Brinthan Kanesalingam

All Publications

• Advances in artificial intelligence-based approaches to enhance dark field X-ray microscopy analysis. MRS communications Kanesalingam, B., Yildirim, C., Dresselhaus-Marais, L. 2026; 16 (1): 144-154

  Abstract

  Dark field X-ray microscopy (DFXM) has emerged as a powerful technique for characterizing dislocations in bulk crystalline materials, whose high penetration depth and non-destructive evaluation offer unique advantages over traditional electron microscopy methods. The interpretation and analysis of the DFXM data presents significant challenges that have limited its broader adoption. Here we review our recent advances using artificial intelligence (AI) methods to enhance DFXM analysis, particularly focusing on dislocation characterization. We discuss the development of physics-informed AI approaches that combine theoretical understanding with data science techniques to enable both time-resolved dislocation dynamics studies and dimensional reduction of complex DFXM datasets. Our work demonstrates how semi-automated workflows, guided by dislocation theory and employing techniques such as wavelet transforms and Bayesian inference, can effectively track and analyze dislocation behavior across multiple time scales. These methodologies have been successfully applied to various materials science challenges, from studying thermally activated dislocation motion to characterizing dislocation networks. By presenting our works that integrate physics-based modeling into AI capabilities, we demonstrate how our and other works can extract new important quantitative dislocation data from DFXM measurements.

  View details for DOI 10.1557/s43579-025-00860-4

  View details for PubMedID 41867260

  View details for PubMedCentralID PMC13002649

• Planar 30 and 20 method for increased sensitivity to through-plane thermal properties INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER Chalise, D., Kanesalingam, B., Chalise, D. 2026; 256

  View details for DOI 10.1016/j.ijheatmasstransfer.2025.128053

  View details for Web of Science ID 001613787300001

• Advances in artificial intelligence-based approaches to enhance dark field X-ray microscopy analysis MRS COMMUNICATIONS Kanesalingam, B., Yildirim, C., Dresselhaus-Marais, L. 2025

  View details for DOI 10.1557/s43579-025-00860-4

  View details for Web of Science ID 001632297600001

• A percolating path to green iron. Cell reports. Physical science Paul, S., Kanesalingam, B., Ma, Y., Villanova, J., Requena, G., Akpu, S. C., Raabe, D., Battiato, I., Dresselhaus-Marais, L. 2025; 6 (8): 102729

  Abstract

  About 1.9 gigatons of steel is produced every year, emitting 8% (3.6 gigatons) of global CO2 in the process. More than 50% of the CO2 emissions come from a single step of steel production, known as ironmaking. Hydrogen-based direct reduction (HyDR) of iron oxide to iron has emerged as an emission-free ironmaking alternative. However, multiple physical and chemical phenomena ranging from nanometers to meters inside HyDR reactors alter the microstructure and pore networks in iron oxide pellets, in ways that resist gaseous transport of H2/H2O, slow reaction rates, and disrupt continuous reactor operation. Using synchrotron nano X-ray computed tomography and percolation theory, we quantify the evolution of pores in iron oxide pellets and demonstrate how nanoscale pore connectivity influences micro- and macroscale flow properties such as permeability, diffusivity, and tortuosity. Our modeling framework connects disparate scales and offers opportunities to accelerate HyDR.

  View details for DOI 10.1016/j.xcrp.2025.102729

  View details for PubMedID 40861821

  View details for PubMedCentralID PMC12374072

• Oblique diffraction geometry for the observation of several non-coplanar Bragg reflections under identical illumination. Journal of applied crystallography Detlefs, C., Henningsson, A., Kanesalingam, B., Cretton, A. A., Corley-Wiciak, C., Frankus, F. T., Pal, D., Irvine, S., Borgi, S., Poulsen, H. F., Yildirim, C., Dresselhaus-Marais, L. E. 2025; 58 (Pt 4): 1439-1446

  Abstract

  A method to determine the strain tensor and local lattice rotation with dark-field X-ray microscopy is presented. Using a set of at least three non-coplanar symmetry-equivalent Bragg reflections, the illuminated volume of the sample can be kept constant for all reflections, facilitating easy registration of the measured lattice variations. This requires an oblique diffraction geometry, i.e. the diffraction plane is neither horizontal nor vertical. We derive a closed analytical expression that allows determination of the strain and lattice rotation from the deviation of experimental observables (e.g. goniometer angles) from their nominal values for an unstrained lattice.

  View details for DOI 10.1107/S1600576725005862

  View details for PubMedID 40765970