (3): 341-344
  • THE STANFORD SYNCHROTRON RADIATION LABORATORY - AN UPDATE 4TH INTERNATIONAL CONF ON SYNCHROTRON RADIATION INSTRUMENTATION Cantwell, K., Pianetta, P. AMER INST PHYSICS. 1992: 1609–10
  • A PHOTOEMISSION-STUDY OF ELECTROCHEMICALLY ETCHED LIGHT-EMITTING SILICON Terry, J., Liu, H., Cao, R., Woicik, J. C., Pianetta, P., Yang, X., Wu, J., Richter, M., Maluf, N., Pease, F., Dillon, A., Robinson, M., George, S. MATERIALS RESEARCH SOC. 1992: 421–426
  • THE MULTISPECTRAL SOLAR TELESCOPE ARRAY .2. SOFT-X-RAY EUV REFLECTIVITY OF THE MULTILAYER MIRRORS CONF ON MULTILAYER AND GRAZING INCIDENCE X-RAY/EUV OPTICS Barbee, T. W., WEED, J. W., Hoover, R. B., Allen, M. J., LINDBLOM, J. F., ONEAL, R. H., Kankelborg, C. C., DeForest, C. E., PARIS, E. S., Walker, A. B., Willis, T. D., Gluskin, E., Pianetta, P., Baker, P. C. SPIE - INT SOC OPTICAL ENGINEERING. 1992: 432–445
  • PHOTOEMISSION-STUDY OF THE SI, GE EPITAXIAL-GROWTH PROCESS USING SURFACTANTS Yang, X. Y., Cao, R. Y., Terry, J., Pianetta, P. MATERIALS RESEARCH SOC. 1992: 455–460
  • DETERMINATION OF THE SB/SI(111) INTERFACIAL STRUCTURE BY BACK-REFLECTION X-RAY STANDING WAVES AND SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE PHYSICAL REVIEW B Woicik, J. C., Kendelewicz, T., Miyano, K. E., COWAN, P. L., Bouldin, C. E., Karlin, B. A., Pianetta, P., SPICER, W. E. 1991; 44 (7): 3475-3478
  • PHOTOCONDUCTIVE MEASUREMENTS ON MICROWAVE-ASSISTED PLASMA-ENHANCED CHEMICALLY VAPOR-DEPOSITED DIAMOND FILMS 1ST EUROPEAN CONF ON DIAMOND AND DIAMOND-LIKE CARBON COATINGS Pan, L. S., Kania, D. R., Pianetta, P., LANDSTRASS, M., Landen, O. L., PLANO, L. S. ELSEVIER SCIENCE SA. 1991: 356–64
  • MULTISPECTRAL SOLAR TELESCOPE ARRAY .2. SOFT-X-RAY EUV REFLECTIVITY OF THE MULTILAYER MIRRORS OPTICAL ENGINEERING Barbee, T. W., WEED, J. W., Hoover, R. B., Allen, M. J., LINDBLOM, J. F., ONEAL, R. H., Kankelborg, C. C., DeForest, C. E., PARIS, E. S., Walker, A. B., Willis, T. D., Gluskin, E., Pianetta, P., Baker, P. C. 1991; 30 (8): 1067-1075
  • SYNCHROTRON X-RAY STANDING-WAVE STUDY OF SB ON GAAS(110) AND INP(110) JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B Kendelewicz, T., Woicik, J. C., Miyano, K. E., COWAN, P. L., Karlin, B. A., Bouldin, C. E., Pianetta, P., SPICER, W. E. 1991; 9 (4): 2290-2293
  • SYNCHROTRON-BASED IMAGING WITH A MAGNETIC PROJECTION PHOTOELECTRON MICROSCOPE ULTRAMICROSCOPY King, P. L., Borg, A., Kim, C., YOSHIKAWA, S. A., Pianetta, P., LINDAU, I. 1991; 36 (1-3): 117-129
  • SURFACE EXTENDED X-RAY ADSORPTION FINE-STRUCTURE STUDIES OF THE SI(001) 2X1-SB INTERFACE 37TH NATIONAL SYMP OF THE AMERICAN VACUUM SOC Richter, M., Woicik, J. C., Pianetta, P., Miyano, K. E., Kendelewicz, T., Bouldin, C. E., SPICER, W. E., LINDAU, I. A V S AMER INST PHYSICS. 1991: 1951–55
  • STRUCTURE OF THE SI(111) SQUARE-ROOT-OF-3 X SQUARE-ROOT-OF-3-SB INTERFACE BY SURFACE X-RAY ABSORPTION FINE-STRUCTURE AND PHOTOEMISSION 37TH NATIONAL SYMP OF THE AMERICAN VACUUM SOC Woicik, J. C., Kendelewicz, T., Miyano, K. E., Bouldin, C. E., Meissner, P. L., Pianetta, P., SPICER, W. E. A V S AMER INST PHYSICS. 1991: 1956–61
  • X-RAY-INDUCED DAMAGE STUDIES IN SIC X-RAY-LITHOGRAPHY MASK MEMBRANES MICROELECTRONIC ENGINEERING Redaelli, R., Pianetta, P., Rousseaux, F., HAGHIRIGOSNET, A. M., Kebabi, B., Madouri, A. 1991; 13 (1-4): 263-266
  • LOCAL BONDING STRUCTURE OF SB ON SI(111) BY SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE AND PHOTOEMISSION PHYSICAL REVIEW B Woicik, J. C., Kendelewicz, T., Miyano, K. E., Bouldin, C. E., Meissner, P. L., Pianetta, P., SPICER, W. E. 1991; 43 (5): 4331-4339
