Yaakov Tuchman
Ph.D. Student in Materials Science and Engineering, admitted Autumn 2014
Stanford Student Employee, Stanford Nanofabrication Facility
All Publications

A Universal Platform for Fabricating Organic Electrochemical Devices
ADVANCED ELECTRONIC MATERIALS
2018; 4 (7)
View details for DOI 10.1002/aelm.201800090
View details for Web of Science ID 000437828700011

Network overload due to massive attacks
PHYSICAL REVIEW E
2018; 97 (5): 052309
Abstract
We study the cascading failure of networks due to overload, using the betweenness centrality of a node as the measure of its load following the Motter and Lai model. We study the fraction of survived nodes at the end of the cascade p_{f} as a function of the strength of the initial attack, measured by the fraction of nodes p that survive the initial attack for different values of tolerance α in random regular and ErdösRenyi graphs. We find the existence of a firstorder phasetransition line p_{t}(α) on a pα plane, such that if p
p_{t}, p_{f} is large and the giant component of the network is still present. Exactly at p_{t}, the function p_{f}(p) undergoes a firstorder discontinuity. We find that the line p_{t}(α) ends at a critical point (p_{c},α_{c}), in which the cascading failures are replaced by a secondorder percolation transition. We find analytically the average betweenness of nodes with different degrees before and after the initial attack, we investigate their roles in the cascading failures, and we find a lower bound for p_{t}(α). We also study the difference between localized and random attacks. View details for DOI 10.1103/PhysRevE.97.052309
View details for Web of Science ID 000433068100002
View details for PubMedID 29906843