All Publications

  • A direct electron detector for time-resolved MeV electron microscopy REVIEW OF SCIENTIFIC INSTRUMENTS Vecchione, T., Denes, P., Jobe, R. K., Johnson, I. J., Joseph, J. M., Li, R. K., Perazzo, A., Shen, X., Wang, X. J., WEATHERSBY, S. P., Yang, J., Zhang, D. 2017; 88 (3)


    The introduction of direct electron detectors enabled the structural biology revolution of cryogenic electron microscopy. Direct electron detectors are now expected to have a similarly dramatic impact on time-resolved MeV electron microscopy, particularly by enabling both spatial and temporal jitter correction. Here we report on the commissioning of a direct electron detector for time-resolved MeV electron microscopy. The direct electron detector demonstrated MeV single electron sensitivity and is capable of recording megapixel images at 180 Hz. The detector has a 15-bit dynamic range, better than 30-μm spatial resolution and less than 20 analogue-to-digital converter count RMS pixel noise. The unique capabilities of the direct electron detector and the data analysis required to take advantage of these capabilities are presented. The technical challenges associated with generating and processing large amounts of data are also discussed.

    View details for DOI 10.1063/1.4977923

    View details for Web of Science ID 000397871400027

    View details for PubMedID 28372435

  • Mega-electron-volt ultrafast electron diffraction at SLAC National Accelerator Laboratory REVIEW OF SCIENTIFIC INSTRUMENTS WEATHERSBY, S. P., Brown, G., Centurion, M., CHASE, T. F., Coffee, R., Corbett, J., Eichner, J. P., Frisch, J. C., Fry, A. R., Guehr, M., Hartmann, N., Hast, C., HETTEL, R., Jobe, R. K., Jongewaard, E. N., LEWANDOWSKI, J. R., Li, R. K., Lindenberg, A. M., Makasyuk, I., May, J. E., McCormick, D., Nguyen, M. N., Reid, A. H., Shen, X., Sokolowski-Tinten, K., Vecchione, T., Vetter, S. L., Wu, J., Yang, J., Duerr, H. A., Wang, X. J. 2015; 86 (7)


    Ultrafast electron probes are powerful tools, complementary to x-ray free-electron lasers, used to study structural dynamics in material, chemical, and biological sciences. High brightness, relativistic electron beams with femtosecond pulse duration can resolve details of the dynamic processes on atomic time and length scales. SLAC National Accelerator Laboratory recently launched the Ultrafast Electron Diffraction (UED) and microscopy Initiative aiming at developing the next generation ultrafast electron scattering instruments. As the first stage of the Initiative, a mega-electron-volt (MeV) UED system has been constructed and commissioned to serve ultrafast science experiments and instrumentation development. The system operates at 120-Hz repetition rate with outstanding performance. In this paper, we report on the SLAC MeV UED system and its performance, including the reciprocal space resolution, temporal resolution, and machine stability.

    View details for DOI 10.1063/1.4926994

    View details for Web of Science ID 000358934400053

    View details for PubMedID 26233391

  • Laser ionized preformed plasma at FACET PLASMA PHYSICS AND CONTROLLED FUSION Green, S. Z., Adli, E., Clarke, C. I., Corde, S., Edstrom, S. A., Fisher, A. S., FREDERICO, J., Frisch, J. C., Gessner, S., Gilevich, S., Hering, P., Hogan, M. J., Jobe, R. K., Litos, M., May, J. E., Walz, D. R., Yakimenko, V., Clayton, C. E., Joshi, C., Marsh, K. A., Vafaei-Najafabadi, N., Muggli, P. 2014; 56 (8)