  • CONSERVATION OF BOND LENGTHS IN STRAINED GE-SI LAYERS PHYSICAL REVIEW B Woicik, J. C., Bouldin, C. E., Bell, M. I., Cross, J. O., Tweet, D. J., Swanson, B. D., Zhang, T. M., Sorensen, L. B., King, C. A., Hoyt, J. L., Pianetta, P., Gibbons, J. F. 1991; 43 (3): 2419-2422
  • X-RAY-INDUCED DAMAGE STUDIES IN SIC X-RAY-LITHOGRAPHY MASK MEMBRANES INTERNATIONAL CONF ON MICROLITHOGRAPHY Redaelli, R., Pianetta, P., Rousseaux, F., HAGHIRIGOSNET, A. M., Kebabi, B., Madouri, A. ELSEVIER SCIENCE PUBL B V. 1991: 263–266
  • INTRINSIC PHOTOCONDUCTIVITY IN POLYCRYSTALLINE CVD DIAMOND FILMS AND IN NATURAL AND SYNTHETIC BULK DIAMONDS 2ND INTERNATIONAL CONF ON THE NEW DIAMOND SCIENCE AND TECHNOLOGY Pan, L. S., Kania, D. R., Pianetta, P., Landen, O. L., LANDSTRASS, M. MATERIALS RESEARCH SOC. 1991: 729–734
  • TEMPERATURE-DEPENDENT PHOTOCONDUCTIVITY MEASUREMENTS ON TYPE IIA DIAMONDS AND POLYCRYSTALLINE DIAMOND FILMS 1ST INTERNATIONAL CONF ON THE APPLICATIONS OF DIAMOND FILMS AND RELATED MATERIALS ( ADC 91 ) Pan, L. S., Kania, D. R., Pianetta, P., Landen, O. L., LANDSTRASS, M. ELSEVIER SCIENCE PUBL B V. 1991: 341–346
  • SURFACE EXTENDED-X-RAY-ABSORPTION FINE-STRUCTURE AND SCANNING TUNNELING MICROSCOPY OF SI(001)2X1-SB PHYSICAL REVIEW LETTERS Richter, M., Woicik, J. C., Nogami, J., Pianetta, P., Miyano, K. E., Baski, A. A., Kendelewicz, T., Bouldin, C. E., SPICER, W. E., Quate, C. F., LINDAU, I. 1990; 65 (27): 3417-3420
  • SOFT-X-RAY DETECTION WITH DIAMOND PHOTOCONDUCTIVE DETECTORS 8TH TOPICAL CONF ON HIGH TEMPERATURE PLASMA DIAGNOSTICS Kania, D. R., Pan, L., Kornblum, H., Bell, P., LANDEN, O. N., Pianetta, P. AMER INST PHYSICS. 1990: 2765–67
  • CARRIER DENSITY DEPENDENT PHOTOCONDUCTIVITY IN DIAMOND APPLIED PHYSICS LETTERS Pan, L. S., Kania, D. R., Pianetta, P., Landen, O. L. 1990; 57 (6): 623-625
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  • ABSOLUTE X-RAY POWER MEASUREMENTS WITH SUBNANOSECOND TIME RESOLUTION USING TYPE IIA DIAMOND PHOTOCONDUCTORS JOURNAL OF APPLIED PHYSICS Kania, D. R., Pan, L. S., Bell, P., Landen, O. L., Kornblum, H., Pianetta, P., Perry, M. D. 1990; 68 (1): 124-130
  • SEMICONDUCTOR SURFACE CORE LEVEL SHIFTS BY USE OF SELECTED OVERLAYERS PHYSICA SCRIPTA Woicik, J. C., Kendelewicz, T., Miyano, K., Cao, R., Pianetta, P., LINDAU, I., SPICER, W. E. 1990; 41 (6): 1034-1036
  • FROM SMALL-AREA TO IMAGING PHOTOABSORPTION SPECTROSCOPY 6TH NATIONAL CONF ON SYNCHROTRON RADIATION INSTRUMENTATION King, P. L., Borg, A., Kim, C., Pianetta, P., LINDAU, I., Knapp, G. S., Keenlyside, M., Browning, R. ELSEVIER SCIENCE BV. 1990: 19–25
  • CORE LEVEL PHOTOELECTRON MICROSCOPY 4TH INTERNATIONAL CONF ON ELECTRON SPECTROSCOPY ( ICES4 ) Pianetta, P., King, P. L., Borg, A., Kim, C., LINDAU, I., Knapp, G., Keenlyside, M., Browning, R. ELSEVIER SCIENCE BV. 1990: 797–810
  • SMALL AREA PHOTOEMISSION AND PHOTOABSORPTION MEASUREMENTS USING A PHOTOELECTRON MICROSCOPE PHYSICA SCRIPTA King, P. L., Borg, A., Kim, C., Pianetta, P., LINDAU, I., Knapp, G., Keenlyside, M. 1990; 41 (4): 413-417
  • TRANSIENT PHOTOCONDUCTIVE MEASUREMENTS OF MICROWAVE AND DC PLASMA CVD PRODUCED DIAMOND FILMS Kania, D. R., Landen, O. L., Pan, L. S., Pianetta, P. PERGAMON-ELSEVIER SCIENCE LTD. 1990: 791–91
  • CE PROMOTED OXIDATION OF GAAS(100) SURFACES 20TH INTERNATIONAL CONF ON THE PHYSICS OF SEMICONDUCTORS Borg, A., Bernstein, R. W., Grepstad, J. K., King, P. L., Yang, X., Pianetta, P., LINDAU, I. WORLD SCIENTIFIC PUBL CO PTE LTD. 1990: 243–246
  • SI(111) 2 X-1 SURFACE CORE-LEVEL SHIFTS INVESTIGATED BY USE OF GE OVERLAYER PHYSICAL REVIEW B Woicik, J. C., Pianetta, P., Kendelewicz, T. 1989; 40 (18): 12463-12467
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  • CORE LEVEL PHOTOELECTRON MICROSCOPY WITH SYNCHROTRON RADIATION REVIEW OF SCIENTIFIC INSTRUMENTS Pianetta, P., LINDAU, I., King, P. L., Keenlyside, M., Knapp, G., Browning, R. 1989; 60 (7): 1686-1689
  • SILICON(111) 2X1 SURFACE-STATES - K-EDGE TRANSITIONS AND SURFACE SELECTIVE L2,3VV AUGER LINESHAPE PHYSICA B-CONDENSED MATTER Woicik, J. C., Pate, B. B., Pianetta, P. 1989; 158 (1-3): 576-577
  • SILICON(111) 2X1 SURFACE-STATES - K-EDGE TRANSITIONS AND SURFACE-SELECTIVE L2,3VV AUGER LINE-SHAPE PHYSICAL REVIEW B Woicik, J. C., Pate, B. B., Pianetta, P. 1989; 39 (12): 8593-8604
  • PHOTON-ENERGY-SENSITIVE SIL2,3VV AUGER SATELLITE PHYSICAL REVIEW B Woicik, J. C., Pianetta, P., Sorensen, S. L., Crasemann, B. 1989; 39 (9): 6048-6051
  • MULTILAYER DIFFRACTION GRATINGS - APPLICATION TO SYNCHROTRON RADIATION INSTRUMENTATION CONF ON X-RAY/EUV OPTICS FOR ASTRONOMY AND MICROSCOPY Barbee, T. W., Rife, J. C., Hunter, W. R., Cruddace, R. G., Pianetta, P. SPIE - INT SOC OPTICAL ENGINEERING. 1989: 636–647
  • PROCESS-CONTROL WITH CHEMICAL AMPLIFICATION RESISTS USING DEEP ULTRAVIOLET AND X-RAY-RADIATION JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B Seligson, D., Das, S., GAW, H., Pianetta, P. 1988; 6 (6): 2303-2307
  • ORIENTATIONAL DISORDER IN AMORPHOUS-SILICON PROBED BY XANES (X-RAY ABSORPTION NEAR EDGE STRUCTURE) PHYSICA SCRIPTA DICICCO, A., Bianconi, A., Benfatto, M., Marcelli, A., Natoli, C. R., Pianetta, P., Woicik, J. 1988; 38 (3): 408-411
  • KAPPA-RESOLVED ALLOY BOWING IN PSEUDOBINARY INXGA1-XAS ALLOYS PHYSICAL REVIEW LETTERS Hwang, J., Pianetta, P., Pao, Y. C., Shih, C. K., Shen, Z. X., LINDBERG, P. A., Chow, R. 1988; 61 (7): 877-880
  • THE EFFECT OF STRAIN ON THE BAND-STRUCTURE OF INXGA1-XAS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B Hwang, J., Pianetta, P., Kubiak, G. D., Stulen, R. H., Shin, C. K., Pao, Y. C., Shen, Z. X., LINDBERG, P. A., Chow, R. 1988; 6 (4): 1234-1239
  • THE EFFECT OF STRAIN ON THE BAND-STRUCTURE OF GAAS AND IN0.2GA0.8AS Hwang, J., Shih, C. K., Pianetta, P., Kubiak, G. D., Stulen, R. H., Dawson, L. R., Pao, Y. C., Harris, J. S. A V S AMER INST PHYSICS. 1988: 1348–49
  • BONDING AT THE K/SI(100)2X1 INTERFACE - A SURFACE EXTENDED X-RAY ABSORPTION FINE-STRUCTURE STUDY Kendelewicz, T., Woicik, J. C., LIST, R. S., Soukiassian, P., Pate, B. B., Pianetta, P., LINDAU, I., SPICER, W. E. A V S AMER INST PHYSICS. 1988: 879–80
  • BONDING AT THE K/SI(100) 2X1 INTERFACE - A SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY PHYSICAL REVIEW B Kendelewicz, T., Soukiassian, P., LIST, R. S., Woicik, J. C., Pianetta, P., LINDAU, I., SPICER, W. E. 1988; 37 (12): 7115-7117
  • SOFT-X-RAY DOSIMETRY AND ITS APPLICATION ON THE LITHOGRAPHY BEAMLINE AT SSRL NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT Seligson, D., Pan, L., King, P., Pianetta, P. 1988; 266 (1-3): 612-618
  • APPLICATIONS OF MULTILAYERS TO SYNCHROTRON RADIATION NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT Pianetta, P., Barbee, T. W. 1988; 266 (1-3): 441-446
  • MULTI-UNDULATOR BEAM LINE-V AT SSRL - A PROGRESS REPORT NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT BACHRACH, R. Z., Bringans, R. D., SWARTZ, L. E., LINDAU, I., Pate, B. B., Carr, R. G., Hower, N., Youngman, B., Morales, H., Pianetta, P. 1988; 266 (1-3): 83-90
  • SYNCHROTRON-BASED X-RAY-LITHOGRAPHY AT STANFORD-UNIVERSITY NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT Pan, L., King, P. L., Pianetta, P., Seligson, D., Barbee, T. W. 1988; 266 (1-3): 287-292
  • SPLITTING OF THE WHITE LINE 1S ABSORPTION-EDGE IN CRYSTALLINE SI, SIGE, AND DILUTE SIGE SOLID STATE COMMUNICATIONS Woicik, J. C., LIST, R. S., Pate, B. B., Pianetta, P. 1988; 65 (7): 685-688
  • EFFECT OF STRAIN ON THE BAND-STRUCTURE OF GAAS AND IN0.2GA0.8AS APPLIED PHYSICS LETTERS Hwang, J., Shih, C. K., Pianetta, P., Kubiak, G. D., Stulen, R. H., Dawson, L. R., Pao, Y. C., Harris, J. S. 1988; 52 (4): 308-310
  • RADIATION-DAMAGE IN BORON-NITRIDE X-RAY-LITHOGRAPHY MASKS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B King, P. L., Pan, L., Pianetta, P., SHIMKUNAS, A., Mauger, P., Seligson, D. 1988; 6 (1): 162-166
  • DETERMINATION OF THE NATURAL VALENCE-BAND OFFSET IN THE INXGA1-XAS SYSTEM APPLIED PHYSICS LETTERS Hwang, J., Pianetta, P., Shih, C. K., SPICER, W. E., Pao, Y. C., Harris, J. S. 1987; 51 (20): 1632-1633
  • MULTIPLE-SCATTERING EFFECTS IN THE K-EDGE X-RAY-ABSORPTION NEAR-EDGE STRUCTURE OF CRYSTALLINE AND AMORPHOUS-SILICON PHYSICAL REVIEW B Bianconi, A., DICICCO, A., Pavel, N. V., Benfatto, M., Marcelli, A., Natoli, C. R., Pianetta, P., Woicik, J. 1987; 36 (12): 6426-6433
  • MOLYBDENUM-SILICON MULTILAYER MONOCHROMATOR FOR THE EXTREME ULTRAVIOLET APPLIED PHYSICS LETTERS Barbee, T. W., Pianetta, P., Redaelli, R., Tatchyn, R., Barbee, T. W. 1987; 50 (25): 1841-1843
  • THE SILICON GERMANIUM(111) INTERFACE - THE ONSET OF EPITAXY JOURNAL DE PHYSIQUE Woicik, J. C., LIST, R. S., Pate, B. B., Pianetta, P. 1986; 47 (C-8): 497-501
  • SI/INP(110) HETEROJUNCTION PHYSICAL REVIEW B MAHOWALD, P. H., LIST, R. S., Woicik, J., Pianetta, P., SPICER, W. E. 1986; 34 (10): 7069-7075
  • PERFORMANCE OF LAYERED SYNTHETIC MICROSTRUCTURES IN MONOCHROMATOR APPLICATIONS IN THE SOFT-X-RAY REGION NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT Pianetta, P., Barbee, T. W., Redaelli, R. 1986; 246 (1-3): 352-355
  • SUBNANOSECOND TIME RESOLVED MEASUREMENTS OF SYNCHROTRON X-RAY PULSES USING PHOTOCONDUCTIVE DETECTORS NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT Kania, D. R., BARTLETT, R. J., Pianetta, P. 1986; 246 (1-3): 534-536
  • SOFT-X-RAY PHOTOEMISSION WITH THE SSX-100 SPECTROMETER NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT Hecht, M. H., Grunthaner, F. J., Pate, B. B., Pianetta, P., Engelhardt, M., Jansen, W., Bryson, C. 1986; 246 (1-3): 806-809
  • CRYSTAL HEATING ON THE JUMBO DOUBLE CRYSTAL MONOCHROMATOR AT SSRL NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT Rowen, M., Waldhauer, A., Pianetta, P. 1986; 246 (1-3): 440-443
  • X-RAY-LITHOGRAPHY AT THE STANFORD SYNCHROTRON RADIATION LABORATORY NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT Pianetta, P., Redaelli, R., Jaeger, R., Barbee, T. W. 1986; 246 (1-3): 641-643
  • X-RAY-LITHOGRAPHY AT THE STANFORD-SYNCHROTRON-RADIATION-LABORATORY (SSRL) PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS Pianetta, P., Redaelli, R., Jaeger, R., Barbee, T. W. 1985; 537: 69-74
  • EFFECT OF AN AL INTERLAYER ON THE GAAS/GE(100) HETEROJUNCTION FORMATION PHYSICAL REVIEW B KATNANI, A. D., CHIARADIA, P., Cho, Y., MAHOWALD, P., Pianetta, P., BAUER, R. S. 1985; 32 (6): 4071-4076
  • HETEROJUNCTION BAND DISCONTINUITY AT THE SI-GE(111) INTERFACE JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B MAHOWALD, P. H., LIST, R. S., SPICER, W. E., Woicik, J., Pianetta, P. 1985; 3 (4): 1252-1255
  • X-RAY RESIST CHARACTERIZATION WITH MONOCHROMATIC SYNCHROTRON RADIATION PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS JAEGER, R. P., Pianetta, P. 1984; 471: 121-126
  • COPPER L2,3 NEAR-EDGE STRUCTURE IN CU2O PHYSICAL REVIEW B Hulbert, S. L., Bunker, B. A., Brown, F. C., Pianetta, P. 1984; 30 (4): 2120-2126
  • DESIGN CONSIDERATIONS FOR THE X-RAY-LITHOGRAPHY STATION AT THE STANFORD SYNCHROTRON RADIATION LABORATORY NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT Pianetta, P., Tatchyn, R., Jaeger, R., Barbee, T. W. 1984; 222 (1-2): 355-358
  • PULSED SOFT-X-RAY RESPONSE OF INP-FE PHOTOCONDUCTORS APPLIED PHYSICS LETTERS Kania, D. R., BARTLETT, R. J., Wagner, R. S., Hammond, R. B., Pianetta, P. 1984; 44 (11): 1059-1061
  • ELECTRON-ESCAPE DEPTH VARIATION IN THIN SIO2-FILMS MEASURED WITH VARIABLE PHOTON ENERGY JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A Hecht, M. H., Grunthaner, F. J., Pianetta, P., Johansson, L. I., LINDAU, I. 1984; 2 (2): 584-587
  • DESIGN AND MODELING CONSIDERATIONS FOR SSRL BEAM LINE WUNDER PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS BACHRACH, R. Z., Bringans, R. D., Hower, N., LINDAU, I., Pate, B. B., Pianetta, P., SWARTZ, L. E., Tatchyn, R. 1984; 447: 10-15
  • DESIGN PROCESS AND MODELING STUDIES OF SSRL BEAM LINE WUNDER NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT BACHRACH, R. Z., Bringans, R. D., Hower, N., LINDAU, I., Pate, B. B., Pianetta, P., SWARTZ, L. E., Tatchyn, R. 1984; 222 (1-2): 70-79
  • FAST PHOTOCONDUCTORS FOR SYNCHROTRON RADIATION RESEARCH NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT Kania, D. R., BARTLETT, R. J., Wagner, R. S., Hammond, R. B., Pianetta, P. 1984; 222 (1-2): 270-273
  • X-RAY-LITHOGRAPHY STATION AT THE STANFORD-SYNCHROTRON RADIATION-LABORATORY (SSRL) PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS Pianetta, P., Tatchyn, R., Jaeger, R., Barbee, T. W. 1984; 448: 60-63
  • AN ANGLE-RESOLVED PHOTOEMISSION-STUDY OF THE CHEMISORPTION OF CHALCOGENS ON CU(100) .3. CU(100)+P(2X2)S SURFACE SCIENCE LING, D. T., Miller, J. N., WEISSMAN, D. L., Pianetta, P., Stefan, P. M., LINDAU, I., SPICER, W. E. 1983; 124 (1): 175-187
  • ANGLE-RESOLVED PHOTOEMISSION-STUDIES OF OXIDE FORMATION ON CU(100) JOURNAL OF VACUUM SCIENCE & TECHNOLOGY LING, D. T., Miller, J. N., Pianetta, P., WEISSMAN, D. L., LINDAU, I., SPICER, W. E. 1982; 21 (1): 47-49
  • ANGLE-RESOLVED PHOTOEMISSION-STUDY OF THE CHEMISORPTION OF CHALCOGENS ON CU(100) .1. CLEAN SURFACE SURFACE SCIENCE LING, D. T., Miller, J. N., WEISSMAN, D. L., Pianetta, P., Johansson, L. I., LINDAU, I., SPICER, W. E. 1980; 92 (2-3): 350-364
  • AN ANGLE-RESOLVED PHOTOEMISSION-STUDY OF THE CHEMISORPTION OF CHALCOGENS ON CU(100) .2. CU(100) + C(2 X 2)O SURFACE SCIENCE LING, D. T., Miller, J. N., WEISSMAN, D. L., Pianetta, P., Stefan, P. M., LINDAU, I., SPICER, W. E. 1980; 95 (1): 89-106
  • PHOTOEMISSION-STUDY OF THE INTERACTION OF A1 WITH A GAAS (110) SURFACE JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA SKEATH, P., LINDAU, I., Pianetta, P., CHYE, P. W., Su, C. Y., SPICER, W. E. 1979; 17 (4): 259-265
  • EXAFS STUDIES OF THE BONDING GEOMETRY OF OXYGEN ON SI(111) USING ELECTRON YIELD DETECTION JOURNAL OF VACUUM SCIENCE & TECHNOLOGY Stohr, J., Johansson, L. I., LINDAU, I., Pianetta, P. 1979; 16 (5): 1221-1224
  • AD-ATOM INTERACTIONS WITH III-V-SEMICONDUCTOR SURFACES JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA LINDAU, I., SPICER, W. E., Pianetta, P., CHYE, P. W., Garner, C. M. 1979; 15 (JAN): 197-200
  • PHOTOEMISSION-STUDIES OF THE INITIAL-STAGES OF OXIDATION OF GASB AND INP SURFACE SCIENCE CHYE, P. W., Su, C. Y., LINDAU, I., Garner, C. M., Pianetta, P., SPICER, W. E. 1979; 88 (2-3): 439-460
  • EXTENDED-X-RAY-ABSORPTION-FINE-STRUCTURE STUDIES OF LOW-Z ATOMS IN SOLIDS AND ON SURFACES - STUDIES OF SI3N4, SIO2, AND OXYGEN ON SI(111) PHYSICAL REVIEW B Stohr, J., Johansson, L., LINDAU, I., Pianetta, P. 1979; 20 (2): 664-680
  • OXYGEN-ADSORPTION ON CS COVERED GAAS(110) SURFACES SURFACE SCIENCE Su, C. Y., CHYE, P. W., Pianetta, P., LINDAU, I., SPICER, W. E. 1979; 86 (JUL): 894-899
  • FUNDAMENTAL-STUDIES OF III-V SURFACES AND THE (III-V)-OXIDE INTERFACE THIN SOLID FILMS SPICER, W. E., LINDAU, I., Pianetta, P., CHYE, P. W., Garner, C. M. 1979; 56 (1-2): 1-18
  • COMPARATIVE STUDIES OF OXYGEN-ADSORPTION ON GAAS(110) SURFACES WITH ULTRATHIN ALUMINUM AND CESIUM OVERLAYERS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY SKEATH, P., Su, C. Y., CHYE, P. W., Pianetta, P., LINDAU, I., SPICER, W. E. 1979; 16 (5): 1439-1442
  • STUDY OF P(2X2)-S OVERLAYERS ON CU (100) BY POLARIZATION-DEPENDENT ANGULARLY RESOLVED ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY (ARUPS) LING, D. T., Pianetta, P. A., Johansson, L. I., LINDAU, I., SPICER, W. E. AMER INST PHYSICS. 1979: 337–37
  • PHOTOEMISSION-STUDY OF THE SILICON-GOLD INTERFACE Braicovich, L., SKEATH, P. R., LINDAU, I., CHYE, P. W., Su, C. Y., SPICER, W. E. AMER INST PHYSICS. 1979: 248–48
  • ELECTRON-SPECTROSCOPIC STUDIES OF THE EARLY STAGES OF THE OXIDATION OF SI PHYSICAL REVIEW B Garner, C. M., LINDAU, I., Su, C. Y., Pianetta, P., SPICER, W. E. 1979; 19 (8): 3944-3956
  • SURFACE ELECTRONIC-STRUCTURE OF 3-5 COMPOUNDS AND THE MECHANISM OF FERMI LEVEL PINNING BY OXYGEN (PASSIVATION) AND METALS (SCHOTTKY BARRIERS) SURFACE SCIENCE SPICER, W. E., CHYE, P. W., Garner, C. M., LINDAU, I., Pianetta, P. 1979; 86 (JUL): 763-788
  • ADSORPTION STATES OF OXYGEN ON SILICON Garner, C. M., LINDAU, I., Su, C. Y., Pianetta, P., SPICER, W. E. AMER INST PHYSICS. 1978: 33–33
  • NEW METHOD FOR SCHOTTKY-BARRIER FORMATION LINDAU, I., CHYE, P. W., Pianetta, P., Garner, C. M., Su, C. Y., SPICER, W. E. AMER INST PHYSICS. 1978: 400–401
  • VALENCE BAND STUDIES OF CLEAN AND OXYGEN EXPOSED GAAS(110) SURFACES SURFACE SCIENCE Pianetta, P., LINDAU, I., Gregory, P. E., Garner, C. M., SPICER, W. E. 1978; 72 (2): 298-320
  • ADSORPTION OF OXYGEN ON CU(100) - STUDY BY ANGULARLY RESOLVED ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY (ARUPS) LING, D. T., Miller, J. N., Pianetta, P. A., WEISSMAN, D. L., LINDAU, I., SPICER, W. E. AMER INST PHYSICS. 1978: 495–96
  • NEW PHENOMENA IN SCHOTTKY-BARRIER FORMATION ON III-V-COMPOUNDS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY LINDAU, I., CHYE, P. W., Garner, C. M., Pianetta, P., Su, C. Y., SPICER, W. E. 1978; 15 (4): 1332-1339
  • UPS AND LEED STUDIES OF GAAS (110) AND (111) AS SURFACES JOURNAL OF VACUUM SCIENCE & TECHNOLOGY SKEATH, P., SAPERSTEIN, W. A., Pianetta, P., LINDAU, I., SPICER, W. E., Mark, P. 1978; 15 (4): 1219-1222
  • OXYGEN-ADSORPTION AND SURFACE ELECTRONIC-STRUCTURE OF GAAS (110) JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA LINDAU, I., Pianetta, P., SPICER, W. E., Gregory, P. E., Garner, C. M., CHYE, P. W. 1978; 13 (3): 155-160
  • AUGER PROFILING STUDIES OF LPE N-ALXGAL-XAS-N GAAS HETEROJUNCTIONS AND ABSENCE OF RECTIFICATION Garner, C. M., Shen, Y. D., Su, C. Y., Pearson, G. L., SPICER, W. E. AMER INST PHYSICS. 1978: 31–31
  • NEW PHENOMENON IN ABSORPTION OF OXYGEN ON SILICON PHYSICAL REVIEW LETTERS Garner, C. M., LINDAU, I., Su, C. Y., Pianetta, P., Miller, J. N., SPICER, W. E. 1978; 40 (6): 403-406
  • BONDING STATES OF OXYGEN ON SILICON Garner, C. M., LINDAU, I., Su, C. Y., Pianetta, P., SPICER, W. E. AMER INST PHYSICS. 1978: 1290–91
  • MECHANISM OF SCHOTTKY-BARRIER PINNING ON 3-5 SEMICONDUCTORS SPICER, W. E., LINDAU, I., Chye, P., Su, C. Y., Pianetta, P., Garner, C. M. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. 1978: 1360–61
  • CHEMISORPTION AND OXIDATION STUDIES OF (110) SURFACES OF GAAS, GASB, AND INP PHYSICAL REVIEW B Pianetta, P., LINDAU, I., Garner, C. M., SPICER, W. E. 1978; 18 (6): 2792-2806
  • SURFACE-CHEMISTRY OF ALUMINUM ADSORBED ON SI(111) Pianetta, P., LINDAU, I., Garner, C. M., SPICER, W. E. AMER INST PHYSICS. 1978: 399–99
  • X-RAY OPTICS AND MONOCHROMATORS .5. PHASE SPACE ANALYSIS APPLIED TO X-RAY OPTICS NUCLEAR INSTRUMENTS & METHODS Pianetta, P., LINDAU, I. 1978; 152 (1): 155-159
  • CORE-LEVEL PHOTOEMISSION OF CS-O ADLAYER OF NEA GAAS CATHODES APPLIED PHYSICS LETTERS SPICER, W. E., LINDAU, I., Su, C. Y., CHYE, P. W., Pianetta, P. 1978; 33 (11): 934-935
  • EVIDENCE FOR A NEW TYPE OF METAL-SEMICONDUCTOR INTERACTION ON GASB PHYSICAL REVIEW B CHYE, P. W., LINDAU, I., Pianetta, P., Garner, C. M., SPICER, W. E. 1978; 17 (6): 2682-2684
  • PHOTOEMISSION STUDY OF AU SCHOTTKY-BARRIER FORMATION ON GASB, GAAS, AND INP USING SYNCHROTRON RADIATION PHYSICAL REVIEW B CHYE, P. W., LINDAU, I., Pianetta, P., Garner, C. M., Su, C. Y., SPICER, W. E. 1978; 18 (10): 5545-5559
  • OXYGEN SORPTION AND EXCITONIC EFFECTS ON GAAS SURFACES JOURNAL OF VACUUM SCIENCE & TECHNOLOGY CHYE, P. W., Pianetta, P., LINDAU, I., SPICER, W. E. 1977; 14 (4): 917-919
  • PHOTOEMISSION STUDIES OF OXIDATION OF GASB AND INP CHYE, P. W., LINDAU, I., Garner, C. M., Pianetta, P., SPICER, W. E. AMER INST PHYSICS. 1977: 420–20
  • OXIDATION PROPERTIES OF GAAS (110) SURFACES - REPLY PHYSICAL REVIEW B Pianetta, P., LINDAU, I., Garner, C. M., SPICER, W. E. 1977; 16 (12): 5600-5602
  • SURFACE AND INTERFACE STATES ON GAAS(110) - EFFECTS OF ATOMIC AND ELECTRONIC REARRANGEMENTS) JOURNAL OF VACUUM SCIENCE & TECHNOLOGY SPICER, W. E., Pianetta, P., LINDAU, I., CHYE, P. W. 1977; 14 (4): 885-893
  • COMPARISON OF LEED INTENSITY DATA FROM CHEMICALLY POLISHED AND CLEAVED GAAS(110)SURFACES SURFACE SCIENCE Mark, P., Pianetta, P., LINDAU, I., SPICER, W. E. 1977; 69 (2): 735-740
  • HIGH-RESOLUTION X-RAY SPECTROSCOPY USING SYNCHROTRON RADIATION - SOURCE CHARACTERISTICS AND OPTICAL SYSTEMS JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA Pianetta, P., LINDAU, I. 1977; 11 (1): 13-38
  • PHOTOEMISSION STUDIES OF SURFACE ELECTRONIC-STRUCTURE OF SI (111) AND OXYGEN-CHEMISORPTION Garner, C. M., LINDAU, I., Miller, J. N., Pianetta, P., SPICER, W. E. AMER INST PHYSICS. 1977: 433–33
  • AUGER PROFILING OF ALXGA1-XAS-GAAS HETEROJUNCTIONS GROWN BY LPE Garner, C. M., Shen, Y. D., Pearson, G. L., SPICER, W. E. AMER INST PHYSICS. 1977: 293–93
  • PHOTOEMISSION STUDIES OF SURFACE-STATES AND OXIDATION OF GROUP-IV SEMICONDUCTORS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY Garner, C. M., LINDAU, I., Miller, J. N., Pianetta, P., SPICER, W. E. 1977; 14 (1): 372-375
  • DO AU 5D-BANDS NARROW AT SURFACE - COMPARISON WITH AU ALLOYS PHYSICS LETTERS A CHYE, P. W., LINDAU, I., Pianetta, P., Garner, C. M., SPICER, W. E. 1977; 63 (3): 387-389
  • STUDIES OF SURFACE ELECTRONIC-STRUCTURE AND SURFACE-CHEMISTRY USING SYNCHROTRON RADIATION PHYSICA SCRIPTA SPICER, W. E., LINDAU, I., Miller, J. N., LING, D. T., Pianetta, P., CHYE, P. W., Garner, C. M. 1977; 16 (5-6): 388-397
  • PHOTOEMISSION STUDIES OF ELECTRONIC-STRUCTURE OF 3-5 SEMICONDUCTOR SURFACES SURFACE SCIENCE LINDAU, I., Pianetta, P., Garner, C. M., CHYE, P. W., Gregory, P. E., SPICER, W. E. 1977; 63 (1): 45-55
  • PHOTOEMISSION STUDIES OF OXIDATION OF 3-4 SEMICONDUCTOR SURFACES BY USING SYNCHROTRON RADIATION Pianetta, P., LINDAU, I., SPICER, W. E. AMER CHEMICAL SOC. 1976: 116–16
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  • VALENCE BAND ELECTRONIC-STRUCTURE OF CLEAN AND OXIDIZED (110) SURFACES OF GAAS, GASB AND INP Chye, P., Pianetta, P., LINDAU, I., Garner, C., Gregory, P., SPICER, W. E. AMER INST PHYSICS. 1976: 321–21
  • OXIDATION PROPERTIES OF GAAS (110) SURFACES PHYSICAL REVIEW LETTERS Pianetta, P., LINDAU, I., Garner, C. M., SPICER, W. E. 1976; 37 (17): 1166-1169
  • OXIDATION OF GAAS(110) SURFACES - CORE LEVEL SPECTROSCOPY Pianetta, P., LINDAU, I., Garner, C. M., SPICER, W. E. AMER INST PHYSICS. 1976: 1313–14
  • SYNCHROTRON RADIATION STUDIES OF ELECTRONIC-STRUCTURE AND SURFACE-CHEMISTRY OF GAAS, GASB, AND INP JOURNAL OF VACUUM SCIENCE & TECHNOLOGY SPICER, W. E., LINDAU, I., Gregory, P. E., Garner, C. M., Pianetta, P., CHYE, P. W. 1976; 13 (4): 780-785
  • PHOTOEMISSION STUDIES OF GASB SURFACE AND INTERFACE STATES CHYE, P. W., LINDAU, I., Garner, C. M., Pianetta, P., SPICER, W. E. AMER INST PHYSICS. 1976: 1313–13
  • PHOTOIONIZATION CROSS-SECTIONS OF 3D AND 4D LEVELS MEASURED BY PHOTOEMISSION TECHNIQUE LINDAU, I., Pianetta, P., SPICER, W. E. AMER INST PHYSICS. 1976: 417–17
  • FERMI LEVEL POSITION IN N-TYPE GAAS(110) AND GASB(110) Gregory, P., Chye, P., Pianetta, P., LINDAU, I., SPICER, W. E. AMER INST PHYSICS. 1976: 319–19
  • DETERMINATION OF ESCAPE DEPTH OF PHOTOEMITTED ELECTRONS IN GOLD IN ENERGY-RANGE 25-75 EV BY USE OF SYNCHROTRON RADIATION JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA LINDAU, I., Pianetta, P., Yu, K. Y., SPICER, W. E. 1976; 8 (6): 487-491
  • UPS STUDIES OF BONDING OF H2,O2,CO,C2H4 AND C2H2 ON FE AND CU SURFACE SCIENCE Yu, K. Y., SPICER, W. E., LINDAU, I., Pianetta, P., Lin, S. F. 1976; 57 (1): 157-183
  • PHOTOEMISSION FROM SOME METALS AND SEMICONDUCTORS IN ENERGY-RANGE 5-350 EV JOURNAL OF VACUUM SCIENCE & TECHNOLOGY LINDAU, I., Pianetta, P., Yu, K. Y., SPICER, W. E. 1976; 13 (1): 269-272
  • ENERGY-DEPENDENCE OF 4D PHOTOIONIZATION CROSS-SECTION OF IN AND SB PHYSICS LETTERS A LINDAU, I., Pianetta, P., SPICER, W. E. 1976; 57 (3): 225-226
  • RELATIONSHIP OF HEAT OF CHEMISORPTION TO PI-LEVEL AND SIGMA-LEVEL SHIFTS AS MEASURED BY PHOTOEMISSION JOURNAL OF VACUUM SCIENCE & TECHNOLOGY Yu, K. Y., SPICER, W. E., LINDAU, I., Pianetta, P., Lin, S. F. 1976; 13 (1): 277-279
  • PHOTOEMISSION STUDIES OF ADSORPTION OF O2 AND OXIDATION OF CLEAVED SI Garner, C. M., LINDAU, I., Miller, J. N., Pianetta, P., SPICER, W. E. AMER INST PHYSICS. 1976: 1314–14
  • OXYGEN BONDING SITE ON GAAS, GASB AND INP (110) SURFACES Pianetta, P., LINDAU, I., Garner, C., SPICER, W. E. AMER INST PHYSICS. 1976: 320–21
  • PHOTOEMISSION OF GOLD IN ENERGY-RANGE 30-3000 EV USING SYNCHROTRON RADIATION PHYSICAL REVIEW B LINDAU, I., Pianetta, P., Yu, K. Y., SPICER, W. E. 1976; 13 (2): 492-495
  • PHOTOEMISSION STUDIES OF GOLD IN WAVELENGTH REGION 30-300 EV LINDAU, I., Pianetta, P., Yu, K., SPICER, W. E. AMER INST PHYSICS. 1975: 475–75
  • INTRINSIC LINEWIDTH OF 4F LEVELS IN GOLD AS DETERMINED BY PHOTOEMISSION PHYSICS LETTERS A LINDAU, I., Pianetta, P., Yu, K., SPICER, W. E. 1975; 54 (1): 47-48
  • DETERMINATION OF OXYGEN BINDING-SITE ON GAAS(110) USING SOFT-X-RAY-PHOTOEMISSION SPECTROSCOPY PHYSICAL REVIEW LETTERS Pianetta, P., LINDAU, I., Garner, C., SPICER, W. E. 1975; 35 (20): 1356-1359
  • VACUUM ULTRAVIOLET SYNCHROTRON RADIATION FROM SPEAR REHN, V., BAER, A. D., KYSER, D. S., Stanford, J. L., Yu, K., LINDAU, I., Pianetta, P., SPICER, W. E. AMER INST PHYSICS. 1975: 419–19
  • SHORT-RANGE PROBE FOR INVESTIGATING METALLOPROTEIN STRUCTURES - FOURIER-ANALYSIS OF EXTENDED X-RAY ABSORPTION FINE-STRUCTURE Sayers, D. E., Lytle, F. W., Weissbluth, M., Pianetta, P. AMER INST PHYSICS. 1975: 317–17
  • ULTRAVIOLET PHOTOEMISSION STUDIES OF O2, CO, C2H2 AND C2H4 CHEMISORBED ON COPPER Yu, K., LINDAU, I., Pianetta, P., SPICER, W. E. AMER INST PHYSICS. 1975: 359–59
  • SHORT-RANGE PROBE FOR INVESTIGATING METALLOPROTEIN STRUCTURES - FOURIER-ANALYSIS OF EXTENDED X-RAY ABSORPTION FINE-STRUCTURE JOURNAL OF CHEMICAL PHYSICS Sayers, D. E., Lytle, F. W., Weissbluth, M., Pianetta, P. 1975; 62 (6): 2514-2515
  • X-RAY PHOTOEMISSION SPECTROSCOPY NATURE LINDAU, I., Pianetta, P., Doniach, S., SPICER, W. E. 1974; 250 (5463): 214-215
  • ANTIFERROMAGNETIC LINEAR CHAINS IN CRYSTALLINE FREE-RADICAL BDPA JOURNAL OF CHEMICAL PHYSICS DUFFY, W., DUBACH, J. F., DECK, J. F., STRANDBU.DL,,, MIEDEMA, A. R., PIANETTA, A. 1972; 56 (6): 2555-&

    View details for DOI 10.1063/1.1677580

    View details for Web of Science ID A1972L903300011